JP6704834B2 - 加熱装置 - Google Patents
加熱装置 Download PDFInfo
- Publication number
- JP6704834B2 JP6704834B2 JP2016212170A JP2016212170A JP6704834B2 JP 6704834 B2 JP6704834 B2 JP 6704834B2 JP 2016212170 A JP2016212170 A JP 2016212170A JP 2016212170 A JP2016212170 A JP 2016212170A JP 6704834 B2 JP6704834 B2 JP 6704834B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- base
- heating device
- tubular support
- support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000010438 heat treatment Methods 0.000 title claims description 62
- 239000000758 substrate Substances 0.000 claims description 32
- 230000002093 peripheral effect Effects 0.000 claims description 16
- 239000012530 fluid Substances 0.000 description 15
- 230000008602 contraction Effects 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
- H05B3/26—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor mounted on insulating base
- H05B3/265—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor mounted on insulating base the insulating base being an inorganic material, e.g. ceramic
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
- H05B3/28—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material
- H05B3/283—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material the insulating material being an inorganic material, e.g. ceramic
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Inorganic Chemistry (AREA)
- Resistance Heating (AREA)
Description
基板が載置される載置面を有する基体と、
前記基体に埋設される発熱抵抗体と、
前記基体の前記載置面とは反対の裏面に接続された一方の端面を有し、前記一方の端面に開口端を有する筒状支持体と、
前記筒状支持体の周壁内に形成された少なくとも2つの支持体側流路と、
前記基体のうち前記筒状支持体の直上領域のみに設けられ、前記基体内を通過して前記少なくとも2つの支持体側流路を連通させる基体側流路と、
を備えることを特徴とする。
図を参照して、本発明の第1実施形態の加熱装置を説明する。図1に示すように、第1実施形態の加熱装置1は、基体2と、筒状支持体3とを備える。基体2は、基板としてのウェハWが載置される載置面2aと、載置面2aとは反対の裏面2bとを備える。筒状支持体3は、一方の端面3aと他方の端面3bと平滑な周面3cとを有する円筒形状で構成されている。なお、筒状支持体3を角筒形状としてもよい。
図4を参照して、本発明の第2実施形態の加熱装置1を説明する。図4は、第2実施形態の基板2を、第1実施形態の図1のIII−III線に対応する位置で切断し、切断した断面を図3と同様に上方から示す断面図である。なお、第1実施形態と同一の構成については同一の符号を付して説明を省略する。第2実施形態の加熱装置1は、その基体側流路7が環状に形成されている点を除き、第1実施形態と同一に構成されている。
図5を参照して、本発明の第3実施形態の加熱装置1を説明する。図5は、第3実施形態の基板2を、第1実施形態の図1のIII−III線に対応する位置で切断し、切断した断面を図3と同様に上方から示す断面図である。なお、第1実施形態と同一の構成については同一の符号を付して説明を省略する。第3実施形態の基体側流路7は、流路幅が筒状支持体3の直上領域の外縁から筒状支持体3の内周面までの幅となるような、第2実施形態の幅よりも広い幅の環状に形成されている点で第2実施形態の基体側流路7と異なる点を除き、全て同一に構成されている。
2 基体
2a 載置面
2b 裏面
3 筒状支持体
3a 一方の端面
3b 他方の端面
3c 周面
4 発熱抵抗体
5 第1支持体側流路
6 第2支持体側流路
7 基体側流路
7a 第1接続路
7b 第2接続路
7c 分岐路
8 開口端(本発明の開口端)
9 開口端
10 配線
11 案内路
W ウェハ(基板)
Claims (4)
- 基板が載置される載置面を有する基体と、
前記基体に埋設される発熱抵抗体と、
前記基体の前記載置面とは反対の裏面に接続された一方の端面を有し、前記一方の端面に開口端を有する筒状支持体と、
前記筒状支持体の周壁内に形成された少なくとも2つの支持体側流路と、
前記基体のうち前記筒状支持体の直上領域のみに設けられ、前記基体内を通過して前記少なくとも2つの支持体側流路を連通させる基体側流路と、
を備えることを特徴とする加熱装置。 - 請求項1記載の加熱装置であって、
前記基体側流路は環状に形成されたことを特徴とする加熱装置。 - 請求項1又は請求項2記載の加熱装置であって、
前記筒状支持体には、前記発熱抵抗体に接続される配線が挿入されており、
前記配線は、前記基体側流路内を通過して配置されることを特徴とする加熱装置。 - 請求項1から請求項3の何れか1項に記載の加熱装置であって、
前記基体側流路は、前記筒状支持体の内周面が画成する空間と連通する分岐路が設けられていることを特徴とする加熱装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016212170A JP6704834B2 (ja) | 2016-10-28 | 2016-10-28 | 加熱装置 |
US15/793,052 US10014194B2 (en) | 2016-10-28 | 2017-10-25 | Heating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016212170A JP6704834B2 (ja) | 2016-10-28 | 2016-10-28 | 加熱装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018073628A JP2018073628A (ja) | 2018-05-10 |
JP6704834B2 true JP6704834B2 (ja) | 2020-06-03 |
Family
ID=62020536
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016212170A Active JP6704834B2 (ja) | 2016-10-28 | 2016-10-28 | 加熱装置 |
Country Status (2)
Country | Link |
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US (1) | US10014194B2 (ja) |
JP (1) | JP6704834B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019189197A1 (ja) * | 2018-03-28 | 2019-10-03 | 京セラ株式会社 | ヒータ及びヒータシステム |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5511799A (en) * | 1993-06-07 | 1996-04-30 | Applied Materials, Inc. | Sealing device useful in semiconductor processing apparatus for bridging materials having a thermal expansion differential |
JP2001068538A (ja) * | 1999-06-21 | 2001-03-16 | Tokyo Electron Ltd | 電極構造、載置台構造、プラズマ処理装置及び処理装置 |
JP2007046141A (ja) * | 2005-08-12 | 2007-02-22 | Ngk Insulators Ltd | 加熱装置 |
KR20080091072A (ko) * | 2006-05-24 | 2008-10-09 | 에스이아이 하이브리드 가부시키가이샤 | 웨이퍼 유지체와 그 제조 방법 및 반도체 제조 장치 |
JP2009231401A (ja) * | 2008-03-21 | 2009-10-08 | Tokyo Electron Ltd | 載置台構造及び熱処理装置 |
JP5262878B2 (ja) * | 2009-03-17 | 2013-08-14 | 東京エレクトロン株式会社 | 載置台構造及びプラズマ成膜装置 |
US8274017B2 (en) * | 2009-12-18 | 2012-09-25 | Applied Materials, Inc. | Multifunctional heater/chiller pedestal for wide range wafer temperature control |
JP5712054B2 (ja) * | 2011-05-31 | 2015-05-07 | 日本発條株式会社 | シャフト付きヒータユニットおよびシャフト付きヒータユニットの製造方法 |
JP5875882B2 (ja) * | 2012-02-01 | 2016-03-02 | 日本碍子株式会社 | セラミックヒータ |
US9673077B2 (en) * | 2012-07-03 | 2017-06-06 | Watlow Electric Manufacturing Company | Pedestal construction with low coefficient of thermal expansion top |
US9916994B2 (en) * | 2013-03-06 | 2018-03-13 | Applied Materials, Inc. | Substrate support with multi-piece sealing surface |
JP5980147B2 (ja) | 2013-03-08 | 2016-08-31 | 日本発條株式会社 | 基板支持装置 |
US20150064921A1 (en) * | 2013-08-30 | 2015-03-05 | Applied Materials, Inc. | Low temperature plasma anneal process for sublimative etch processes |
US9698074B2 (en) * | 2013-09-16 | 2017-07-04 | Applied Materials, Inc. | Heated substrate support with temperature profile control |
US20150332942A1 (en) * | 2014-05-16 | 2015-11-19 | Eng Sheng Peh | Pedestal fluid-based thermal control |
-
2016
- 2016-10-28 JP JP2016212170A patent/JP6704834B2/ja active Active
-
2017
- 2017-10-25 US US15/793,052 patent/US10014194B2/en active Active
Also Published As
Publication number | Publication date |
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JP2018073628A (ja) | 2018-05-10 |
US20180122662A1 (en) | 2018-05-03 |
US10014194B2 (en) | 2018-07-03 |
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