JP6655007B2 - 放射冷却増進エンドホール・イオン源 - Google Patents
放射冷却増進エンドホール・イオン源 Download PDFInfo
- Publication number
- JP6655007B2 JP6655007B2 JP2016517532A JP2016517532A JP6655007B2 JP 6655007 B2 JP6655007 B2 JP 6655007B2 JP 2016517532 A JP2016517532 A JP 2016517532A JP 2016517532 A JP2016517532 A JP 2016517532A JP 6655007 B2 JP6655007 B2 JP 6655007B2
- Authority
- JP
- Japan
- Prior art keywords
- ion source
- pole piece
- anode
- cup
- source device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
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- 239000000463 material Substances 0.000 claims description 31
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- 238000012546 transfer Methods 0.000 description 70
- 239000007789 gas Substances 0.000 description 27
- 238000012423 maintenance Methods 0.000 description 25
- 239000012212 insulator Substances 0.000 description 19
- 230000005855 radiation Effects 0.000 description 16
- 238000000034 method Methods 0.000 description 15
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- 238000010884 ion-beam technique Methods 0.000 description 11
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- 230000003213 activating effect Effects 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- 238000009413 insulation Methods 0.000 description 6
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- 230000008859 change Effects 0.000 description 5
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 239000010963 304 stainless steel Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910000589 SAE 304 stainless steel Inorganic materials 0.000 description 3
- 238000005270 abrasive blasting Methods 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 239000002826 coolant Substances 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
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- 238000007542 hardness measurement Methods 0.000 description 3
- 239000000615 nonconductor Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
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- 239000010935 stainless steel Substances 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 2
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- 238000009529 body temperature measurement Methods 0.000 description 2
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- 238000006386 neutralization reaction Methods 0.000 description 2
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- 229910052721 tungsten Inorganic materials 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 208000031481 Pathologic Constriction Diseases 0.000 description 1
- 229910052774 Proactinium Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
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- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 230000036262 stenosis Effects 0.000 description 1
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- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- HHIQWSQEUZDONT-UHFFFAOYSA-N tungsten Chemical compound [W].[W].[W] HHIQWSQEUZDONT-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/08—Ion sources; Ion guns using arc discharge
- H01J27/14—Other arc discharge ion sources using an applied magnetic field
- H01J27/146—End-Hall type ion sources, wherein the magnetic field confines the electrons in a central cylinder
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/002—Cooling arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/08—Ion sources; Ion guns using arc discharge
- H01J27/14—Other arc discharge ion sources using an applied magnetic field
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Combustion & Propulsion (AREA)
- Electron Sources, Ion Sources (AREA)
- Manufacturing & Machinery (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/998,044 | 2013-09-25 | ||
| US13/998,044 US8994258B1 (en) | 2013-09-25 | 2013-09-25 | End-hall ion source with enhanced radiation cooling |
| PCT/US2014/000171 WO2015047446A1 (en) | 2013-09-25 | 2014-07-29 | End-hall ion source with enhanced radiation cooling |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016536740A JP2016536740A (ja) | 2016-11-24 |
| JP2016536740A5 JP2016536740A5 (enExample) | 2017-09-07 |
| JP6655007B2 true JP6655007B2 (ja) | 2020-02-26 |
Family
ID=52690357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016517532A Active JP6655007B2 (ja) | 2013-09-25 | 2014-07-29 | 放射冷却増進エンドホール・イオン源 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US8994258B1 (enExample) |
| EP (1) | EP3050071B1 (enExample) |
| JP (1) | JP6655007B2 (enExample) |
| AU (1) | AU2014328759B9 (enExample) |
| CA (1) | CA2920813C (enExample) |
| IL (1) | IL244155B (enExample) |
| SG (1) | SG11201602162VA (enExample) |
| WO (1) | WO2015047446A1 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2969372B1 (fr) * | 2010-12-21 | 2015-04-17 | Commissariat Energie Atomique | Dispositif d’ionisation a la resonance cyclotron electronique |
| US8994258B1 (en) * | 2013-09-25 | 2015-03-31 | Kaufman & Robinson, Inc. | End-hall ion source with enhanced radiation cooling |
| US9859098B2 (en) * | 2015-12-22 | 2018-01-02 | Varian Semiconductor Equipment Associates, Inc. | Temperature controlled ion source |
| US10347457B1 (en) | 2017-12-19 | 2019-07-09 | Varian Semiconductor Equipment Associates, Inc. | Dynamic temperature control of an ion source |
| JP7038366B2 (ja) | 2018-06-20 | 2022-03-18 | ボード オブ トラスティーズ オブ ミシガン ステート ユニバーシティ | 単一ビームプラズマ源 |
| CN109087840B (zh) * | 2018-09-27 | 2023-11-07 | 中山市博顿光电科技有限公司 | 一种水冷式射频中和器 |
| US11393652B2 (en) * | 2019-01-25 | 2022-07-19 | Muons, Inc. | Bi-metallic anode for amplitude modulated magnetron |
| WO2020198012A1 (en) | 2019-03-26 | 2020-10-01 | Board Of Trustees Of Michigan State University | Single beam plasma source |
| CN111081510A (zh) * | 2020-03-02 | 2020-04-28 | 成都国泰真空设备有限公司 | 一种霍尔离子源装置 |
| CN111710580B (zh) * | 2020-07-16 | 2025-03-04 | 中山市博顿光电科技有限公司 | 离子源电场结构及离子源装置 |
| US12413148B2 (en) * | 2021-05-20 | 2025-09-09 | Kaufman & Robinson, Inc. | Power efficient load current derived switch timing of switching resonant topology |
| US11823867B2 (en) * | 2021-05-20 | 2023-11-21 | Kaufman & Robinson, Inc. | Load current derived switch timing of switching resonant topology |
| JP7695555B2 (ja) * | 2021-12-24 | 2025-06-19 | 日本製鉄株式会社 | 接触熱コンダクタンス推定方法及び接触電気抵抗推定方法 |
| JP7688272B2 (ja) * | 2021-12-24 | 2025-06-04 | 日本製鉄株式会社 | 接触熱コンダクタンス推定方法及び接触電気抵抗推定方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3275829A (en) | 1960-08-15 | 1966-09-27 | Special Devices Inc | Cavity radiator with a pyrotechnic charge that remains intact during and after combustion |
| US4126489A (en) * | 1973-07-17 | 1978-11-21 | Varian Associates, Inc. | Method of making cathode heaters |
| US4862032A (en) | 1986-10-20 | 1989-08-29 | Kaufman Harold R | End-Hall ion source |
| JP2628533B2 (ja) * | 1988-10-25 | 1997-07-09 | 文夫 渡辺 | 質量分析型残留ガス分析計 |
| JPH03266336A (ja) * | 1990-03-15 | 1991-11-27 | Fujitsu Ltd | ガスイオン源装置 |
| US5402032A (en) * | 1992-10-29 | 1995-03-28 | Litton Systems, Inc. | Traveling wave tube with plate for bonding thermally-mismatched elements |
| US5475354A (en) * | 1993-06-21 | 1995-12-12 | Societe Europeenne De Propulsion | Plasma accelerator of short length with closed electron drift |
| US6750600B2 (en) * | 2001-05-03 | 2004-06-15 | Kaufman & Robinson, Inc. | Hall-current ion source |
| US6454910B1 (en) | 2001-09-21 | 2002-09-24 | Kaufman & Robinson, Inc. | Ion-assisted magnetron deposition |
| US6608431B1 (en) * | 2002-05-24 | 2003-08-19 | Kaufman & Robinson, Inc. | Modular gridless ion source |
| US7667379B2 (en) | 2002-06-27 | 2010-02-23 | Kaufman & Robinson, Inc. | Industrial hollow cathode with radiation shield structure |
| US7342236B2 (en) | 2004-02-23 | 2008-03-11 | Veeco Instruments, Inc. | Fluid-cooled ion source |
| US7116054B2 (en) * | 2004-04-23 | 2006-10-03 | Viacheslav V. Zhurin | High-efficient ion source with improved magnetic field |
| US7476869B2 (en) * | 2005-02-18 | 2009-01-13 | Veeco Instruments, Inc. | Gas distributor for ion source |
| US7566883B2 (en) | 2005-02-18 | 2009-07-28 | Veeco Instruments, Inc. | Thermal transfer sheet for ion source |
| US7312579B2 (en) * | 2006-04-18 | 2007-12-25 | Colorado Advanced Technology Llc | Hall-current ion source for ion beams of low and high energy for technological applications |
| EP2276054A1 (en) * | 2009-07-13 | 2011-01-19 | Applied Materials, Inc. | Sputtering system, rotatable cylindrical target assembly, backing tube, target element and cooling shield |
| WO2013120097A1 (en) * | 2012-02-09 | 2013-08-15 | Fluxion Inc. | Compact, filtered ion source |
| US8994258B1 (en) | 2013-09-25 | 2015-03-31 | Kaufman & Robinson, Inc. | End-hall ion source with enhanced radiation cooling |
-
2013
- 2013-09-25 US US13/998,044 patent/US8994258B1/en active Active
-
2014
- 2014-07-29 SG SG11201602162VA patent/SG11201602162VA/en unknown
- 2014-07-29 AU AU2014328759A patent/AU2014328759B9/en active Active
- 2014-07-29 WO PCT/US2014/000171 patent/WO2015047446A1/en not_active Ceased
- 2014-07-29 JP JP2016517532A patent/JP6655007B2/ja active Active
- 2014-07-29 EP EP14849024.6A patent/EP3050071B1/en active Active
- 2014-07-29 CA CA2920813A patent/CA2920813C/en active Active
- 2014-07-29 US US15/546,034 patent/US10068739B2/en active Active
-
2016
- 2016-02-16 IL IL24415516A patent/IL244155B/en active IP Right Grant
Also Published As
| Publication number | Publication date |
|---|---|
| AU2014328759A1 (en) | 2016-03-03 |
| CA2920813C (en) | 2020-02-18 |
| AU2014328759B9 (en) | 2019-02-14 |
| EP3050071A1 (en) | 2016-08-03 |
| US10068739B2 (en) | 2018-09-04 |
| US20150084496A1 (en) | 2015-03-26 |
| WO2015047446A1 (en) | 2015-04-02 |
| JP2016536740A (ja) | 2016-11-24 |
| SG11201602162VA (en) | 2016-04-28 |
| EP3050071A4 (en) | 2017-05-03 |
| CA2920813A1 (en) | 2015-04-02 |
| EP3050071B1 (en) | 2018-06-13 |
| US20180012722A1 (en) | 2018-01-11 |
| IL244155B (en) | 2019-10-31 |
| AU2014328759B2 (en) | 2018-12-20 |
| US8994258B1 (en) | 2015-03-31 |
| IL244155A0 (en) | 2016-04-21 |
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