JP6602449B1 - 超音波検査方法、超音波検査装置及び超音波検査プログラム - Google Patents

超音波検査方法、超音波検査装置及び超音波検査プログラム Download PDF

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JP6602449B1
JP6602449B1 JP2018228430A JP2018228430A JP6602449B1 JP 6602449 B1 JP6602449 B1 JP 6602449B1 JP 2018228430 A JP2018228430 A JP 2018228430A JP 2018228430 A JP2018228430 A JP 2018228430A JP 6602449 B1 JP6602449 B1 JP 6602449B1
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waveform
ultrasonic
reference waveform
ultrasonic probe
ultrasonic inspection
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Japanese (ja)
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JP2020091194A (ja
Inventor
昌幸 小林
昌幸 小林
薫 酒井
薫 酒井
菊池　修
修 菊池
健太 住川
健太 住川
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Hitachi Power Solutions Co Ltd
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Hitachi Power Solutions Co Ltd
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Priority to JP2018228430A priority Critical patent/JP6602449B1/ja
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Priority to PCT/JP2019/046449 priority patent/WO2020116289A1/ja
Priority to KR1020217016519A priority patent/KR102559929B1/ko
Priority to CN201980079054.2A priority patent/CN113167766A/zh
Priority to TW108143860A priority patent/TWI708940B/zh
Publication of JP2020091194A publication Critical patent/JP2020091194A/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/48—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by amplitude comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/50—Processing the detected response signal, e.g. electronic circuits specially adapted therefor using auto-correlation techniques or cross-correlation techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture

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  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2018228430A 2018-12-05 2018-12-05 超音波検査方法、超音波検査装置及び超音波検査プログラム Active JP6602449B1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018228430A JP6602449B1 (ja) 2018-12-05 2018-12-05 超音波検査方法、超音波検査装置及び超音波検査プログラム
PCT/JP2019/046449 WO2020116289A1 (ja) 2018-12-05 2019-11-27 超音波検査方法及び超音波検査装置
KR1020217016519A KR102559929B1 (ko) 2018-12-05 2019-11-27 초음파 검사 방법, 초음파 검사 장치 및 초음파 검사 프로그램
CN201980079054.2A CN113167766A (zh) 2018-12-05 2019-11-27 超声波检查方法以及超声波检查装置
TW108143860A TWI708940B (zh) 2018-12-05 2019-12-02 超音波檢查方法及超音波檢查裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018228430A JP6602449B1 (ja) 2018-12-05 2018-12-05 超音波検査方法、超音波検査装置及び超音波検査プログラム

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JP6602449B1 true JP6602449B1 (ja) 2019-11-06
JP2020091194A JP2020091194A (ja) 2020-06-11

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JP2018228430A Active JP6602449B1 (ja) 2018-12-05 2018-12-05 超音波検査方法、超音波検査装置及び超音波検査プログラム

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JP (1) JP6602449B1 (zh)
KR (1) KR102559929B1 (zh)
CN (1) CN113167766A (zh)
TW (1) TWI708940B (zh)
WO (1) WO2020116289A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220148277A (ko) 2020-04-16 2022-11-04 가부시키가이샤 히타치 파워 솔루션즈 초음파 검사 장치 및 초음파 검사 방법

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112229911B (zh) * 2020-10-13 2022-08-19 上海大学 一种用于实时检测3d打印件脱层的方法和装置
JP2022121859A (ja) * 2021-02-09 2022-08-22 株式会社日立パワーソリューションズ 超音波検査装置、超音波検査方法及びプログラム
JP7093884B1 (ja) 2021-11-30 2022-06-30 株式会社日立パワーソリューションズ アレイ型超音波映像装置および超音波画像表示方法

Family Cites Families (14)

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JPS58213248A (ja) * 1982-06-07 1983-12-12 Hitachi Ltd 超音波による欠陥識別方法とその装置
JPH0718842B2 (ja) * 1985-10-16 1995-03-06 日立建機株式会社 超音波検査装置
JP2896385B2 (ja) * 1989-09-14 1999-05-31 日本クラウトクレーマー株式会社 超音波検査方法及び装置
KR101137141B1 (ko) * 2007-03-29 2012-04-20 파나소닉 주식회사 초음파 측정 방법 및 장치
US8143898B1 (en) * 2007-04-06 2012-03-27 Unisyn Medical Technologies, Inc. Systems and methods for reconfiguring an ultrasound device
CN101672826B (zh) * 2009-10-16 2013-06-12 中国电子科技集团公司第四十五研究所 超声扫描显微镜c扫描相位反转图像的构建方法
EP3563768A3 (en) * 2010-10-13 2020-02-12 Maui Imaging, Inc. Concave ultrasound transducers and 3d arrays
JP5957425B2 (ja) * 2013-08-06 2016-07-27 株式会社Ｉｈｉ検査計測 内部付着物の厚さ計測装置と方法
CN103852521B (zh) * 2014-02-17 2016-04-06 上海市岩土工程检测中心 一种用超声波检测多层介质耦合质量的方法
SE537991C2 (sv) * 2014-04-03 2016-01-19 Creo Dynamics Ab Förfarande och anordning för inspektion av strukturer med ultraljud
JP2020024090A (ja) * 2016-11-08 2020-02-13 株式会社日立製作所 超音波計測装置および方法
JP6797646B2 (ja) * 2016-11-21 2020-12-09 株式会社日立パワーソリューションズ 超音波検査装置及び超音波検査方法
CN106655804A (zh) * 2017-01-16 2017-05-10 广东百事泰电子商务股份有限公司 一种基于维也纳pfc的智能型半桥修正波电压转换电路
CN108267508A (zh) * 2017-12-27 2018-07-10 东南大学 一种基于Android设备的多通道超声探伤系统

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220148277A (ko) 2020-04-16 2022-11-04 가부시키가이샤 히타치 파워 솔루션즈 초음파 검사 장치 및 초음파 검사 방법

Also Published As

Publication number Publication date
CN113167766A (zh) 2021-07-23
TW202024632A (zh) 2020-07-01
KR102559929B1 (ko) 2023-07-27
TWI708940B (zh) 2020-11-01
JP2020091194A (ja) 2020-06-11
WO2020116289A1 (ja) 2020-06-11
KR20210083336A (ko) 2021-07-06

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