JP6553057B2 - システムレベルの電力分配ネットワークに関する電圧依存ダイrcモデリング - Google Patents
システムレベルの電力分配ネットワークに関する電圧依存ダイrcモデリング Download PDFInfo
- Publication number
- JP6553057B2 JP6553057B2 JP2016546845A JP2016546845A JP6553057B2 JP 6553057 B2 JP6553057 B2 JP 6553057B2 JP 2016546845 A JP2016546845 A JP 2016546845A JP 2016546845 A JP2016546845 A JP 2016546845A JP 6553057 B2 JP6553057 B2 JP 6553057B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- circuit
- switches
- time interval
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2119/00—Details relating to the type or aim of the analysis or the optimisation
- G06F2119/06—Power analysis or power optimisation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
- Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
- Y04S40/00—Systems for electrical power generation, transmission, distribution or end-user application management characterised by the use of communication or information technologies, or communication or information technology specific aspects supporting them
- Y04S40/20—Information technology specific aspects, e.g. CAD, simulation, modelling, system security
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Geometry (AREA)
- Evolutionary Computation (AREA)
- General Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Logic Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Direct Current Feeding And Distribution (AREA)
- Measurement Of Current Or Voltage (AREA)
- Electronic Switches (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/157,451 | 2014-01-16 | ||
| US14/157,451 US9429610B2 (en) | 2014-01-16 | 2014-01-16 | Voltage dependent die RC modeling for system level power distribution networks |
| PCT/US2015/011658 WO2015109125A1 (en) | 2014-01-16 | 2015-01-15 | Voltage dependent die rc modeling for system level power distribution networks |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017506328A JP2017506328A (ja) | 2017-03-02 |
| JP2017506328A5 JP2017506328A5 (enExample) | 2018-02-08 |
| JP6553057B2 true JP6553057B2 (ja) | 2019-07-31 |
Family
ID=52440885
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016546845A Expired - Fee Related JP6553057B2 (ja) | 2014-01-16 | 2015-01-15 | システムレベルの電力分配ネットワークに関する電圧依存ダイrcモデリング |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9429610B2 (enExample) |
| EP (1) | EP3095053B1 (enExample) |
| JP (1) | JP6553057B2 (enExample) |
| KR (1) | KR102120754B1 (enExample) |
| CN (1) | CN105917338B (enExample) |
| BR (1) | BR112016016463A2 (enExample) |
| WO (1) | WO2015109125A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6623696B2 (ja) * | 2015-11-09 | 2019-12-25 | 株式会社ソシオネクスト | 電源装置及び半導体装置 |
| KR102236526B1 (ko) * | 2017-11-28 | 2021-04-05 | 에스케이하이닉스 주식회사 | 시간-도메인 반사 측정 신호를 이용한 고주파대역 정전용량 추출 방법, 장치 및 이를 구현하는 컴퓨터로 읽을 수 있는 기록 매체 |
| KR102039556B1 (ko) | 2018-08-08 | 2019-11-01 | (주)휴윈 | 전력분배망 임피던스 분석 방법 및 이를 기록한 컴퓨터 판독 가능한 기록매체, 전력분배망 임피던스 분석 장치 |
| GB202018942D0 (en) * | 2020-12-01 | 2021-01-13 | Appleyard Lees Ip Llp | Temperature Estimation |
| CN113761793B (zh) * | 2021-08-16 | 2024-02-27 | 固德威技术股份有限公司 | 逆变器输出阻抗检测装置及方法、逆变器运行控制方法 |
| TWI828550B (zh) * | 2023-03-01 | 2024-01-01 | 智原科技股份有限公司 | 佈線方法、電腦程式產品及與其相關之積體電路 |
Family Cites Families (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2940074B2 (ja) | 1990-05-28 | 1999-08-25 | 日本電気株式会社 | セラミックグリーンシート間の接着性評価方法 |
| US5461338A (en) | 1992-04-17 | 1995-10-24 | Nec Corporation | Semiconductor integrated circuit incorporated with substrate bias control circuit |
| JP3561012B2 (ja) | 1994-11-07 | 2004-09-02 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
| JP3708168B2 (ja) | 1995-06-13 | 2005-10-19 | 富士通株式会社 | 遅延装置 |
| JP2931776B2 (ja) | 1995-08-21 | 1999-08-09 | 三菱電機株式会社 | 半導体集積回路 |
| US5646543A (en) | 1995-10-12 | 1997-07-08 | Lucent Technologies Inc. | Integrated circuit having reduced inductive noise |
| KR100466457B1 (ko) | 1995-11-08 | 2005-06-16 | 마츠시타 덴끼 산교 가부시키가이샤 | 신호전송회로,신호수신회로및신호송수신회로,신호전송방법,신호수신방법및신호송수신방법과반도체집적회로및그제어방법 |
| US5694949A (en) | 1996-08-06 | 1997-12-09 | Pacesetter, Inc. | Variable capacitance emulation circuit for electrophysiology diagnostic device |
| JP3732914B2 (ja) | 1997-02-28 | 2006-01-11 | 株式会社ルネサステクノロジ | 半導体装置 |
| US5949253A (en) | 1997-04-18 | 1999-09-07 | Adaptec, Inc. | Low voltage differential driver with multiple drive strengths |
| US6233693B1 (en) | 1998-05-06 | 2001-05-15 | International Business Machines Corporation | Smart DASD spin-up |
| US6064223A (en) | 1998-07-08 | 2000-05-16 | Intel Corporation | Low leakage circuit configuration for MOSFET circuits |
| US6329874B1 (en) | 1998-09-11 | 2001-12-11 | Intel Corporation | Method and apparatus for reducing standby leakage current using a leakage control transistor that receives boosted gate drive during an active mode |
| US6184729B1 (en) | 1998-10-08 | 2001-02-06 | National Semiconductor Corporation | Low ground bounce and low power supply bounce output driver |
| US6225852B1 (en) | 1999-10-01 | 2001-05-01 | Advanced Micro Devices, Inc. | Use of biased high threshold voltage transistor to eliminate standby current in low voltage integrated circuits |
| JP3912960B2 (ja) | 2000-06-20 | 2007-05-09 | 株式会社東芝 | 半導体集積回路、論理演算回路およびフリップフロップ |
| US6744301B1 (en) | 2000-11-07 | 2004-06-01 | Intel Corporation | System using body-biased sleep transistors to reduce leakage power while minimizing performance penalties and noise |
| US6959404B2 (en) | 2001-08-23 | 2005-10-25 | Texas Instruments Incorporated | Extended dynamic range watchdog timer |
| JP2005516454A (ja) | 2002-01-23 | 2005-06-02 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 集積回路及び電池式電子装置 |
| JP3951773B2 (ja) | 2002-03-28 | 2007-08-01 | 富士通株式会社 | リーク電流遮断回路を有する半導体集積回路 |
| JP4052923B2 (ja) | 2002-10-25 | 2008-02-27 | 株式会社ルネサステクノロジ | 半導体装置 |
| JP4549026B2 (ja) | 2003-01-14 | 2010-09-22 | 富士通セミコンダクター株式会社 | 半導体集積回路 |
| US6977519B2 (en) | 2003-05-14 | 2005-12-20 | International Business Machines Corporation | Digital logic with reduced leakage |
| US6876252B2 (en) | 2003-06-28 | 2005-04-05 | International Business Machines Corporation | Non-abrupt switching of sleep transistor of power gate structure |
| DE102004036956B3 (de) | 2004-07-30 | 2006-03-23 | Infineon Technologies Ag | Logik-Aktivierungsschaltung |
| US7276932B2 (en) | 2004-08-26 | 2007-10-02 | International Business Machines Corporation | Power-gating cell for virtual power rail control |
| US7659746B2 (en) | 2005-02-14 | 2010-02-09 | Qualcomm, Incorporated | Distributed supply current switch circuits for enabling individual power domains |
| JP2008034667A (ja) * | 2006-07-31 | 2008-02-14 | Renesas Technology Corp | 半導体集積回路装置 |
| JP2008065732A (ja) * | 2006-09-11 | 2008-03-21 | Nec Electronics Corp | 半導体集積回路の設計方法及び設計システム |
| TW200910373A (en) * | 2007-06-08 | 2009-03-01 | Mosaid Technologies Inc | Dynamic impedance control for input/output buffers |
| JP2009105221A (ja) * | 2007-10-23 | 2009-05-14 | Nec Electronics Corp | 半導体集積回路装置 |
| US8570025B2 (en) | 2007-11-20 | 2013-10-29 | Ferfics Limited | Power delivery circuit with load current estimation based on monitoring nodes not on the power delivery path |
| JP4535134B2 (ja) * | 2008-01-16 | 2010-09-01 | ソニー株式会社 | 半導体集積回路およびその電源制御方法 |
| JP5211889B2 (ja) * | 2008-06-25 | 2013-06-12 | 富士通株式会社 | 半導体集積回路 |
| WO2010149234A1 (en) | 2009-06-25 | 2010-12-29 | Telefonaktiebolaget Lm Ericsson (Publ) | Capacitance determination in a switched mode power supply |
| US8063622B2 (en) * | 2009-10-02 | 2011-11-22 | Power Integrations, Inc. | Method and apparatus for implementing slew rate control using bypass capacitor |
| JP5541143B2 (ja) * | 2010-12-21 | 2014-07-09 | 富士通株式会社 | 半導体装置 |
| US8537593B2 (en) | 2011-04-28 | 2013-09-17 | Sandisk Technologies Inc. | Variable resistance switch suitable for supplying high voltage to drive load |
| US8427886B2 (en) | 2011-07-11 | 2013-04-23 | Lsi Corporation | Memory device with trimmable power gating capabilities |
| CN102592021B (zh) * | 2012-01-06 | 2013-08-14 | 北京航空航天大学 | 一种航空参数处理设备电源模块的fmis方法 |
-
2014
- 2014-01-16 US US14/157,451 patent/US9429610B2/en active Active
-
2015
- 2015-01-15 BR BR112016016463A patent/BR112016016463A2/pt not_active IP Right Cessation
- 2015-01-15 CN CN201580004761.7A patent/CN105917338B/zh active Active
- 2015-01-15 KR KR1020167021730A patent/KR102120754B1/ko active Active
- 2015-01-15 JP JP2016546845A patent/JP6553057B2/ja not_active Expired - Fee Related
- 2015-01-15 EP EP15702071.0A patent/EP3095053B1/en active Active
- 2015-01-15 WO PCT/US2015/011658 patent/WO2015109125A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP3095053B1 (en) | 2019-07-24 |
| CN105917338B (zh) | 2018-11-20 |
| US9429610B2 (en) | 2016-08-30 |
| BR112016016463A2 (pt) | 2017-08-08 |
| KR102120754B1 (ko) | 2020-06-09 |
| CN105917338A (zh) | 2016-08-31 |
| EP3095053A1 (en) | 2016-11-23 |
| WO2015109125A1 (en) | 2015-07-23 |
| US20150198646A1 (en) | 2015-07-16 |
| KR20160108432A (ko) | 2016-09-19 |
| JP2017506328A (ja) | 2017-03-02 |
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