BR112016016463A2 - Modelagem rc de matriz dependente de tensão para redes de distribuição de energia em nível de sistema - Google Patents

Modelagem rc de matriz dependente de tensão para redes de distribuição de energia em nível de sistema

Info

Publication number
BR112016016463A2
BR112016016463A2 BR112016016463A BR112016016463A BR112016016463A2 BR 112016016463 A2 BR112016016463 A2 BR 112016016463A2 BR 112016016463 A BR112016016463 A BR 112016016463A BR 112016016463 A BR112016016463 A BR 112016016463A BR 112016016463 A2 BR112016016463 A2 BR 112016016463A2
Authority
BR
Brazil
Prior art keywords
voltage
circuit
modeling
power distribution
level power
Prior art date
Application number
BR112016016463A
Other languages
English (en)
Inventor
Michael Coutts Ryan
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of BR112016016463A2 publication Critical patent/BR112016016463A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2119/00—Details relating to the type or aim of the analysis or the optimisation
    • G06F2119/06—Power analysis or power optimisation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
    • Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
    • Y04S40/00—Systems for electrical power generation, transmission, distribution or end-user application management characterised by the use of communication or information technologies, or communication or information technology specific aspects supporting them
    • Y04S40/20—Information technology specific aspects, e.g. CAD, simulation, modelling, system security

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Logic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Electronic Switches (AREA)
  • Direct Current Feeding And Distribution (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

MODELAGEM RC DE MATRIZ DEPENDENTE DE TENSÃO PARA REDES DE DISTRIBUIÇÃO DE ENERGIA EM NÍVEL DE SISTEMA. As técnicas para determinar a capacitância dependente de tensão de um circuito são aqui descritas. Em uma modalidade, um método para determinar a capacitância dependente de tensão (310) de um circuito compreende medir um parâmetro do circuito em cada uma de uma pluralidade de tensões, e, para cada tensão, determinar uma capacitância do circuito na tensão ajustando um modelo de resistência-condensador (RC) do circuito para o parâmetro medido do circuito na tensão.
BR112016016463A 2014-01-16 2015-01-15 Modelagem rc de matriz dependente de tensão para redes de distribuição de energia em nível de sistema BR112016016463A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/157,451 US9429610B2 (en) 2014-01-16 2014-01-16 Voltage dependent die RC modeling for system level power distribution networks
PCT/US2015/011658 WO2015109125A1 (en) 2014-01-16 2015-01-15 Voltage dependent die rc modeling for system level power distribution networks

Publications (1)

Publication Number Publication Date
BR112016016463A2 true BR112016016463A2 (pt) 2017-08-08

Family

ID=52440885

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112016016463A BR112016016463A2 (pt) 2014-01-16 2015-01-15 Modelagem rc de matriz dependente de tensão para redes de distribuição de energia em nível de sistema

Country Status (7)

Country Link
US (1) US9429610B2 (pt)
EP (1) EP3095053B1 (pt)
JP (1) JP6553057B2 (pt)
KR (1) KR102120754B1 (pt)
CN (1) CN105917338B (pt)
BR (1) BR112016016463A2 (pt)
WO (1) WO2015109125A1 (pt)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6623696B2 (ja) * 2015-11-09 2019-12-25 株式会社ソシオネクスト 電源装置及び半導体装置
KR102236526B1 (ko) * 2017-11-28 2021-04-05 에스케이하이닉스 주식회사 시간-도메인 반사 측정 신호를 이용한 고주파대역 정전용량 추출 방법, 장치 및 이를 구현하는 컴퓨터로 읽을 수 있는 기록 매체
KR102039556B1 (ko) 2018-08-08 2019-11-01 (주)휴윈 전력분배망 임피던스 분석 방법 및 이를 기록한 컴퓨터 판독 가능한 기록매체, 전력분배망 임피던스 분석 장치
CN113761793B (zh) * 2021-08-16 2024-02-27 固德威技术股份有限公司 逆变器输出阻抗检测装置及方法、逆变器运行控制方法
TWI828550B (zh) * 2023-03-01 2024-01-01 智原科技股份有限公司 佈線方法、電腦程式產品及與其相關之積體電路

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2940074B2 (ja) 1990-05-28 1999-08-25 日本電気株式会社 セラミックグリーンシート間の接着性評価方法
US5461338A (en) 1992-04-17 1995-10-24 Nec Corporation Semiconductor integrated circuit incorporated with substrate bias control circuit
JP3561012B2 (ja) 1994-11-07 2004-09-02 株式会社ルネサステクノロジ 半導体集積回路装置
JP3708168B2 (ja) 1995-06-13 2005-10-19 富士通株式会社 遅延装置
JP2931776B2 (ja) 1995-08-21 1999-08-09 三菱電機株式会社 半導体集積回路
US5646543A (en) 1995-10-12 1997-07-08 Lucent Technologies Inc. Integrated circuit having reduced inductive noise
KR100466457B1 (ko) 1995-11-08 2005-06-16 마츠시타 덴끼 산교 가부시키가이샤 신호전송회로,신호수신회로및신호송수신회로,신호전송방법,신호수신방법및신호송수신방법과반도체집적회로및그제어방법
US5694949A (en) 1996-08-06 1997-12-09 Pacesetter, Inc. Variable capacitance emulation circuit for electrophysiology diagnostic device
JP3732914B2 (ja) 1997-02-28 2006-01-11 株式会社ルネサステクノロジ 半導体装置
US5949253A (en) 1997-04-18 1999-09-07 Adaptec, Inc. Low voltage differential driver with multiple drive strengths
US6233693B1 (en) 1998-05-06 2001-05-15 International Business Machines Corporation Smart DASD spin-up
US6064223A (en) 1998-07-08 2000-05-16 Intel Corporation Low leakage circuit configuration for MOSFET circuits
US20020000872A1 (en) 1998-09-11 2002-01-03 Yibin Ye Method and apparatus for reducing standby leakage current using a leakage control transistor that receives boosted gate drive during an active mode
US6184729B1 (en) 1998-10-08 2001-02-06 National Semiconductor Corporation Low ground bounce and low power supply bounce output driver
US6225852B1 (en) 1999-10-01 2001-05-01 Advanced Micro Devices, Inc. Use of biased high threshold voltage transistor to eliminate standby current in low voltage integrated circuits
JP3912960B2 (ja) 2000-06-20 2007-05-09 株式会社東芝 半導体集積回路、論理演算回路およびフリップフロップ
US6744301B1 (en) 2000-11-07 2004-06-01 Intel Corporation System using body-biased sleep transistors to reduce leakage power while minimizing performance penalties and noise
US6959404B2 (en) 2001-08-23 2005-10-25 Texas Instruments Incorporated Extended dynamic range watchdog timer
CN1286269C (zh) 2002-01-23 2006-11-22 皇家飞利浦电子股份有限公司 集成电路和电池供电的电子设备
JP3951773B2 (ja) 2002-03-28 2007-08-01 富士通株式会社 リーク電流遮断回路を有する半導体集積回路
JP4052923B2 (ja) 2002-10-25 2008-02-27 株式会社ルネサステクノロジ 半導体装置
JP4549026B2 (ja) 2003-01-14 2010-09-22 富士通セミコンダクター株式会社 半導体集積回路
US6977519B2 (en) 2003-05-14 2005-12-20 International Business Machines Corporation Digital logic with reduced leakage
US6876252B2 (en) 2003-06-28 2005-04-05 International Business Machines Corporation Non-abrupt switching of sleep transistor of power gate structure
DE102004036956B3 (de) 2004-07-30 2006-03-23 Infineon Technologies Ag Logik-Aktivierungsschaltung
US7276932B2 (en) 2004-08-26 2007-10-02 International Business Machines Corporation Power-gating cell for virtual power rail control
US7659746B2 (en) 2005-02-14 2010-02-09 Qualcomm, Incorporated Distributed supply current switch circuits for enabling individual power domains
JP2008034667A (ja) * 2006-07-31 2008-02-14 Renesas Technology Corp 半導体集積回路装置
JP2008065732A (ja) * 2006-09-11 2008-03-21 Nec Electronics Corp 半導体集積回路の設計方法及び設計システム
TW200910373A (en) * 2007-06-08 2009-03-01 Mosaid Technologies Inc Dynamic impedance control for input/output buffers
JP2009105221A (ja) * 2007-10-23 2009-05-14 Nec Electronics Corp 半導体集積回路装置
WO2009066274A1 (en) 2007-11-20 2009-05-28 Ferfics Limited Power delivery circuit monitoring
JP4535134B2 (ja) * 2008-01-16 2010-09-01 ソニー株式会社 半導体集積回路およびその電源制御方法
JP5211889B2 (ja) * 2008-06-25 2013-06-12 富士通株式会社 半導体集積回路
WO2010149234A1 (en) 2009-06-25 2010-12-29 Telefonaktiebolaget Lm Ericsson (Publ) Capacitance determination in a switched mode power supply
US8063622B2 (en) * 2009-10-02 2011-11-22 Power Integrations, Inc. Method and apparatus for implementing slew rate control using bypass capacitor
JP5541143B2 (ja) * 2010-12-21 2014-07-09 富士通株式会社 半導体装置
US8537593B2 (en) 2011-04-28 2013-09-17 Sandisk Technologies Inc. Variable resistance switch suitable for supplying high voltage to drive load
US8427886B2 (en) 2011-07-11 2013-04-23 Lsi Corporation Memory device with trimmable power gating capabilities
CN102592021B (zh) * 2012-01-06 2013-08-14 北京航空航天大学 一种航空参数处理设备电源模块的fmis方法

Also Published As

Publication number Publication date
JP2017506328A (ja) 2017-03-02
KR102120754B1 (ko) 2020-06-09
JP6553057B2 (ja) 2019-07-31
EP3095053A1 (en) 2016-11-23
CN105917338B (zh) 2018-11-20
CN105917338A (zh) 2016-08-31
US20150198646A1 (en) 2015-07-16
EP3095053B1 (en) 2019-07-24
US9429610B2 (en) 2016-08-30
WO2015109125A1 (en) 2015-07-23
KR20160108432A (ko) 2016-09-19

Similar Documents

Publication Publication Date Title
DK3471994T3 (da) Ladestation med flere strømkilder
DK3472325T3 (da) Fremgangsmåde til målrettet DNA-ændring i planteceller
BR112016016463A2 (pt) Modelagem rc de matriz dependente de tensão para redes de distribuição de energia em nível de sistema
BR112017017092A2 (pt) métodos e composições úteis na geração de respostas de células t cd8+ não canônicas
DK3392995T3 (da) Spændingsstabilitetsovervågningsindretning og -fremgangsmåde
DK3021400T3 (da) Energiforsyningssystem og fremgangsmåde til spændingsstyring for brændstofcelle
DK3114692T3 (da) Fotovoltaisk effektgenereringssystem og fremgangsmåder vedrørende dette
AR095774A1 (es) Anticuerpos anti-il-4 y anticuerpos biespecíficos y sus usos
DK3242903T3 (da) Sammensætninger til at indføre nukleinsyre i celler
DK2866323T3 (da) Ekstra strømforsyningssystem og metode for regulering af spændinger af det samme
BR112017010418A2 (pt) sistemas e métodos para o controle de energia temporal dinâmico
DE112017001979A5 (de) Ersatzschaltbildbasiertes Brennstoffzellen-Prognosemodell
DK3003146T3 (da) Indretning til måling af en genstands, især en legemsdels, omkreds
DK3427323T3 (da) Brændselscelle
MX2015014424A (es) Construcciones de proteinas mitocondriales y sus usos.
DK3352783T3 (da) Vaccine omfattende immun-isolerede celler som producerer en immunmodulator
SG11201607057RA (en) Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer level
DK3262168T3 (da) Værtscelleproteinmodifikation
DK3365107T3 (da) Cellekultur
KR20180084794A (ko) 외과 수술 시뮬레이터 및 외과 수술 시뮬레이션 방법
DE102016111219A8 (de) Brennstoffzellensystem
PL3035551T3 (pl) Sposób i urządzenie do samotestowania dokładności pomiaru licznika energii elektrycznej
IT201700075491A1 (it) Dispositivo per piastre di coltura cellulare multi-pozzetto, e relativo corredo
EA201690296A1 (ru) Способ адаптации геологического представления геологической среды
EP3304063A4 (en) SEMICONDUCTOR DOPING MEASUREMENT BY CROWN EFFECT OF CONSTANT SURFACE POTENTIAL EFFECT

Legal Events

Date Code Title Description
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 8A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2705 DE 08-11-2022 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.