JP6526983B2 - X線解析装置 - Google Patents
X線解析装置 Download PDFInfo
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- JP6526983B2 JP6526983B2 JP2015028961A JP2015028961A JP6526983B2 JP 6526983 B2 JP6526983 B2 JP 6526983B2 JP 2015028961 A JP2015028961 A JP 2015028961A JP 2015028961 A JP2015028961 A JP 2015028961A JP 6526983 B2 JP6526983 B2 JP 6526983B2
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- 239000000523 sample Substances 0.000 claims description 72
- 238000002441 X-ray diffraction Methods 0.000 claims description 53
- 238000005259 measurement Methods 0.000 claims description 44
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- 238000009681 x-ray fluorescence measurement Methods 0.000 description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/08—Means for conveying samples received
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Programme-controlled manipulators
- B25J9/0093—Programme-controlled manipulators co-operating with conveyor means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/36—Textiles
- G01N33/367—Fabric or woven textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/308—Accessories, mechanical or electrical features support of radiation source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/642—Specific applications or type of materials moving sheet, web
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S901/00—Robots
- Y10S901/14—Arm movement, spatial
- Y10S901/15—Jointed arm
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- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
試料を保持するための一次試料保持器と、
X線源およびX線検出器を含むX線解析ヘッドと、
この装置に取り付けられた、X線解析ヘッドが取り付けられているロボット・アームであって、X線解析ヘッドを、試料の測定位置へ持ってくることができるように、3次元の直線方向および回転方向に動かすように構成されたロボット・アームとを備える。
4 ロボット・アーム
6 X線解析ヘッド
8 軸
9 内壁
11 入口ローラー
12 入力ローラー
13 出口ローラー
14 出力ローラー
16 ガイド・ローラー
18 測定ローラー
20 材料フィードスルー・システム
22 X線源
24 X線検出器
30 フレーム
32 参照試料
34 支持体
36 監視試料
40 ビデオ・カメラ
42 距離センサ
50 コントローラ
60 柔軟シート
70 試料
Claims (13)
- 試料をX線解析するための装置であって、
前記試料を保持するための一次試料保持器と、
X線源およびX線検出器を含むX線解析ヘッドと、
前記装置に取り付けられたロボット・アームであって、前記X線解析ヘッドが取り付けられており、前記X線解析ヘッドを、前記試料の測定位置へ持ってくることができるように、3次元の直線方向と回転方向の両方に動かすように構成された、ロボット・アームとを備え、
前記一次試料保持器が、前記装置を通して柔軟シートの形態の試料を移動させるための材料フィードスルー・システムであり、
前記ロボット・アームが、前記X線解析ヘッドを3つの直線方向に移動させ、3つの直交軸のまわりで回転させるように構成された6軸ロボット・アームである、装置。 - 前記フィードスルー・システムが、測定中に前記柔軟シートを支持するためのローラーの測定支持体の対を備える請求項1に記載の装置。
- 前記装置を通して前記柔軟シートを導くための追加のガイド・ローラーをさらに備える請求項2に記載の装置。
- 前記ロボット・アームと、測定のために前記柔軟シートを支持するための前記材料フィードスルー・システムの一部分とを収納するためのハウジングをさらに備える請求項1、2または3に記載の装置。
- 前記一次試料保持器に加えて、固定された試料取付け台をさらに備える請求項1ないし4のいずれかに記載の装置。
- 前記固定された試料取付け台が、取外し可能なフレームの形態である請求項5に記載の装置。
- 測定中に前記X線解析ヘッドを位置付けるために前記アームの位置を測定するための、前記ロボット・アームおよび/または前記X線解析ヘッド上の位置センサをさらに備える請求項1ないし6のいずれかに記載の装置。
- 前記位置センサが、前記柔軟シートまたは追加の試料に対する前記アームの位置を測定するための距離センサである請求項7に記載の装置。
- 測定中に前記X線解析ヘッドを位置付けるために、前記ロボット・アームおよび/またはX線解析ヘッド上に取り付けられたビデオ・カメラをさらに備える請求項1ないし8のいずれかに記載の装置。
- 前記X線解析ヘッドがX線蛍光ヘッドである請求項1ないし9のいずれかに記載の装置。
- 前記X線解析ヘッドがX線回折ヘッドである請求項1ないし10のいずれかに記載の装置。
- 前記材料フィードスルー・システムに沿って柔軟シートを通し、前記X線解析ヘッドを使用して前記柔軟シートの組成を測定することを含む、請求項1ないし11のいずれかに記載の装置の操作方法。
- 前記X線解析ヘッドを使用して参照試料の組成を測定することをさらに備える請求項12に記載の操作方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP14155632.4A EP2908127B1 (en) | 2014-02-18 | 2014-02-18 | X-ray Analysis Apparatus with robotic arm |
EP14155632.4 | 2014-02-18 |
Publications (2)
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JP2015152607A JP2015152607A (ja) | 2015-08-24 |
JP6526983B2 true JP6526983B2 (ja) | 2019-06-05 |
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Country Status (4)
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US (1) | US9547094B2 (ja) |
EP (1) | EP2908127B1 (ja) |
JP (1) | JP6526983B2 (ja) |
CN (1) | CN104849295B (ja) |
Families Citing this family (13)
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US10012604B2 (en) * | 2015-12-15 | 2018-07-03 | Thermo Gamma-Metrics Pty Ltd | XRF detector and source calibration apparatus |
US10247836B2 (en) | 2015-12-15 | 2019-04-02 | Thermo Gamma-Metrics Pty Ltd | Resolution control in X-ray fluorescence spectroscopy systems |
FR3046241B1 (fr) * | 2015-12-24 | 2018-01-26 | Commissariat Energie Atomique | Procede de calibration d’un systeme d’analyse par diffraction x |
CN105510366A (zh) * | 2016-02-03 | 2016-04-20 | 中国工程物理研究院材料研究所 | 一种便携式x射线衍射仪 |
CN105891246B (zh) * | 2016-06-23 | 2018-11-16 | 北京至一恒盛技术服务有限公司 | 一种x射线荧光探测装置 |
US10641718B2 (en) | 2016-07-29 | 2020-05-05 | Bruker Handheld Llc | X-ray fluorescence analyzer |
CN107966461B (zh) * | 2017-11-20 | 2021-02-09 | 首都航天机械公司 | 一种双全回转检测机头位姿自动补偿机构 |
CN108169267A (zh) * | 2017-12-22 | 2018-06-15 | 通标标准技术服务(上海)有限公司 | 一种自动化xrf测试系统及测试方法 |
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CN110455802B (zh) * | 2019-08-27 | 2023-05-12 | 江苏金恒信息科技股份有限公司 | 基于视觉识别的合金分析装置及方法 |
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GB202300722D0 (en) * | 2023-01-18 | 2023-03-01 | Oxford Instruments Nanotechnology Tools Ltd | Interface apparatus for a particle beam instrument |
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2014
- 2014-02-18 EP EP14155632.4A patent/EP2908127B1/en active Active
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2015
- 2015-02-17 JP JP2015028961A patent/JP6526983B2/ja active Active
- 2015-02-17 US US14/624,005 patent/US9547094B2/en active Active
- 2015-02-25 CN CN201510155965.2A patent/CN104849295B/zh active Active
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Publication number | Publication date |
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US9547094B2 (en) | 2017-01-17 |
JP2015152607A (ja) | 2015-08-24 |
CN104849295A (zh) | 2015-08-19 |
CN104849295B (zh) | 2019-08-27 |
EP2908127B1 (en) | 2017-07-05 |
US20150234060A1 (en) | 2015-08-20 |
EP2908127A1 (en) | 2015-08-19 |
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