JP6511494B2 - シリコン含有下層 - Google Patents
シリコン含有下層 Download PDFInfo
- Publication number
- JP6511494B2 JP6511494B2 JP2017163123A JP2017163123A JP6511494B2 JP 6511494 B2 JP6511494 B2 JP 6511494B2 JP 2017163123 A JP2017163123 A JP 2017163123A JP 2017163123 A JP2017163123 A JP 2017163123A JP 6511494 B2 JP6511494 B2 JP 6511494B2
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- Prior art keywords
- silicon
- formula
- alkyl
- monomers
- organic
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- H—ELECTRICITY
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
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- C08F230/08—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and containing phosphorus, selenium, tellurium or a metal containing a metal containing silicon
- C08F230/085—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and containing phosphorus, selenium, tellurium or a metal containing a metal containing silicon the monomer being a polymerisable silane, e.g. (meth)acryloyloxy trialkoxy silanes or vinyl trialkoxysilanes
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- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
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- C08F220/26—Esters containing oxygen in addition to the carboxy oxygen
- C08F220/28—Esters containing oxygen in addition to the carboxy oxygen containing no aromatic rings in the alcohol moiety
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- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
- C08F220/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
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- C08F220/26—Esters containing oxygen in addition to the carboxy oxygen
- C08F220/32—Esters containing oxygen in addition to the carboxy oxygen containing epoxy radicals
- C08F220/325—Esters containing oxygen in addition to the carboxy oxygen containing epoxy radicals containing glycidyl radical, e.g. glycidyl (meth)acrylate
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- C08F222/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
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Description
R3SiY3 (3)
SiY1 4 (4)
R5 2SiY2 2 (5a)
R5 3SiY2 (5b)
Claims (8)
- (a)Si−O結合を含む骨格を含む1つ以上の硬化性シリコン含有ポリマーと、1つ以上の有機ブレンドポリマーと、1つ以上の有機溶媒とを含むコーティング組成物で基板をコーティングして、前記基板上に硬化性シリコン含有ポリマー層を形成することと、(b)前記シリコン含有ポリマー層を硬化させて、シロキサン下層を形成することと、(c)フォトレジスト層を前記シロキサン下層上に配置することと、(d)前記フォトレジスト層をパターン的に曝露して、潜像を形成することと、(e)前記潜像を現像して、レリーフ像を内部に有するパターン化されたフォトレジスト層を形成することと、(f)前記レリーフ像を前記基板に転写することと、(g)湿式剥離によって前記シロキサン下層を除去することと、を含み、
前記有機ブレンドポリマーが、重合単位として、式(1a)の1つ以上のモノマー及び式(2)の1つ以上のモノマーを含み、
- 前記式(1a)のモノマーが、式(1b)を有し、
- R2の前記ラクトン部分が、5〜7員環または置換5〜7員環である、請求項1に記載の方法。
- 前記コーティング組成物が、1つ以上の硬化触媒をさらに含む、請求項1に記載の方法。
- 前記1つ以上のシリコン含有ポリマーが、重合単位として、式(3)、(4)、(5a)、及び(5b)から選択される1つ以上のモノマーを含み、
R3SiY3 (3)
SiY1 4 (4)
R5 2SiY2 2 (5a)
R5 3SiY2 (5b)
式中、各Y、Y1、及びY2は、独立して、ハロゲン、C1−10アルコキシ、及び−OC(O)−R4から選択される加水分解性部分であり、R3は、C1−30ヒドロカルビル部分または置換C1−30ヒドロカルビル部分であり、各R4は、H、OH、C1−10アルキル、及びC1−10アルコキシから選択され、各R5は、独立して、C1−30ヒドロカルビル部分または置換C1−30ヒドロカルビル部分である、請求項1に記載の方法。 - 前記1つ以上のシリコン含有ポリマーが、重合単位として、式(6)の1つ以上の単位と、任意に式(7)の1つ以上の単位と、を含み、
- ステップ(a)の前に、高炭素含有量有機コーティング層を前記基板上にコーティングすることをさらに含む、請求項1に記載の方法。
- 前記湿式剥離ステップが、前記シロキサン下層を硫酸と過酸化水素との混合物またはアンモニアと過酸化水素との混合物と接触させることを含む、請求項1に記載の方法。
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JP7075209B2 (ja) * | 2016-12-28 | 2022-05-25 | 東京応化工業株式会社 | パターン形成方法及びポリシラン樹脂前駆体の製造方法 |
JP7307005B2 (ja) * | 2019-04-26 | 2023-07-11 | 信越化学工業株式会社 | 硬化触媒の拡散距離を測定する方法 |
CN114174926A (zh) * | 2019-07-25 | 2022-03-11 | 日产化学株式会社 | 抗蚀剂下层膜形成用组合物 |
US11817317B2 (en) | 2019-10-24 | 2023-11-14 | Brewer Science, Inc. | High-silicon-content wet-removable planarizing layer |
WO2023204078A1 (ja) * | 2022-04-22 | 2023-10-26 | Jsr株式会社 | 半導体基板の製造方法及びケイ素含有組成物 |
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JP5015891B2 (ja) | 2008-10-02 | 2012-08-29 | 信越化学工業株式会社 | 金属酸化物含有膜形成用組成物、金属酸化物含有膜形成基板及びパターン形成方法 |
JP5015892B2 (ja) | 2008-10-02 | 2012-08-29 | 信越化学工業株式会社 | ケイ素含有膜形成用組成物、ケイ素含有膜形成基板及びパターン形成方法 |
WO2010071155A1 (ja) | 2008-12-19 | 2010-06-24 | 日産化学工業株式会社 | アニオン基を有するシリコン含有レジスト下層膜形成組成物 |
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JP6250513B2 (ja) | 2014-10-03 | 2017-12-20 | 信越化学工業株式会社 | 塗布型ケイ素含有膜形成用組成物、基板、及びパターン形成方法 |
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