JP6506328B2 - 埋設試料ブロック及び試料シートの作製方法 - Google Patents
埋設試料ブロック及び試料シートの作製方法 Download PDFInfo
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- JP6506328B2 JP6506328B2 JP2017037038A JP2017037038A JP6506328B2 JP 6506328 B2 JP6506328 B2 JP 6506328B2 JP 2017037038 A JP2017037038 A JP 2017037038A JP 2017037038 A JP2017037038 A JP 2017037038A JP 6506328 B2 JP6506328 B2 JP 6506328B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/36—Embedding or analogous mounting of samples
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
- G01N2001/2873—Cutting or cleaving
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/36—Embedding or analogous mounting of samples
- G01N2001/364—Embedding or analogous mounting of samples using resins, epoxy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/36—Embedding or analogous mounting of samples
- G01N2001/366—Moulds; Demoulding
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW105129166A TWI606231B (zh) | 2016-09-08 | 2016-09-08 | 包埋樣品塊的製造方法及樣品試片 |
TW105129166 | 2016-09-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018040784A JP2018040784A (ja) | 2018-03-15 |
JP6506328B2 true JP6506328B2 (ja) | 2019-04-24 |
Family
ID=60451831
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017037038A Active JP6506328B2 (ja) | 2016-09-08 | 2017-02-28 | 埋設試料ブロック及び試料シートの作製方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US9835530B1 (zh) |
JP (1) | JP6506328B2 (zh) |
CN (1) | CN107807023B (zh) |
TW (1) | TWI606231B (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108593648B (zh) * | 2018-05-28 | 2024-05-24 | 宁波大学 | 一种3d微结构观测装置及其观测方法 |
GB2595693B (en) * | 2020-06-03 | 2022-08-10 | Rocktype Ltd | Puck and puck holder |
CN113233143A (zh) * | 2021-04-22 | 2021-08-10 | 川北医学院 | 一种用于标记组织学包埋盒的装置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4276253A (en) * | 1979-04-20 | 1981-06-30 | Technicon Instruments Corporation | Method for histology specimen labelling |
JPH0328736A (ja) * | 1989-06-26 | 1991-02-06 | Nuclear Fuel Ind Ltd | 組織観察試験片の埋込み方法 |
US7611840B2 (en) * | 2004-08-03 | 2009-11-03 | Agency For Science, Technology And Research | Method and device for the treatment of biological samples |
TW200813418A (en) * | 2006-09-06 | 2008-03-16 | Inotera Memories Inc | Method of fabricating sample membrane for transmission electron microscopy analysis |
WO2008063135A1 (en) * | 2006-11-24 | 2008-05-29 | Agency For Science, Technology And Research | Apparatus for processing a sample in a liquid droplet and method of using the same |
JP4817320B2 (ja) * | 2006-12-26 | 2011-11-16 | セイコーインスツル株式会社 | 薄切片標本作製装置及び薄切片標本作製方法 |
KR101102532B1 (ko) * | 2008-07-10 | 2012-01-03 | 삼성전자주식회사 | 시약 카트리지, 시약 카트리지를 구비하는 미세유동장치, 그 제조방법, 및 이를 이용한 시료분석방법 |
NL2005461C2 (nl) * | 2010-10-06 | 2012-04-11 | Klinipath B V | Gietmal, samenstel van zo een gietmal en opsluitelement, werkwijze voor het prepareren van weefsel en inrichting voor het onttrekken van water uit weefselmateriaal. |
EP2754693B1 (en) * | 2011-09-06 | 2018-11-14 | Kurume University | Embedding resin composition for electron microscope, and method for observing sample on electron microscope using said composition |
JP2013083474A (ja) * | 2011-10-06 | 2013-05-09 | Olympus Corp | 重ね合わせ画像の構築方法 |
KR20130131569A (ko) * | 2012-05-24 | 2013-12-04 | 한국기계연구원 | 실시간 인장 투과전자현미경 샘플 제조 금형 |
DE102012108508A1 (de) * | 2012-09-12 | 2014-03-13 | Carl Zeiss Ag | Verfahren und Vorrichtungen zum Behandeln von Proben sowie Manipulationsverfahren und -vorrichtungen |
AU2013315934B2 (en) * | 2012-09-12 | 2017-09-07 | Biopath Automation, L.L.C. | Microtome sectionable gel support structure and methods |
CN104995498B (zh) * | 2012-12-17 | 2018-04-03 | 尤西-凯尔有限公司 | 用于将生物样本包埋在块体中的模具和模塑设备以及相关方法 |
JP6319682B2 (ja) * | 2013-12-10 | 2018-05-09 | 村角工業株式会社 | パラフィンブロック作成用トレイ |
JP2015155873A (ja) * | 2014-02-21 | 2015-08-27 | 静岡県 | 検査用薄切標本、検査用薄切標本の作成方法および検査用薄切標本の標識表示方法 |
-
2016
- 2016-09-08 TW TW105129166A patent/TWI606231B/zh active
- 2016-10-24 US US15/331,917 patent/US9835530B1/en active Active
- 2016-11-07 CN CN201610975619.3A patent/CN107807023B/zh active Active
-
2017
- 2017-02-28 JP JP2017037038A patent/JP6506328B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
US9835530B1 (en) | 2017-12-05 |
TWI606231B (zh) | 2017-11-21 |
TW201809629A (zh) | 2018-03-16 |
CN107807023A (zh) | 2018-03-16 |
JP2018040784A (ja) | 2018-03-15 |
CN107807023B (zh) | 2020-07-14 |
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