JP6490914B2 - 半導体装置の作製方法 - Google Patents
半導体装置の作製方法 Download PDFInfo
- Publication number
- JP6490914B2 JP6490914B2 JP2014131724A JP2014131724A JP6490914B2 JP 6490914 B2 JP6490914 B2 JP 6490914B2 JP 2014131724 A JP2014131724 A JP 2014131724A JP 2014131724 A JP2014131724 A JP 2014131724A JP 6490914 B2 JP6490914 B2 JP 6490914B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- metal oxide
- insulating film
- oxide film
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Electroluminescent Light Sources (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014131724A JP6490914B2 (ja) | 2013-06-28 | 2014-06-26 | 半導体装置の作製方法 |
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013135981 | 2013-06-28 | ||
| JP2013135981 | 2013-06-28 | ||
| JP2014038645 | 2014-02-28 | ||
| JP2014038645 | 2014-02-28 | ||
| JP2014131724A JP6490914B2 (ja) | 2013-06-28 | 2014-06-26 | 半導体装置の作製方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018089942A Division JP6582094B2 (ja) | 2013-06-28 | 2018-05-08 | 半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015179805A JP2015179805A (ja) | 2015-10-08 |
| JP2015179805A5 JP2015179805A5 (enExample) | 2017-08-03 |
| JP6490914B2 true JP6490914B2 (ja) | 2019-03-27 |
Family
ID=54263661
Family Applications (6)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014131724A Expired - Fee Related JP6490914B2 (ja) | 2013-06-28 | 2014-06-26 | 半導体装置の作製方法 |
| JP2018089942A Active JP6582094B2 (ja) | 2013-06-28 | 2018-05-08 | 半導体装置 |
| JP2019159434A Active JP6962978B2 (ja) | 2013-06-28 | 2019-09-02 | 液晶表示装置 |
| JP2021168755A Active JP7261278B2 (ja) | 2013-06-28 | 2021-10-14 | 液晶表示装置 |
| JP2023062456A Withdrawn JP2023090731A (ja) | 2013-06-28 | 2023-04-07 | 液晶表示装置 |
| JP2024189550A Pending JP2025014013A (ja) | 2013-06-28 | 2024-10-29 | 液晶表示装置 |
Family Applications After (5)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018089942A Active JP6582094B2 (ja) | 2013-06-28 | 2018-05-08 | 半導体装置 |
| JP2019159434A Active JP6962978B2 (ja) | 2013-06-28 | 2019-09-02 | 液晶表示装置 |
| JP2021168755A Active JP7261278B2 (ja) | 2013-06-28 | 2021-10-14 | 液晶表示装置 |
| JP2023062456A Withdrawn JP2023090731A (ja) | 2013-06-28 | 2023-04-07 | 液晶表示装置 |
| JP2024189550A Pending JP2025014013A (ja) | 2013-06-28 | 2024-10-29 | 液晶表示装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (6) | JP6490914B2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE112016005330T5 (de) * | 2015-11-20 | 2018-08-23 | Semiconductor Energy Laboratory Co., Ltd. | Halbleitervorrichtung, Herstellungsverfahren der Halbleitervorrichtung oder Anzeigevorrichtung, die die Halbleitervorrichtung beinhaltet |
| KR20180016330A (ko) * | 2016-07-08 | 2018-02-14 | 보에 테크놀로지 그룹 컴퍼니 리미티드 | 박막 트랜지스터, 게이트 드라이브 온 어레이 및 이를 갖는 디스플레이 장치, 및 그 제조 방법 |
| WO2018211351A1 (en) * | 2017-05-19 | 2018-11-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display device, and method for manufacturing semiconductor device |
| JP6799123B2 (ja) * | 2018-09-19 | 2020-12-09 | シャープ株式会社 | アクティブマトリクス基板およびその製造方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05273592A (ja) * | 1992-01-31 | 1993-10-22 | Canon Inc | アクティブマトリクス型液晶表示素子及びその製造方法 |
| JP3683463B2 (ja) * | 1999-03-11 | 2005-08-17 | シャープ株式会社 | アクティブマトリクス基板、その製造方法、及び、該基板を用いたイメージセンサ |
| KR100611042B1 (ko) * | 1999-12-27 | 2006-08-09 | 엘지.필립스 엘시디 주식회사 | 액정 표시장치 제조방법 및 그 제조방법에 따른액정표시장치 |
| JP2005091819A (ja) * | 2003-09-18 | 2005-04-07 | Sharp Corp | 液晶表示装置 |
| JP5148912B2 (ja) * | 2006-04-06 | 2013-02-20 | 株式会社半導体エネルギー研究所 | 液晶表示装置及び半導体装置、並びに電子機器 |
| JP2008134625A (ja) * | 2006-10-26 | 2008-06-12 | Semiconductor Energy Lab Co Ltd | 半導体装置、表示装置及び電子機器 |
| KR101375831B1 (ko) * | 2007-12-03 | 2014-04-02 | 삼성전자주식회사 | 산화물 반도체 박막 트랜지스터를 이용한 디스플레이 장치 |
| JP5525224B2 (ja) * | 2008-09-30 | 2014-06-18 | 株式会社半導体エネルギー研究所 | 表示装置 |
| JP2010177223A (ja) | 2009-01-27 | 2010-08-12 | Videocon Global Ltd | 液晶表示装置及びその製造方法 |
| US20100224880A1 (en) * | 2009-03-05 | 2010-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP2010230744A (ja) * | 2009-03-26 | 2010-10-14 | Videocon Global Ltd | 液晶表示装置及びその製造方法 |
| TWI596741B (zh) * | 2009-08-07 | 2017-08-21 | 半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
| CN102549757A (zh) * | 2009-09-30 | 2012-07-04 | 佳能株式会社 | 薄膜晶体管 |
| JP2011091110A (ja) * | 2009-10-20 | 2011-05-06 | Canon Inc | 酸化物半導体素子を用いた回路及びその製造方法、並びに表示装置 |
| JP5095865B2 (ja) * | 2009-12-21 | 2012-12-12 | シャープ株式会社 | アクティブマトリクス基板及びそれを備えた表示パネル、並びにアクティブマトリクス基板の製造方法 |
| KR20250150667A (ko) * | 2010-02-26 | 2025-10-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| TWI432865B (zh) * | 2010-12-01 | 2014-04-01 | Au Optronics Corp | 畫素結構及其製作方法 |
| KR20120063809A (ko) * | 2010-12-08 | 2012-06-18 | 삼성전자주식회사 | 박막 트랜지스터 표시판 |
| EP2657974B1 (en) * | 2010-12-20 | 2017-02-08 | Sharp Kabushiki Kaisha | Semiconductor device and display device |
| US9019440B2 (en) * | 2011-01-21 | 2015-04-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| JP2012160679A (ja) * | 2011-02-03 | 2012-08-23 | Sony Corp | 薄膜トランジスタ、表示装置および電子機器 |
| JP5685989B2 (ja) * | 2011-02-28 | 2015-03-18 | ソニー株式会社 | 表示装置および電子機器 |
| JP5784732B2 (ja) * | 2011-08-10 | 2015-09-24 | シャープ株式会社 | 液晶表示装置、および液晶表示装置の製造方法 |
| JP6122275B2 (ja) * | 2011-11-11 | 2017-04-26 | 株式会社半導体エネルギー研究所 | 表示装置 |
| US9082861B2 (en) * | 2011-11-11 | 2015-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Transistor with oxide semiconductor channel having protective layer |
-
2014
- 2014-06-26 JP JP2014131724A patent/JP6490914B2/ja not_active Expired - Fee Related
-
2018
- 2018-05-08 JP JP2018089942A patent/JP6582094B2/ja active Active
-
2019
- 2019-09-02 JP JP2019159434A patent/JP6962978B2/ja active Active
-
2021
- 2021-10-14 JP JP2021168755A patent/JP7261278B2/ja active Active
-
2023
- 2023-04-07 JP JP2023062456A patent/JP2023090731A/ja not_active Withdrawn
-
2024
- 2024-10-29 JP JP2024189550A patent/JP2025014013A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP6962978B2 (ja) | 2021-11-05 |
| JP2022020664A (ja) | 2022-02-01 |
| JP2018152581A (ja) | 2018-09-27 |
| JP6582094B2 (ja) | 2019-09-25 |
| JP2025014013A (ja) | 2025-01-28 |
| JP2019220707A (ja) | 2019-12-26 |
| JP2015179805A (ja) | 2015-10-08 |
| JP7261278B2 (ja) | 2023-04-19 |
| JP2023090731A (ja) | 2023-06-29 |
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