JP6477477B2 - 感放射線樹脂組成物および電子部品 - Google Patents
感放射線樹脂組成物および電子部品 Download PDFInfo
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- JP6477477B2 JP6477477B2 JP2015535467A JP2015535467A JP6477477B2 JP 6477477 B2 JP6477477 B2 JP 6477477B2 JP 2015535467 A JP2015535467 A JP 2015535467A JP 2015535467 A JP2015535467 A JP 2015535467A JP 6477477 B2 JP6477477 B2 JP 6477477B2
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- WNBDFALPKHFDJO-UHFFFAOYSA-N pentadec-3-ene Chemical compound CCCCCCCCCCCC=CCC WNBDFALPKHFDJO-UHFFFAOYSA-N 0.000 description 1
- OHVKVVAUWQFKQY-UHFFFAOYSA-N pentadeca-2,7,9,11-tetraene Chemical compound CCCC=CC=CC=CCCCC=CC OHVKVVAUWQFKQY-UHFFFAOYSA-N 0.000 description 1
- LTBKJTHWKYUMTA-UHFFFAOYSA-N pentadeca-3,10-diene Chemical compound CCCCC=CCCCCCC=CCC LTBKJTHWKYUMTA-UHFFFAOYSA-N 0.000 description 1
- 125000002958 pentadecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- RGSFGYAAUTVSQA-UHFFFAOYSA-N pentamethylene Natural products C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 1
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- 125000005003 perfluorobutyl group Chemical group FC(F)(F)C(F)(F)C(F)(F)C(F)(F)* 0.000 description 1
- 125000005008 perfluoropentyl group Chemical group FC(C(C(C(C(F)(F)F)(F)F)(F)F)(F)F)(F)* 0.000 description 1
- RVZRBWKZFJCCIB-UHFFFAOYSA-N perfluorotributylamine Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(F)(F)N(C(F)(F)C(F)(F)C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F RVZRBWKZFJCCIB-UHFFFAOYSA-N 0.000 description 1
- 239000013500 performance material Substances 0.000 description 1
- 125000001792 phenanthrenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3C=CC12)* 0.000 description 1
- 125000001791 phenazinyl group Chemical group C1(=CC=CC2=NC3=CC=CC=C3N=C12)* 0.000 description 1
- 125000001484 phenothiazinyl group Chemical group C1(=CC=CC=2SC3=CC=CC=C3NC12)* 0.000 description 1
- 125000004932 phenoxathinyl group Chemical group 0.000 description 1
- 125000001644 phenoxazinyl group Chemical group C1(=CC=CC=2OC3=CC=CC=C3NC12)* 0.000 description 1
- XYFCBTPGUUZFHI-UHFFFAOYSA-O phosphonium Chemical compound [PH4+] XYFCBTPGUUZFHI-UHFFFAOYSA-O 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- DOIRQSBPFJWKBE-UHFFFAOYSA-N phthalic acid di-n-butyl ester Natural products CCCCOC(=O)C1=CC=CC=C1C(=O)OCCCC DOIRQSBPFJWKBE-UHFFFAOYSA-N 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920006123 polyhexamethylene isophthalamide Polymers 0.000 description 1
- 230000037048 polymerization activity Effects 0.000 description 1
- 239000002685 polymerization catalyst Substances 0.000 description 1
- 229920000259 polyoxyethylene lauryl ether Polymers 0.000 description 1
- 150000008442 polyphenolic compounds Chemical class 0.000 description 1
- 235000013824 polyphenols Nutrition 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 125000001844 prenyl group Chemical group [H]C([*])([H])C([H])=C(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 150000003141 primary amines Chemical class 0.000 description 1
- UWHMFGKZAYHMDJ-UHFFFAOYSA-N propane-1,2,3-trithiol Chemical compound SCC(S)CS UWHMFGKZAYHMDJ-UHFFFAOYSA-N 0.000 description 1
- 229940090181 propyl acetate Drugs 0.000 description 1
- LKKVMVMKNLULSL-UHFFFAOYSA-N propyl bicyclo[2.2.1]hept-2-ene-5-carboxylate Chemical compound C1C2C(C(=O)OCCC)CC1C=C2 LKKVMVMKNLULSL-UHFFFAOYSA-N 0.000 description 1
- QMTZQLNTTKDRKC-UHFFFAOYSA-N propyl tricyclo[5.2.1.02,6]dec-8-ene-2-carboxylate Chemical compound C(CC)OC(=O)C12C3C=CC(C2CCC1)C3 QMTZQLNTTKDRKC-UHFFFAOYSA-N 0.000 description 1
- QQONPFPTGQHPMA-UHFFFAOYSA-N propylene Natural products CC=C QQONPFPTGQHPMA-UHFFFAOYSA-N 0.000 description 1
- 235000013772 propylene glycol Nutrition 0.000 description 1
- 125000004309 pyranyl group Chemical group O1C(C=CC=C1)* 0.000 description 1
- ZUCRGHABDDWQPY-UHFFFAOYSA-N pyrazine-2,3-dicarboxylic acid Chemical compound OC(=O)C1=NC=CN=C1C(O)=O ZUCRGHABDDWQPY-UHFFFAOYSA-N 0.000 description 1
- GMIOYJQLNFNGPR-UHFFFAOYSA-N pyrazine-2,5-dicarboxylic acid Chemical compound OC(=O)C1=CN=C(C(O)=O)C=N1 GMIOYJQLNFNGPR-UHFFFAOYSA-N 0.000 description 1
- 125000003373 pyrazinyl group Chemical group 0.000 description 1
- 125000001725 pyrenyl group Chemical group 0.000 description 1
- PBMFSQRYOILNGV-UHFFFAOYSA-N pyridazine Chemical compound C1=CC=NN=C1 PBMFSQRYOILNGV-UHFFFAOYSA-N 0.000 description 1
- RDQWJNPUOHXYCV-UHFFFAOYSA-N pyridazine-3,4-dicarboxylic acid Chemical compound OC(=O)C1=CC=NN=C1C(O)=O RDQWJNPUOHXYCV-UHFFFAOYSA-N 0.000 description 1
- WDGMXFVCMOBICS-UHFFFAOYSA-N pyridazine-3,5-dicarboxylic acid Chemical compound OC(=O)C1=CN=NC(C(O)=O)=C1 WDGMXFVCMOBICS-UHFFFAOYSA-N 0.000 description 1
- FJPJFQGISLJONZ-UHFFFAOYSA-N pyridazine-3,6-dicarboxylic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)N=N1 FJPJFQGISLJONZ-UHFFFAOYSA-N 0.000 description 1
- YRTBTTMXMPXJBB-UHFFFAOYSA-N pyridazine-4,5-dicarboxylic acid Chemical compound OC(=O)C1=CN=NC=C1C(O)=O YRTBTTMXMPXJBB-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 125000004076 pyridyl group Chemical group 0.000 description 1
- HLRLQGYRJSKVNX-UHFFFAOYSA-N pyrimidine-2,4-dicarboxylic acid Chemical compound OC(=O)C1=CC=NC(C(O)=O)=N1 HLRLQGYRJSKVNX-UHFFFAOYSA-N 0.000 description 1
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- HZMKWGOYWYBPRV-UHFFFAOYSA-N pyrimidine-4,5-dicarboxylic acid Chemical compound OC(=O)C1=CN=CN=C1C(O)=O HZMKWGOYWYBPRV-UHFFFAOYSA-N 0.000 description 1
- XIEOKRXVAACBHI-UHFFFAOYSA-N pyrimidine-4,6-dicarboxylic acid Chemical compound OC(=O)C1=CC(C(O)=O)=NC=N1 XIEOKRXVAACBHI-UHFFFAOYSA-N 0.000 description 1
- 125000000714 pyrimidinyl group Chemical group 0.000 description 1
- JFVDNCRMBALUKH-UHFFFAOYSA-N pyrrole-3,4-dicarboxylic acid Chemical compound OC(=O)C1=CNC=C1C(O)=O JFVDNCRMBALUKH-UHFFFAOYSA-N 0.000 description 1
- 125000000168 pyrrolyl group Chemical group 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 125000002294 quinazolinyl group Chemical group N1=C(N=CC2=CC=CC=C12)* 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- MCJGNVYPOGVAJF-UHFFFAOYSA-N quinolin-8-ol Chemical compound C1=CN=C2C(O)=CC=CC2=C1 MCJGNVYPOGVAJF-UHFFFAOYSA-N 0.000 description 1
- 125000005493 quinolyl group Chemical group 0.000 description 1
- 125000001567 quinoxalinyl group Chemical group N1=C(C=NC2=CC=CC=C12)* 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007152 ring opening metathesis polymerisation reaction Methods 0.000 description 1
- 238000007151 ring opening polymerisation reaction Methods 0.000 description 1
- YGSDEFSMJLZEOE-UHFFFAOYSA-N salicylic acid Chemical compound OC(=O)C1=CC=CC=C1O YGSDEFSMJLZEOE-UHFFFAOYSA-N 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 125000003548 sec-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 235000019795 sodium metasilicate Nutrition 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- WUNGPAHZQWNPEL-UHFFFAOYSA-N st50032131 Chemical compound C1=CC2CC1C1C2C(=O)N(CCO)C1=O WUNGPAHZQWNPEL-UHFFFAOYSA-N 0.000 description 1
- GAONUEUNHBLHPP-UHFFFAOYSA-N stk246934 Chemical compound O=C1C2C(C=C3)CC3C2C(=O)N1C1=CC=CC=C1 GAONUEUNHBLHPP-UHFFFAOYSA-N 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- ACTRVOBWPAIOHC-UHFFFAOYSA-N succimer Chemical compound OC(=O)C(S)C(S)C(O)=O ACTRVOBWPAIOHC-UHFFFAOYSA-N 0.000 description 1
- 239000001384 succinic acid Substances 0.000 description 1
- 125000000542 sulfonic acid group Chemical group 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- 125000001973 tert-pentyl group Chemical group [H]C([H])([H])C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 125000001935 tetracenyl group Chemical group C1(=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C12)* 0.000 description 1
- XBFJAVXCNXDMBH-UHFFFAOYSA-N tetracyclo[6.2.1.1(3,6).0(2,7)]dodec-4-ene Chemical compound C1C(C23)C=CC1C3C1CC2CC1 XBFJAVXCNXDMBH-UHFFFAOYSA-N 0.000 description 1
- PVJHFVMRMWVWAX-UHFFFAOYSA-N tetradeca-2,7,9,11-tetraene Chemical compound CCC=CC=CC=CCCCC=CC PVJHFVMRMWVWAX-UHFFFAOYSA-N 0.000 description 1
- LVEOKSIILWWVEO-UHFFFAOYSA-N tetradecyl 3-(3-oxo-3-tetradecoxypropyl)sulfanylpropanoate Chemical compound CCCCCCCCCCCCCCOC(=O)CCSCCC(=O)OCCCCCCCCCCCCCC LVEOKSIILWWVEO-UHFFFAOYSA-N 0.000 description 1
- JCJNUSDBRRKQPC-UHFFFAOYSA-M tetrahexylazanium;hydroxide Chemical compound [OH-].CCCCCC[N+](CCCCCC)(CCCCCC)CCCCCC JCJNUSDBRRKQPC-UHFFFAOYSA-M 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 125000000335 thiazolyl group Chemical group 0.000 description 1
- 125000001544 thienyl group Chemical group 0.000 description 1
- 125000004149 thio group Chemical group *S* 0.000 description 1
- NJRXVEJTAYWCQJ-UHFFFAOYSA-N thiomalic acid Chemical compound OC(=O)CC(S)C(O)=O NJRXVEJTAYWCQJ-UHFFFAOYSA-N 0.000 description 1
- HIHKYDVSWLFRAY-UHFFFAOYSA-N thiophene-2,3-dicarboxylic acid Chemical compound OC(=O)C=1C=CSC=1C(O)=O HIHKYDVSWLFRAY-UHFFFAOYSA-N 0.000 description 1
- QYBBDSGVPGCWTO-UHFFFAOYSA-N thiophene-2,4-dicarboxylic acid Chemical compound OC(=O)C1=CSC(C(O)=O)=C1 QYBBDSGVPGCWTO-UHFFFAOYSA-N 0.000 description 1
- YCGAZNXXGKTASZ-UHFFFAOYSA-N thiophene-2,5-dicarboxylic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)S1 YCGAZNXXGKTASZ-UHFFFAOYSA-N 0.000 description 1
- ZWWLLYJRPKYTDF-UHFFFAOYSA-N thiophene-3,4-dicarboxylic acid Chemical compound OC(=O)C1=CSC=C1C(O)=O ZWWLLYJRPKYTDF-UHFFFAOYSA-N 0.000 description 1
- NBOMNTLFRHMDEZ-UHFFFAOYSA-N thiosalicylic acid Chemical compound OC(=O)C1=CC=CC=C1S NBOMNTLFRHMDEZ-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229960001295 tocopherol Drugs 0.000 description 1
- 229930003799 tocopherol Chemical group 0.000 description 1
- 239000011732 tocopherol Chemical group 0.000 description 1
- 235000010384 tocopherol Nutrition 0.000 description 1
- 125000002640 tocopherol group Chemical group 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- 230000002463 transducing effect Effects 0.000 description 1
- QENJZWZWAWWESF-UHFFFAOYSA-N tri-methylbenzoic acid Natural products CC1=CC(C)=C(C(O)=O)C=C1C QENJZWZWAWWESF-UHFFFAOYSA-N 0.000 description 1
- UBOXGVDOUJQMTN-UHFFFAOYSA-N trichloroethylene Natural products ClCC(Cl)Cl UBOXGVDOUJQMTN-UHFFFAOYSA-N 0.000 description 1
- 125000003866 trichloromethyl group Chemical group ClC(Cl)(Cl)* 0.000 description 1
- YOKZJDRCZXTECO-UHFFFAOYSA-N tricyclo[5.2.1.02,6]deca-3,8-diene-2-carboxylic acid Chemical compound C1=CC2CC1C1(C(=O)O)C2CC=C1 YOKZJDRCZXTECO-UHFFFAOYSA-N 0.000 description 1
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 1
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 description 1
- YFTHZRPMJXBUME-UHFFFAOYSA-N tripropylamine Chemical compound CCCN(CCC)CCC YFTHZRPMJXBUME-UHFFFAOYSA-N 0.000 description 1
- XUHUMYVYHLHMCD-UHFFFAOYSA-N tris(2-cyclohexylphenyl) phosphite Chemical compound C1CCCCC1C1=CC=CC=C1OP(OC=1C(=CC=CC=1)C1CCCCC1)OC1=CC=CC=C1C1CCCCC1 XUHUMYVYHLHMCD-UHFFFAOYSA-N 0.000 description 1
- WGKLOLBTFWFKOD-UHFFFAOYSA-N tris(2-nonylphenyl) phosphite Chemical compound CCCCCCCCCC1=CC=CC=C1OP(OC=1C(=CC=CC=1)CCCCCCCCC)OC1=CC=CC=C1CCCCCCCCC WGKLOLBTFWFKOD-UHFFFAOYSA-N 0.000 description 1
- HBYRZSMDBQVSHO-UHFFFAOYSA-N tris(2-tert-butyl-4-methylphenyl) phosphite Chemical compound CC(C)(C)C1=CC(C)=CC=C1OP(OC=1C(=CC(C)=CC=1)C(C)(C)C)OC1=CC=C(C)C=C1C(C)(C)C HBYRZSMDBQVSHO-UHFFFAOYSA-N 0.000 description 1
- 150000003682 vanadium compounds Chemical class 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 125000001834 xanthenyl group Chemical group C1=CC=CC=2OC3=CC=CC=C3C(C12)* 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Epoxy Resins (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Description
〔1〕酸性基を有する脂環式オレフィン重合体(A)、下記一般式(1)で表されるスルホニウム塩系光酸発生剤(B)、および架橋剤(C)を含有してなる感放射線樹脂組成物、
〔2〕前記一般式(1)中、R1、R2、R3は、炭素数6〜30のアリール基である前記〔1〕に記載の感放射線樹脂組成物、
〔3〕前記一般式(1)中、R1、R2、R3は、フェニル基である前記〔2〕に記載の感放射線樹脂組成物、
〔4〕前記一般式(1)中、aは、3である前記〔1〕〜〔3〕のいずれかに記載の感放射線樹脂組成物、
〔5〕酸化防止剤(D)をさらに含有する前記〔1〕〜〔4〕のいずれかに記載の感放射線樹脂組成物、
〔6〕前記酸性基を有する脂環式オレフィン重合体(A)100重量部に対する、前記スルホニウム塩系光酸発生剤(B)の含有割合が、1〜15重量部である前記〔1〕〜〔5〕のいずれかに記載の感放射線樹脂組成物、
〔7〕前記架橋剤(C)が、エポキシ基を2つ以上有する化合物である前記〔1〕〜〔6〕のいずれかに記載の感放射線樹脂組成物、
〔8〕前記架橋剤(C)が、オキセタニル基を2以上有する化合物である前記〔1〕〜〔7〕のいずれかに記載の感放射線樹脂組成物、
〔9〕前記架橋剤(C)が、エポキシ基を2つ以上有する化合物およびオキセタニル基を2以上有する化合物である前記〔7〕または〔8〕に記載の感放射線樹脂組成物、ならびに、
〔10〕前記〔1〕〜〔9〕のいずれかに記載の感放射線樹脂組成物からなる樹脂膜を備える電子部品、
が提供される。
酸性基を有する脂環式オレフィン重合体(A)(以下、単に「脂環式オレフィン重合体(A)」とする。)としては、1または2以上の環状オレフィン単量体の重合体、または、1または2以上の環状オレフィン単量体と、これと共重合可能な単量体との共重合体が挙げられるが、本発明においては、脂環式オレフィン重合体(A)を形成するための単量体として、少なくとも酸性基を有する環状オレフィン単量体(a)を用いることが好ましい。
また、脂環式オレフィン重合体(A)の分子量分布は、重量平均分子量/数平均分子量(Mw/Mn)比で、通常、4以下、好ましくは3以下、より好ましくは2.5以下である。
脂環式オレフィン重合体(A)の重量平均分子量(Mw)や分子量分布(Mw/Mn)は、テトラヒドロフラン等の溶媒を溶離液としたゲル・パーミエーション・クロマトグラフィー(GPC)により、ポリスチレン換算値として求められる値である。
本発明の感放射線樹脂組成物は、下記一般式(1)で表されるスルホニウム塩系光酸発生剤(B)を含有する。下記一般式(1)で表されるスルホニウム塩系光酸発生剤(B)(以下、単に「スルホニウム塩系光酸発生剤(B)」とする。)は、光に感応してブレンステッド酸またはルイス酸を生成するスルホニウム塩系の化合物であり、感光剤、具体的には、ネガ型の感光剤として作用する。そのため、本発明の感放射線樹脂組成物は、通常、ネガ型の感放射線樹脂組成物して作用することとなる。
本発明の感放射線樹脂組成物は、上述した脂環式オレフィン重合体(A)、およびスルホニウム塩系光酸発生剤(B)に加えて、架橋剤(C)を含有する。本発明で用いる架橋剤(C)は、加熱により架橋剤分子間に架橋構造を形成するものや、脂環式オレフィン重合体(A)と反応して樹脂分子間に架橋構造を形成するものであり、具体的には、2以上の反応性基を有する化合物が挙げられる。このような反応性基としては、例えば、アミノ基、カルボキシ基、水酸基、エポキシ基、オキセタニル基、イソシアネート基が挙げられ、より好ましくはアミノ基、エポキシ基、オキセタニル基またはイソシアネート基であり、エポキシ基またはオキセタニル基がより好ましく、エポキシ基が特に好ましい。すなわち、架橋剤(C)としては、エポキシ基を2以上有する化合物、またはオキセタニル基を2以上有する化合物を用いることが特に好適であり、とりわけ、エポキシ基を2以上有する化合物を用いることが好適である。さらには、エポキシ基を2以上有する化合物に加えて、オキセタニル基を2以上有する化合物を併用することで、露光感度をより高めることができるため、これらを併用することも望ましい。
また、本発明の感放射線樹脂組成物は、上述した脂環式オレフィン重合体(A)、スルホニウム塩系光酸発生剤(B)、および架橋剤(C)に加えて、酸化防止剤(D)をさらに含有していることが好ましい。酸化防止剤(D)としては、特に限定されないが、フェノール系酸化防止剤、リン系酸化防止剤、イオウ系酸化防止剤、アミン系酸化防止剤、ラクトン系酸化防止剤等が使用できる。酸化防止剤を含有させることにより、得られる樹脂膜の耐光性、耐熱性を向上させることができる。
これらの酸化防止剤は、それぞれ単独でまたは2種以上を組み合わせて用いることができる。
また、本発明の感放射線樹脂組成物には、さらに、溶剤が含有されていてもよい。溶剤としては、特に限定されず、樹脂組成物の溶剤として公知のもの、例えばアセトン、メチルエチルケトン、シクロペンタノン、2−ヘキサノン、3−ヘキサノン、2−ヘプタノン、3−ヘプタノン、4−ヘプタノン、2−オクタノン、3−オクタノン、4−オクタノンなどの直鎖のケトン類;n−プロピルアルコール、イソプロピルアルコール、n−ブチルアルコール、シクロヘキサノールなどのアルコール類;エチレングリコールジメチルエーテル、エチレングリコールジエチルエーテル、ジオキサンなどのエーテル類;エチレングリコールモノメチルエーテル、エチレングリコールモノエチルエーテルなどのアルコールエーテル類;ギ酸プロピル、ギ酸ブチル、酢酸プロピル、酢酸ブチル、プロピオン酸メチル、プロピオン酸エチル、酪酸メチル、酪酸エチル、乳酸メチル、乳酸エチルなどのエステル類;セロソルブアセテート、メチルセロソルブアセテート、エチルセロソルブアセテート、プロピルセロソルブアセテート、ブチルセロソルブアセテートなどのセロソルブエステル類;プロピレングリコール、プロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテルアセテート、プロピレングリコールモノエチルエーテルアセテート、プロピレングリコールモノブチルエーテルなどのプロピレングリコール類;ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル、ジエチレングリコールジメチルエーテル、ジエチレングリコールジエチルエーテル、ジエチレングリコールメチルエチルエーテルなどのジエチレングリコール類;γ−ブチロラクトン、γ−バレロラクトン、γ−カプロラクトン、γ−カプリロラクトンなどの飽和γ−ラクトン類;トリクロロエチレンなどのハロゲン化炭化水素類;トルエン、キシレンなどの芳香族炭化水素類;ジメチルアセトアミド、ジメチルホルムアミド、N−メチルアセトアミドなどの極性溶媒などが挙げられる。これらの溶剤は、単独でも2種以上を組み合わせて用いてもよい。溶剤の含有量は、脂環式オレフィン重合体(A)100重量部に対して、好ましくは10〜10000重量部、より好ましくは50〜5000重量部、さらに好ましくは100〜1000重量部の範囲である。なお、感放射線樹脂組成物に溶剤を含有させる場合には、溶剤は、通常、樹脂膜形成後に除去されることとなる。
ポリオキシアルキレン系界面活性剤としては、例えば、ポリオキシエチレンラウリルエーテル、ポリオキシエチレンステアリルエーテル、ポリオキシエチレンオレイルエーテル、ポリオキシエチレンオクチルフェニルエーテル、ポリオキシエチレンノニルフェニルエーテル等のポリオキシエチレンアルキルエーテル類、ポリエチレングリコールジラウレート、ポリエチレングリコールジステアレートポリオキシエチレンジアルキルエステル類などを挙げることができる。
これらの界面活性剤は、それぞれ単独でまたは2種以上を組み合わせて用いることができる。
これらの酸性基又は熱潜在性酸性基を有する化合物は、それぞれ単独で又は2種以上を組み合わせて用いることができる。酸性基又は熱潜在性酸性基を有する化合物を配合することにより、本発明の感放射線樹脂組成物を用いて得られる樹脂膜の焼成後の形状保持性をより高めることができる。
酸性基としては、酸性の官能基であればよく、その具体例としては、スルホン酸基、リン酸基等の強酸性基;カルボキシ基、チオール基およびカルボキシメチレンチオ基等の弱酸性基;が挙げられる。これらの中でも、カルボキシ基、チオール基またはカルボキシメチレンチオ基が好ましく、カルボキシ基が特に好ましい。また、これらの酸性基の中でも、酸解離定数pKaが3.5以上5.0以下の範囲にあるものが好ましい。なお、酸性基が2つ以上ある場合は第一解離定数pKa1を酸解離定数とし、第一解離定数pKa1が上記範囲にあるものが好ましい。また、pKaは、希薄水溶液条件下で、酸解離定数Ka=[H3O+][B−]/[BH]を測定し、pKa=−logKaにしたがって、求められる。ここでBHは、有機酸を表し、B−は有機酸の共役塩基を表す。なお、pKaの測定方法は、例えばpHメータを用いて水素イオン濃度を測定し、該当物質の濃度と水素イオン濃度から算出することができる。
このような置換基としては、アルキル基、アリール基等の炭化水素基のほか、ハロゲン原子;アルコキシ基、アリールオキシ基、アシルオキシ基、ヘテロ環オキシ基;アルキル基又はアリール基又は複素環基で置換されたアミノ基、アシルアミノ基、ウレイド基、スルファモイルアミノ基、アルコキシカルボニルアミノ基、アリールオキシカルボニルアミノ基;アルキルチオ基、アリールチオ基、ヘテロ環チオ基;等のプロトンを有しない極性基、これらのプロトンを有しない極性基で置換された炭化水素基、等を挙げることができる。
これらの中でも、得られる硬化膜の密着性をより高めることができるという観点から、酸性基の数は、2つ以上であることが好ましい。
芳香族アミンとしては、例えば、アニリン、ベンジルアミン、N ,N−ジメチルアニリン、ジフェニルアミンなどが挙げられる。
複素環式アミンとしては、例えば、ピリジン、2−メチルピリジン、4−メチルピリジン、2−エチルピリジン、4−エチルピリジン、2−フェニルピリジン、4−フェニルピリジン、N−メチル−4−フェニルピリジン、4−ジメチルアミノピリジン、イミダゾール、ベンズイミダゾール、4−メチルイミダゾール、2−フェニルベンズイミダゾール、2,4,5−トリフェニルイミダゾール、ニコチン、ニコチン酸、ニコチン酸アミド、キノリン、8−オキシキノリン、ピラジン、ピラゾール、ピリダジン、プリン、ピロリジン、ピペリジン、ピペラジン、モルホリン、4−メチルモルホリン、1,5−ジアザビシクロ[4.3.0]−5−ノネン、1,8−ジアザビシクロ[5.3.0]−7−ウンデセンなどが挙げられる。
第四級アンモニウムヒドロキシドとしては、例えば、テトラメチルアンモニウムヒドロキシド、テトラエチルアンモニウムヒドロキシド、テトラ−n−ブチルアンモニウムヒドロキシド、テトラ−n−ヘキシルアンモニウムヒドロキシドなどが挙げられる。
これらの塩基性化合物は、それぞれ単独でまたは2種以上を組み合わせて用いることができる。
混合の方法は特に限定されないが、感放射線樹脂組成物を構成する各成分を溶剤に溶解又は分散して得られる溶液又は分散液を混合するのが好ましい。これにより、感放射線樹脂組成物は、溶液又は分散液の形態で得られる。
次いで、本発明の電子部品について、説明する。本発明の電子部品は、上述した本発明の感放射線樹脂組成物からなる樹脂膜を有する。
潜像パターンを有する樹脂膜に現像液を接触させる方法としては、例えば、パドル法、スプレー法、ディッピング法等の方法が用いられる。現像は、通常、0〜100℃、好ましくは5〜55℃、より好ましくは10〜30℃の範囲で、通常、30〜180秒間の範囲で適宜選択される。
さらに、必要に応じて、現像後に樹脂膜を加熱してもよい。加熱方法としては、例えば、電子部品をホットプレートやオーブン内で加熱する方法が挙げられる。温度は、通常、100〜300℃、好ましくは120〜200℃の範囲である。
なお、本発明の電子部品においては、電子部品の種類によっては、このようにしてパターン化された樹脂膜を形成した後に、さらに別の構成要素(たとえば、金属配線パターンや、ITO電極、配向膜など)の焼き固めを行うために、大気中などの酸化雰囲気における焼成が行われる。この際における焼成温度は、通常、150〜350℃、好ましくは180〜300℃、より好ましくは200〜250℃である。なお、この際においては、本発明の感放射線樹脂組成物を用いて得られたパターン化された樹脂膜も、同様に、酸化雰囲気で焼成されることとなる。しかしその一方で、このようにして形成される樹脂膜は、上述した本発明の感放射線樹脂組成物を用いて得られるものであるため、このように酸化性雰囲気で焼成した後も高い透明性を実現できるものであり、そのため、その後に、別の構成要素(たとえば、金属配線パターンや、ITO電極、配向膜など)の形成が必要となる電子部品用途、具体的には、LED(発光ダイオード)素子、MEMSミラーデバイス、アクティブマトリックス基板、有機EL素子基板などの各種電子部品用途に好適である。また、これに加えて、本発明の感放射線樹脂組成物を用いて得られる樹脂膜は、露光感度が高いものであるため、製造時における放射線の照射量を低減することができ、これにより生産性を向上せることができる。さらには、本発明の感放射線樹脂組成物を用いて得られる樹脂膜は、金属に対する耐食性に優れるものであるため、微細な金属配線パターンを、高精度、かつ、高い信頼性で形成することができ、これにより、電子部品の小型・高性能化に資することもできる。
なお、各特性の定義および評価方法は、以下のとおりである。
シリコンウェハ基板上に、感放射線性樹脂組成物をスピンコート法により塗布し、ホットプレートを用いて90℃で2分間加熱乾燥(プリベーク)して、膜厚2μmの樹脂膜を形成した。次いで、樹脂膜をパターニングするために、ステップタブレットマスクを介して、PLA501F(キャノン社製)を用いて、0mJ/cm2から500mJ/cm2まで10mJ/cm2毎に露光量を変化させることにより、露光工程を行った。次いで、ホットプレートを用いて130℃で1分間加熱し、0.4重量%テトラメチルアンモニウムヒドロキシド水溶液を用いて、25℃で100秒間現像処理を行ったのち、超純水で30秒間リンスすることにより、露光量の異なる露光パターンを有する樹脂膜と、シリコンウェハ基板とからなる積層体を得た。
そして、現像後の膜厚が塗布後の膜厚の95%以上となる露光量を算出し、これを露光感度とし求めた。この露光量が低いほど、低いエネルギーで、又は短い時間でパターンを形成することができるため、好ましい。
ガラス基板(コーニング社、製品名コーニング1737)上に、感放射線性樹脂組成物をスピンコート法により塗布し、ホットプレートを用いて90℃で2分間加熱乾燥(プリベーク)して、膜厚2μmの樹脂膜を形成した。次いで、この樹脂膜について、上記露光感度の評価にて求めた露光量にて空気中にて露光工程を行った。次いで、ホットプレートを用いて130℃で1分間加熱し、0.4重量%テトラメチルアンモニウムヒドロキシド水溶液を用いて、25℃で100秒間浸漬処理を行ったのち、超純水で30秒間洗浄を行った。次いで、オーブンを用いて、大気雰囲気下、230℃で30分間加熱する酸化性雰囲気下でのポストベークを行うことで、樹脂膜が形成されたガラス基板からなる試験用試料を得た。そして、このようにして得られた酸化性雰囲気下でのベークを行った試験用試料について、分光光度計V−560(日本分光社製)を用いて400nmから700nmの波長で測定を行い、400nmの波長での測定結果を用いて、樹脂膜の光線透過率を求めた。なお、樹脂膜の光線透過率は、樹脂膜が付いていないガラス基板をブランクとして、樹脂膜の厚みを2μmとした場合の換算値で算出した。
ガラス基板(コーニング社、製品名コーニング1737)上に、スパッタ装置を用いて膜厚100nmのアルミニウム薄膜を形成した。次いで、フォトレジストを用いてアルミニウム薄膜のパターニングを行い、Al配線幅10μm、配線間距離10μmの櫛型電極基板を作製した。櫛型電極基板上に感放射線性樹脂組成物をスピンコート法により塗布し、ホットプレートを用いて90℃で2分間加熱乾燥(プリベーク)して、膜厚2μmの樹脂膜を形成した。次いで、上記露光感度の評価にて求めた露光量にて空気中にて露光工程を行った。次いで、ホットプレートを用いて130℃で1分間加熱した。さらに、この樹脂膜について、0.4重量%テトラメチルアンモニウムヒドロキシド水溶液を用いて、25℃で100秒間浸漬処理を行ったのち、超純水で30秒間洗浄を行った。次いで、オーブンを用いて、大気雰囲気下、230℃で30分間加熱するポストベークを行うことで、樹脂膜が形成された耐金属腐食性試験用試料を得た。そして、得られたた耐金属腐食性試験用試料を、15Vの電圧を印加した状態で温度60℃、湿度90%の恒温恒湿槽に入れ、100時間後、200時間後にそれぞれ試料を取り出し光学顕微鏡によって試料を観察し、以下の基準で、耐金属腐食性の評価を行った。
A:恒温恒湿槽投入200時間後まで、アルミニウム配線に変化は無かった。
B:恒温恒湿槽投入100時間後までは、アルミニウム配線に変化は無かったが、200時間後には、アルミニウム配線に腐食が確認された。
C:恒温恒湿槽投入100時間後に、アルミニウム配線に腐食が確認された。
<酸性基を有する脂環式オレフィン重合体(A−1)の調製>
N−フェニルビシクロ[2.2.1]ヘプト−5−エン−2,3−ジカルボキシイミド(NBPI)40モル%、および4−ヒドロキシカルボニルテトラシクロ[6.2.1.13,6.02,7]ドデカ−9−エン(TCDC)60モル%からなる単量体混合物100部、1,5−ヘキサジエン2.8部、(1,3−ジメシチルイミダゾリン−2−イリデン)(トリシクロヘキシルホスフィン)ベンジリデンルテニウムジクロリド(Org.Lett.,第1巻,953頁,1999年 に記載された方法で合成した)0.02部、およびジエチレングリコールエチルメチルエーテル200部を、窒素置換したガラス製耐圧反応器に仕込み、攪拌しつつ80℃にて4時間反応させて重合反応液を得た。
合成例1で得られた脂環式オレフィン重合体(A−1)の重合体溶液290.7部(脂環式オレフィン重合体(A−1)として100部)、スルホニウム塩系光酸発生剤(B)として、4−(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェート(商品名「CPI−210S」、サンアプロ社製、下記式(4)で示す化合物)1部、架橋剤(C)として、3,4−エポキシシクロヘキセニルメチル−3’,4’−エポキシシクロヘキセンカルボキシレート(商品名「セロキサイド2021P」、ダイセル化学工業社製)80部、酸化防止剤(D)として、ペンタエリスリトール−テトラキス[3−(3,5−ジ−tert−ブチル−4−ヒドロキシフェニル)プロピオナート](商品名「Irganox1010」、BASF社製)6部、および、溶剤として、エチレングリコールジメチルエーテル200部を混合し、溶解させた後、孔径0.45μmのポリテトラフルオロエチレン製フィルターでろ過して感放射線樹脂組成物を調製した。
スルホニウム塩系光酸発生剤(B)としての4−(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェートの配合量を1部から、5部に変更した以外は、実施例1と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
スルホニウム塩系光酸発生剤(B)としての4−(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェートの配合量を1部から、10部に変更した以外は、実施例1と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
酸化防止剤(D)としてのペンタエリスリトール−テトラキス[3−(3,5−ジ−tert−ブチル−4−ヒドロキシフェニル)プロピオナート]を配合しなかった以外は、実施例2と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
架橋剤(C)として、3,4−エポキシシクロヘキセニルメチル−3’,4’−エポキシシクロヘキセンカルボキシレート80部の代わりに、エポキシ化ブタンテトラカルボン酸テトラキス(3−シクロヘキセニルメチル)修飾ε−カプロラクトン(脂肪族環状4官能性のエポキシ樹脂、商品名「エポリードGT401」、ダイセル化学工業社製)80部を使用した以外は、実施例2と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
架橋剤(C)として、3,4−エポキシシクロヘキセニルメチル−3’,4’−エポキシシクロヘキセンカルボキシレート80部の代わりに、3−エチル−3{[(3−エチルオキセタン−3−イル)メトキシ]メチル}オキセタン(商品名「アロンオキセタン OXT−221」、東亞合成社製)80部を使用した以外は、実施例2と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
架橋剤(C)としての3,4−エポキシシクロヘキセニルメチル−3’,4’−エポキシシクロヘキセンカルボキシレートの配合量を80部から、10部に変更し、かつ、架橋剤(C)として、3−エチル−3{[(3−エチルオキセタン−3−イル)メトキシ]メチル}オキセタン(商品名「アロンオキセタン OXT−221」、東亞合成社製)70部をさらに配合した以外は、実施例2と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
スルホニウム塩系光酸発生剤(B)としての4−(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェート5部の代わりに、4−(フェニルチオ)フェニルジフェニルスルホニウムヘキサフルオロホスフェート(商品名「CPI−100P」、サンアプロ社製)5部を使用した以外は、実施例2と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
スルホニウム塩系光酸発生剤(B)としての4−(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェート5部の代わりに、トリルクミルヨードニウムテトラキス(ペンタフルオロフェニル)ボレート(商品名「ロードシルフォトイニシエーター 2074」、ローディア社製)5部を使用した以外は、実施例2と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
スルホニウム塩系光酸発生剤(B)としての4−(フェニルチオ)フェニルジフェニルスルホニウムトリス(ペンタフルオロエチル)トリフルオロホスフェート5部の代わりに、4−(2−クロロ−4−ベンゾイルフェニルチオ)フェニルビス(4−フルオロフェニル)スルホニウムヘキサフルオロアンチモネート)(商品名「アデカオプトマー SP−172」、ADEKA社製)5部を使用した以外は、実施例2と同様にして、感放射線樹脂組成物を得て、同様に評価を行った。結果を表1に示す。
また、光酸発生剤として、芳香族ヨードニウム錯塩系の化合物を用いた場合には、得られる樹脂膜は、耐熱透明性に劣るものであった(比較例2)。
Claims (10)
- 前記一般式(1)中、R1、R2、R3は、炭素数6〜30のアリール基である請求項1に記載の感放射線樹脂組成物。
- 前記一般式(1)中、R1、R2、R3は、フェニル基である請求項2に記載の感放射線樹脂組成物。
- 前記一般式(1)中、aは、3である請求項1〜3のいずれかに記載の感放射線樹脂組成物。
- 酸化防止剤(D)をさらに含有する請求項1〜4のいずれかに記載の感放射線樹脂組成物。
- 前記酸性基を有する脂環式オレフィン重合体(A)100重量部に対する、前記スルホニウム塩系光酸発生剤(B)の含有割合が、1〜15重量部である請求項1〜5のいずれかに記載の感放射線樹脂組成物。
- 前記架橋剤(C)が、エポキシ基を2つ以上有する化合物である請求項1〜6のいずれかに記載の感放射線樹脂組成物。
- 前記架橋剤(C)が、オキセタニル基を2以上有する化合物である請求項1〜7のいずれかに記載の感放射線樹脂組成物。
- 前記架橋剤(C)が、エポキシ基を2つ以上有する化合物およびオキセタニル基を2以上有する化合物である請求項7または8に記載の感放射線樹脂組成物。
- 請求項1〜9のいずれかに記載の感放射線樹脂組成物の硬化物からなる樹脂膜を備える電子部品。
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