JP6449541B2 - プラズマ質量分析装置用イオン光学システム - Google Patents

プラズマ質量分析装置用イオン光学システム Download PDF

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Publication number
JP6449541B2
JP6449541B2 JP2013273544A JP2013273544A JP6449541B2 JP 6449541 B2 JP6449541 B2 JP 6449541B2 JP 2013273544 A JP2013273544 A JP 2013273544A JP 2013273544 A JP2013273544 A JP 2013273544A JP 6449541 B2 JP6449541 B2 JP 6449541B2
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ion
electrode
axis
ions
mass
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Japanese (ja)
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JP2015128032A5 (enExample
JP2015128032A (ja
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一司 平野
一司 平野
北本　淳
淳 北本
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Agilent Technologies Inc
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Agilent Technologies Inc
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Priority to JP2013273544A priority Critical patent/JP6449541B2/ja
Priority to US14/571,858 priority patent/US9418826B2/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
JP2013273544A 2013-12-27 2013-12-27 プラズマ質量分析装置用イオン光学システム Active JP6449541B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013273544A JP6449541B2 (ja) 2013-12-27 2013-12-27 プラズマ質量分析装置用イオン光学システム
US14/571,858 US9418826B2 (en) 2013-12-27 2014-12-16 Ion optical system for mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013273544A JP6449541B2 (ja) 2013-12-27 2013-12-27 プラズマ質量分析装置用イオン光学システム

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JP2015128032A JP2015128032A (ja) 2015-07-09
JP2015128032A5 JP2015128032A5 (enExample) 2017-01-26
JP6449541B2 true JP6449541B2 (ja) 2019-01-09

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US (1) US9418826B2 (enExample)
JP (1) JP6449541B2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3598477B1 (en) 2014-05-01 2020-12-30 PerkinElmer Health Sciences, Inc. Methods for detection and quantification of silicon in samples
GB2544959B (en) * 2015-09-17 2019-06-05 Thermo Fisher Scient Bremen Gmbh Mass spectrometer
JP6664206B2 (ja) * 2015-12-11 2020-03-13 株式会社堀場エステック 四重極型質量分析計及び残留ガス分析方法
CN109716484B (zh) * 2016-09-21 2021-02-09 株式会社岛津制作所 质谱分析装置
JP6808669B2 (ja) * 2018-03-14 2021-01-06 日本電子株式会社 質量分析装置
CN108630517B (zh) * 2018-05-10 2024-01-23 中国科学院大气物理研究所 大气颗粒物的等离子体电离方法和装置
CN112750677A (zh) * 2020-12-31 2021-05-04 杭州谱育科技发展有限公司 具有粒子消除功能的电感耦合等离子体质谱仪
CN112863997B (zh) * 2020-12-31 2024-06-11 杭州谱育科技发展有限公司 具有粒子消除功能的icp-ms
CN113078041A (zh) * 2021-04-22 2021-07-06 北京衡昇仪器有限公司 双90度偏转四级杆等离子体质谱仪
WO2023091999A1 (en) * 2021-11-22 2023-05-25 Perkinelmer Health Sciences, Inc. Deflectors for ion beams and mass spectrometry systems comprising the same
CN114944323B (zh) * 2022-06-29 2025-08-29 广州禾信仪器股份有限公司 离子偏转装置与质谱仪

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0316206Y2 (enExample) * 1985-09-24 1991-04-08
GB9219457D0 (en) * 1992-09-15 1992-10-28 Fisons Plc Reducing interferences in plasma source mass spectrometers
JP3188794B2 (ja) * 1993-09-10 2001-07-16 セイコーインスツルメンツ株式会社 プラズマイオン源質量分析装置
JP3189652B2 (ja) * 1995-12-01 2001-07-16 株式会社日立製作所 質量分析装置
JP3648906B2 (ja) * 1997-02-14 2005-05-18 株式会社日立製作所 イオントラップ質量分析計を用いた分析装置
JP3052929B2 (ja) * 1998-04-24 2000-06-19 株式会社日立製作所 質量分析装置
JP4577991B2 (ja) 1998-09-23 2010-11-10 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． マススペクトロメータのためのイオン光学系
JP3650551B2 (ja) * 1999-09-14 2005-05-18 株式会社日立製作所 質量分析計
AUPR465101A0 (en) 2001-04-27 2001-05-24 Varian Australia Pty Ltd "Mass spectrometer"
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
JP5469823B2 (ja) * 2008-04-25 2014-04-16 アジレント・テクノロジーズ・インク プラズマイオン源質量分析装置
EP2539915A4 (en) * 2010-02-26 2016-08-10 Perkinelmer Health Sci Inc PLASMASSASS SPECTROMETRY WITH ION SUPPRESSION

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US9418826B2 (en) 2016-08-16
US20150187555A1 (en) 2015-07-02
JP2015128032A (ja) 2015-07-09

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