JP2015128032A5 - - Google Patents

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Publication number
JP2015128032A5
JP2015128032A5 JP2013273544A JP2013273544A JP2015128032A5 JP 2015128032 A5 JP2015128032 A5 JP 2015128032A5 JP 2013273544 A JP2013273544 A JP 2013273544A JP 2013273544 A JP2013273544 A JP 2013273544A JP 2015128032 A5 JP2015128032 A5 JP 2015128032A5
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JP
Japan
Prior art keywords
mass spectrometer
electrode
axis
ions
spectrometer according
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JP2013273544A
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English (en)
Japanese (ja)
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JP2015128032A (ja
JP6449541B2 (ja
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Priority to JP2013273544A priority Critical patent/JP6449541B2/ja
Priority claimed from JP2013273544A external-priority patent/JP6449541B2/ja
Priority to US14/571,858 priority patent/US9418826B2/en
Publication of JP2015128032A publication Critical patent/JP2015128032A/ja
Publication of JP2015128032A5 publication Critical patent/JP2015128032A5/ja
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JP2013273544A 2013-12-27 2013-12-27 プラズマ質量分析装置用イオン光学システム Active JP6449541B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013273544A JP6449541B2 (ja) 2013-12-27 2013-12-27 プラズマ質量分析装置用イオン光学システム
US14/571,858 US9418826B2 (en) 2013-12-27 2014-12-16 Ion optical system for mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013273544A JP6449541B2 (ja) 2013-12-27 2013-12-27 プラズマ質量分析装置用イオン光学システム

Publications (3)

Publication Number Publication Date
JP2015128032A JP2015128032A (ja) 2015-07-09
JP2015128032A5 true JP2015128032A5 (enExample) 2017-01-26
JP6449541B2 JP6449541B2 (ja) 2019-01-09

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JP2013273544A Active JP6449541B2 (ja) 2013-12-27 2013-12-27 プラズマ質量分析装置用イオン光学システム

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US (1) US9418826B2 (enExample)
JP (1) JP6449541B2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3138117B1 (en) * 2014-05-01 2019-11-13 PerkinElmer Health Sciences, Inc. Methods for detection and quantification of selenium and silicon in samples
GB2544959B (en) * 2015-09-17 2019-06-05 Thermo Fisher Scient Bremen Gmbh Mass spectrometer
JP6664206B2 (ja) * 2015-12-11 2020-03-13 株式会社堀場エステック 四重極型質量分析計及び残留ガス分析方法
CN109716484B (zh) * 2016-09-21 2021-02-09 株式会社岛津制作所 质谱分析装置
JP6808669B2 (ja) * 2018-03-14 2021-01-06 日本電子株式会社 質量分析装置
CN108630517B (zh) * 2018-05-10 2024-01-23 中国科学院大气物理研究所 大气颗粒物的等离子体电离方法和装置
CN112863997B (zh) * 2020-12-31 2024-06-11 杭州谱育科技发展有限公司 具有粒子消除功能的icp-ms
CN112750677A (zh) * 2020-12-31 2021-05-04 杭州谱育科技发展有限公司 具有粒子消除功能的电感耦合等离子体质谱仪
CN113078041A (zh) * 2021-04-22 2021-07-06 北京衡昇仪器有限公司 双90度偏转四级杆等离子体质谱仪
WO2023091999A1 (en) * 2021-11-22 2023-05-25 Perkinelmer Health Sciences, Inc. Deflectors for ion beams and mass spectrometry systems comprising the same
CN114944323B (zh) * 2022-06-29 2025-08-29 广州禾信仪器股份有限公司 离子偏转装置与质谱仪

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0316206Y2 (enExample) * 1985-09-24 1991-04-08
GB9219457D0 (en) * 1992-09-15 1992-10-28 Fisons Plc Reducing interferences in plasma source mass spectrometers
JP3188794B2 (ja) * 1993-09-10 2001-07-16 セイコーインスツルメンツ株式会社 プラズマイオン源質量分析装置
JP3189652B2 (ja) * 1995-12-01 2001-07-16 株式会社日立製作所 質量分析装置
JP3648906B2 (ja) * 1997-02-14 2005-05-18 株式会社日立製作所 イオントラップ質量分析計を用いた分析装置
JP3052929B2 (ja) * 1998-04-24 2000-06-19 株式会社日立製作所 質量分析装置
US6614021B1 (en) 1998-09-23 2003-09-02 Varian Australian Pty Ltd Ion optical system for a mass spectrometer
JP3650551B2 (ja) * 1999-09-14 2005-05-18 株式会社日立製作所 質量分析計
AUPR465101A0 (en) 2001-04-27 2001-05-24 Varian Australia Pty Ltd "Mass spectrometer"
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
JP5469823B2 (ja) * 2008-04-25 2014-04-16 アジレント・テクノロジーズ・インク プラズマイオン源質量分析装置
SG183179A1 (en) * 2010-02-26 2012-09-27 Perkinelmer Health Sci Inc Plasma mass spectrometry with ion suppression

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