JP6431123B2 - アナログ信号検出回路 - Google Patents
アナログ信号検出回路 Download PDFInfo
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- JP6431123B2 JP6431123B2 JP2017079517A JP2017079517A JP6431123B2 JP 6431123 B2 JP6431123 B2 JP 6431123B2 JP 2017079517 A JP2017079517 A JP 2017079517A JP 2017079517 A JP2017079517 A JP 2017079517A JP 6431123 B2 JP6431123 B2 JP 6431123B2
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- analog signal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/10—Measuring sum, difference or ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/30—Measuring the maximum or the minimum value of current or voltage reached in a time interval
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/06—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/15—Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements (indicating that pulse width is above or below a certain limit)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
- H02H3/16—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to fault current to earth, frame or mass
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Nonlinear Science (AREA)
- Measurement Of Current Or Voltage (AREA)
- Breakers (AREA)
- Emergency Protection Circuit Devices (AREA)
Description
3a トリップ機構
3b 開閉機構
200 アナログ信号検出回路
210 最小値検出回路部
220 最大値検出回路部
230 基準電圧発生器
240 比較器
250 パルス発生器
260 コンバイナ回路部
270 平均回路部
280 信号処理器
290 判断回路部
Claims (8)
- 入力されるアナログ信号の最小電圧値と最大電圧値との間の電圧幅に応じて数が変化する複数の基準電圧を発生して出力する基準電圧発生器と、
前記アナログ信号の電圧と前記基準電圧発生器から出力される各基準電圧とをそれぞれ比較する複数の比較器と、
前記アナログ信号の周波数に応じて変化するパルス間隔を有する複数のパルス信号を発生して出力する複数のパルス発生器と、
前記複数のパルス発生器からのパルス信号を合わせて出力するコンバイナ回路部と、
前記アナログ信号の最小電圧値を検出して前記基準電圧発生器に供給する最小値検出回路部と、
前記アナログ信号の最大電圧値を検出して前記基準電圧発生器に供給する最大値検出回路部と、を含む、アナログ信号検出回路。 - 前記パルス発生器は、
対応する前記比較器の出力信号を時間遅延させて出力する遅延回路部と、
対応する前記比較器の出力信号を受信する第1入力端及び前記遅延回路部から出力される遅延出力信号を受信する第2入力端を有し、対応する前記比較器の出力信号の論理値と前記遅延回路部の遅延出力信号の論理値とが異なる場合にパルス信号を発生する排他的論理和回路部とを含む、請求項1に記載のアナログ信号検出回路。 - 前記コンバイナ回路部に接続され、前記コンバイナ回路部から出力されるパルス信号の平均値を出力する平均回路部をさらに含む、請求項1に記載のアナログ信号検出回路。
- 前記平均回路部から出力される平均値と予め設定された漏電遮断器のトリップ基準値とを比較し、トリップ制御信号を出力するか否かを決定する判断回路部をさらに含む、請求項3に記載のアナログ信号検出回路。
- 前記平均回路部と前記判断回路部との間に設けられ、前記平均回路部から出力される平均値を所定時間遅延させて前記判断回路部に出力する遅延回路部をさらに含む、請求項4に記載のアナログ信号検出回路。
- 前記コンバイナ回路部から出力されるパルス信号に基づいて、パルス信号の数をカウントして時間で除算することでアナログ信号の周波数を算出したり、パルス信号の数に所定の比例係数を乗算してアナログ信号の大きさを算出する信号処理器をさらに含む、請求項1に記載のアナログ信号検出回路。
- 前記基準電圧発生器は、入力されるアナログ信号の最小電圧値と最大電圧値との間の電圧幅に比例する数の基準電圧を発生するように構成される、請求項1に記載のアナログ信号検出回路。
- 前記複数のパルス発生器は、前記アナログ信号の周波数が低いほど、パルス間隔の広い複数のパルス信号を発生する、請求項1に記載のアナログ信号検出回路。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020160047193A KR102452352B1 (ko) | 2016-04-18 | 2016-04-18 | 아날로그 신호 검출회로 |
KR10-2016-0047193 | 2016-04-18 |
Publications (2)
Publication Number | Publication Date |
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JP2017194462A JP2017194462A (ja) | 2017-10-26 |
JP6431123B2 true JP6431123B2 (ja) | 2018-11-28 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2017079517A Active JP6431123B2 (ja) | 2016-04-18 | 2017-04-13 | アナログ信号検出回路 |
Country Status (6)
Country | Link |
---|---|
US (1) | US10466279B2 (ja) |
EP (1) | EP3236273B1 (ja) |
JP (1) | JP6431123B2 (ja) |
KR (1) | KR102452352B1 (ja) |
CN (1) | CN107305231B (ja) |
ES (1) | ES2693604T3 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108919079B (zh) * | 2018-04-03 | 2019-11-15 | 华南理工大学 | 一种cmos反相器电磁抗扰度的监测方法 |
US11211891B2 (en) * | 2018-06-15 | 2021-12-28 | Panasonic Intellectual Property Management Co., Ltd. | Motor control device |
CN111221278A (zh) * | 2018-11-26 | 2020-06-02 | 湖南中车时代电动汽车股份有限公司 | 一种模拟信号采样电路及方法 |
CN110967572A (zh) * | 2019-09-04 | 2020-04-07 | 南京理工大学 | 一种车载脉冲功率源电压电流故障快速检测装置 |
CN111736008A (zh) * | 2020-07-02 | 2020-10-02 | 中国电子科技集团公司第二十四研究所 | 一种双极性输入信号检测电路 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS532742B2 (ja) | 1973-10-31 | 1978-01-31 | ||
JPS5932734B2 (ja) | 1975-01-21 | 1984-08-10 | 株式会社横河電機製作所 | 高精度電圧測定装置 |
US4069452A (en) | 1976-09-15 | 1978-01-17 | Dana Laboratories, Inc. | Apparatus for automatically detecting values of periodically time varying signals |
JPS53143377A (en) | 1977-05-20 | 1978-12-13 | Nippon Chemical Ind | Indication circuit |
GB1604323A (en) * | 1977-05-20 | 1981-12-09 | Nippon Kogaku Kk | Display circuit |
GB8811094D0 (en) * | 1988-05-11 | 1988-06-15 | Reed Packaging Ltd | Container |
JP2774377B2 (ja) | 1990-11-28 | 1998-07-09 | 協栄産業株式会社 | 地絡検出装置 |
JPH06216724A (ja) | 1993-01-20 | 1994-08-05 | Mitsubishi Electric Corp | コンパレータ装置及びそのクロック供給制御装置 |
JP3114837B2 (ja) | 1994-02-10 | 2000-12-04 | 株式会社富士通ゼネラル | A/d変換装置 |
JP3216762B2 (ja) | 1994-10-11 | 2001-10-09 | 富士電機株式会社 | 回路遮断器の欠相保護回路 |
JPH1042451A (ja) | 1996-07-24 | 1998-02-13 | Aiphone Co Ltd | 電源供給装置 |
US6442378B1 (en) * | 1998-07-15 | 2002-08-27 | Avaya Technology Corp | Power level determination device in an RF booster for wireless communications |
CN1294419C (zh) * | 2003-08-08 | 2007-01-10 | 广达电脑股份有限公司 | 模拟信号测量装置及方法 |
KR100587969B1 (ko) | 2004-04-20 | 2006-06-08 | 매그나칩 반도체 유한회사 | 플래쉬 아날로그 디지털 컨버터 |
JP4810840B2 (ja) * | 2005-03-02 | 2011-11-09 | セイコーエプソン株式会社 | 基準電圧発生回路、表示ドライバ、電気光学装置及び電子機器 |
KR100892250B1 (ko) * | 2007-08-22 | 2009-04-09 | 한국과학기술원 | 디스플레이 구동 장치 |
JP5090849B2 (ja) | 2007-10-23 | 2012-12-05 | ローム株式会社 | 過電圧保護回路およびそれを用いた電子機器 |
US20090168583A1 (en) * | 2007-12-26 | 2009-07-02 | Hynix Semiconductor Inc. | Internal voltage generator of semiconductor memory device |
CN101441230B (zh) * | 2008-12-18 | 2012-05-30 | 华为技术有限公司 | 实现电压检测的方法及装置 |
KR101068718B1 (ko) * | 2009-05-21 | 2011-09-28 | 엘에스산전 주식회사 | 회로차단기용 이상전류 검출회로 |
CN101930245A (zh) * | 2009-10-10 | 2010-12-29 | 曹先国 | 精确参考电压产生器 |
JP5470544B2 (ja) | 2010-06-28 | 2014-04-16 | 株式会社島津製作所 | 放電イオン化電流検出器 |
CN102565514A (zh) * | 2010-12-14 | 2012-07-11 | 鸿富锦精密工业(深圳)有限公司 | 电压降侦测电路 |
US8760824B2 (en) * | 2011-03-04 | 2014-06-24 | Fairchild Semiconductor Corporation | Ground fault circuit interrupter (GFCI) monitor |
KR101774245B1 (ko) * | 2013-02-18 | 2017-09-19 | 엘에스산전 주식회사 | Rms 검출기 및 이를 적용한 차단기 |
KR101444582B1 (ko) * | 2013-02-19 | 2014-09-24 | 삼성전기주식회사 | 주파수 검출 장치 및 방법 |
KR101864624B1 (ko) * | 2014-07-11 | 2018-06-07 | 엘에스산전 주식회사 | 누전 차단기용 누전 결정 회로 |
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2016
- 2016-04-18 KR KR1020160047193A patent/KR102452352B1/ko active IP Right Grant
-
2017
- 2017-01-23 EP EP17152623.9A patent/EP3236273B1/en not_active Not-in-force
- 2017-01-23 ES ES17152623.9T patent/ES2693604T3/es active Active
- 2017-02-24 CN CN201710104601.0A patent/CN107305231B/zh active Active
- 2017-03-16 US US15/461,359 patent/US10466279B2/en active Active
- 2017-04-13 JP JP2017079517A patent/JP6431123B2/ja active Active
Also Published As
Publication number | Publication date |
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KR102452352B1 (ko) | 2022-10-07 |
CN107305231B (zh) | 2020-01-24 |
US10466279B2 (en) | 2019-11-05 |
EP3236273B1 (en) | 2018-09-05 |
JP2017194462A (ja) | 2017-10-26 |
EP3236273A1 (en) | 2017-10-25 |
ES2693604T3 (es) | 2018-12-12 |
CN107305231A (zh) | 2017-10-31 |
US20170299637A1 (en) | 2017-10-19 |
KR20170119248A (ko) | 2017-10-26 |
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