JP6367969B2 - 高いアスペクト比を有することが可能である感光要素を有する放射線検出器 - Google Patents

高いアスペクト比を有することが可能である感光要素を有する放射線検出器 Download PDF

Info

Publication number
JP6367969B2
JP6367969B2 JP2016562810A JP2016562810A JP6367969B2 JP 6367969 B2 JP6367969 B2 JP 6367969B2 JP 2016562810 A JP2016562810 A JP 2016562810A JP 2016562810 A JP2016562810 A JP 2016562810A JP 6367969 B2 JP6367969 B2 JP 6367969B2
Authority
JP
Japan
Prior art keywords
photosensitive
radiation detector
columns
photons
conversion material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2016562810A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017519186A5 (https=
JP2017519186A (ja
Inventor
マティアス サイモン
マティアス サイモン
フランク ヴェルバケル
フランク ヴェルバケル
ゲレオン フォークトマイヤー
ゲレオン フォークトマイヤー
ナオル ワイナー
ナオル ワイナー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of JP2017519186A publication Critical patent/JP2017519186A/ja
Publication of JP2017519186A5 publication Critical patent/JP2017519186A5/ja
Application granted granted Critical
Publication of JP6367969B2 publication Critical patent/JP6367969B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20181Stacked detectors, e.g. for measuring energy and positional information

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Nuclear Medicine (AREA)
  • Light Receiving Elements (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2016562810A 2014-04-17 2015-04-13 高いアスペクト比を有することが可能である感光要素を有する放射線検出器 Expired - Fee Related JP6367969B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14165094 2014-04-17
EP14165094.5 2014-04-17
PCT/EP2015/057935 WO2015158646A1 (en) 2014-04-17 2015-04-13 Radiation detector with photosensitive elements that can have high aspect ratios

Publications (3)

Publication Number Publication Date
JP2017519186A JP2017519186A (ja) 2017-07-13
JP2017519186A5 JP2017519186A5 (https=) 2018-01-25
JP6367969B2 true JP6367969B2 (ja) 2018-08-01

Family

ID=50488998

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016562810A Expired - Fee Related JP6367969B2 (ja) 2014-04-17 2015-04-13 高いアスペクト比を有することが可能である感光要素を有する放射線検出器

Country Status (5)

Country Link
US (1) US9841510B2 (https=)
EP (1) EP3132286B1 (https=)
JP (1) JP6367969B2 (https=)
CN (1) CN106461796B (https=)
WO (1) WO2015158646A1 (https=)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
KR102065318B1 (ko) 2012-02-03 2020-01-10 라피스캔 시스템스, 인코포레이티드 조합형 산란 및 투과 멀티-뷰 이미징 시스템
ES1154460Y (es) * 2012-02-14 2016-07-08 American Science & Eng Inc Dispositivo de portal de inspección por rayos X
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
JP6746603B2 (ja) 2015-03-20 2020-08-26 ラピスカン システムズ、インコーポレイテッド 手持ち式携帯型後方散乱検査システム
WO2017080728A1 (de) * 2015-11-11 2017-05-18 Siemens Healthcare Gmbh Detektorelement zur erfassung von einfallender röntgenstrahlung
WO2019036865A1 (en) * 2017-08-21 2019-02-28 Shenzhen United Imaging Healthcare Co., Ltd. METHOD AND APPARATUS FOR POSITRON EMISSION TOMOGRAPHY
CN112424644A (zh) 2018-06-20 2021-02-26 美国科学及工程股份有限公司 波长偏移片耦合的闪烁检测器
WO2020058566A1 (en) * 2018-09-19 2020-03-26 Sensinite Oy An apparatus for detecting radiation
EP3908670A4 (en) * 2019-01-08 2023-04-05 American Science & Engineering, Inc. SPECTRAL DISCRIMINATION USING FIBER COUPLED SCINTILLATION DETECTORS WITH WAVELENGTH SHIFTING
CN114026464B (zh) * 2019-06-17 2025-06-27 检测技术公司 辐射检测器和用于制造辐射检测器的方法
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
KR102567702B1 (ko) * 2021-06-30 2023-08-18 한국원자력연구원 방사선 검출소자 및 이의 제조방법
JP7641857B2 (ja) * 2021-08-23 2025-03-07 富士フイルム株式会社 放射線検出器
CN118235216A (zh) 2021-10-01 2024-06-21 拉皮斯坎控股公司 用于并发产生多个基本相似的x射线束的方法和系统
US12013503B2 (en) * 2022-10-07 2024-06-18 Cintilight, Llc Lateral crystal photodiode readouts and switched diode networks for processing nuclear events
US12449554B2 (en) 2023-10-05 2025-10-21 Cintilight, Llc Scintillator detectors and methods for positron emission tomography

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60187879A (ja) * 1984-03-07 1985-09-25 Matsushita Electric Ind Co Ltd 放射線検出器アレイ
JPH0627843B2 (ja) * 1985-10-17 1994-04-13 株式会社島津製作所 放射線アレイセンサ
JPH0627844B2 (ja) * 1987-05-14 1994-04-13 浜松ホトニクス株式会社 放射線位置検出器
US6175120B1 (en) * 1998-05-08 2001-01-16 The Regents Of The University Of Michigan High-resolution ionization detector and array of such detectors
JP2002107457A (ja) * 2000-10-02 2002-04-10 Canon Inc 蛍光体構造物及びそれを有する放射線撮像装置と放射線撮像システム
JP2003084066A (ja) * 2001-04-11 2003-03-19 Nippon Kessho Kogaku Kk 放射線検出器用部品、放射線検出器および放射線検出装置
US6921909B2 (en) * 2002-08-27 2005-07-26 Radiation Monitoring Devices, Inc. Pixellated micro-columnar films scintillator
JP2004150932A (ja) * 2002-10-30 2004-05-27 Toshiba Corp 放射線平面検出器
WO2004061478A1 (en) * 2003-01-06 2004-07-22 Koninklijke Philips Electronics N.V. Radiation detector with shielded electronics for computed tomography
US20040227091A1 (en) * 2003-05-14 2004-11-18 Leblanc James Walter Methods and apparatus for radiation detecting and imaging using monolithic detectors
US20050082491A1 (en) * 2003-10-15 2005-04-21 Seppi Edward J. Multi-energy radiation detector
JP2008514965A (ja) * 2004-09-30 2008-05-08 スタンフォード ユニバーシティ 半導体結晶高解像度撮像装置
DE102004049677B3 (de) * 2004-10-12 2006-06-14 Siemens Ag Detektoranordnung zur Verwendung in einem kombinierten Transmissions- / Emissions-Tomographiegerät
US7304309B2 (en) 2005-03-14 2007-12-04 Avraham Suhami Radiation detectors
US20060289777A1 (en) * 2005-06-29 2006-12-28 Wen Li Detector with electrically isolated pixels
US20070272872A1 (en) * 2006-05-24 2007-11-29 Bruker Axs, Inc. X-ray detector with photodetector embedded in scintillator
EP2069822A2 (en) * 2006-09-14 2009-06-17 Philips Intellectual Property & Standards GmbH Scintillator based x-ray sensitive integrated circuit element with depleted electron drift region
US7525170B2 (en) 2006-10-04 2009-04-28 International Business Machines Corporation Pillar P-i-n semiconductor diodes
US8581200B2 (en) * 2006-11-17 2013-11-12 Koninklijke Philips N.V. Radiation detector with multiple electrodes on a sensitive layer
JP5587788B2 (ja) * 2007-12-21 2014-09-10 コーニンクレッカ フィリップス エヌ ヴェ 複合樹脂におけるシンチレータを備えた放射線感受性検出器
TWI413243B (zh) 2007-12-26 2013-10-21 新加坡優尼山帝斯電子私人有限公司 固體攝像元件、固體攝像裝置及其製造方法
WO2009139936A2 (en) 2008-02-14 2009-11-19 California Institute Of Technology Single photon detection with self-quenching multiplication
KR20100075060A (ko) 2008-12-24 2010-07-02 주식회사 동부하이텍 이미지 센서 및 이미지 센서의 제조 방법
US8373132B2 (en) 2009-02-06 2013-02-12 Koninklijke Philips Electronics N. V. Radiation detector with a stack of scintillator elements and photodiode arrays
KR101325812B1 (ko) 2009-12-18 2013-11-08 도시바 덴시칸 디바이스 가부시키가이샤 방사선 검출기와 그 제조 방법
DE102012206180B4 (de) 2012-04-16 2014-06-26 Siemens Aktiengesellschaft Strahlungsdetektor, Verfahren zum Herstellen eines Strahlungsdetektors und Röntgengerät

Also Published As

Publication number Publication date
CN106461796B (zh) 2020-02-07
EP3132286B1 (en) 2019-04-03
WO2015158646A1 (en) 2015-10-22
US20170045630A1 (en) 2017-02-16
CN106461796A (zh) 2017-02-22
EP3132286A1 (en) 2017-02-22
US9841510B2 (en) 2017-12-12
JP2017519186A (ja) 2017-07-13

Similar Documents

Publication Publication Date Title
JP6367969B2 (ja) 高いアスペクト比を有することが可能である感光要素を有する放射線検出器
JP6876033B2 (ja) 量子ドットに基づくイメージング検出器
US9513387B2 (en) System and method for providing depth of interaction detection using positron emission tomography
US8399843B2 (en) Scintillation array method and apparatus
JP6339596B2 (ja) 陽電子放出断層撮影および/または単一光子放出断層撮影検出器
WO2016178933A1 (en) Apparatus and methods for depth-of-interaction positron tomography detector using dichotomous sensing
JP6134455B1 (ja) 放射粒子検出器におけるシンチレーションイベント位置特定
WO2010007669A1 (ja) Doi型放射線検出器
CN109073764A (zh) 在闪烁体表面上布置的光电传感器
US20190304616A1 (en) Analyzing grid for phase contrast imaging and/or dark-field imaging
JP2014510274A (ja) 不均一な隔壁を使用した撮像アレイ用のシステム、方法、及び装置
US11686864B2 (en) Scintillator array with high detective quantum efficiency
KR102316574B1 (ko) 컴프턴 영상 장치 및 이를 포함하는 단일 광자 및 양전자 단층 촬영 시스템
JP3950964B2 (ja) 強磁場内作動型放射線位置検出器
KR20150095115A (ko) 양전자방출 단층촬영장치용 검출기 모듈 및 이를 이용한 양전자방출 단층촬영장치
KR101526798B1 (ko) 양전자방출 단층촬영장치용 검출기 모듈 및 이를 이용한 양전자방출 단층촬영장치
de Vree et al. EMCCD-based photon-counting mini gamma camera with a spatial resolution< 100/spl mu/m

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20171205

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20171205

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20171205

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20180216

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20180219

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20180306

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180529

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20180606

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180705

R150 Certificate of patent or registration of utility model

Ref document number: 6367969

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees