JP6358351B1 - 表面欠陥検査方法及び表面欠陥検査装置 - Google Patents
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Abstract
【解決手段】本発明の一実施形態である表面欠陥検査装置1では、テクスチャ特徴画像生成部43が、入力画像に対して複数の空間フィルタによるフィルタ処理を施すことによって複数のテクスチャ特徴画像を生成し、テクスチャ特徴抽出部44が、入力画像上の各位置について複数のテクスチャ特徴画像の対応する位置の値を各々抽出して画像上の各位置における特徴ベクトルを生成し、異常度算出部45が、特徴ベクトルの各々について特徴ベクトルがなす多次元分布における異常度を算出して、入力画像上の各位置についての異常度を示した異常度画像を生成し、欠陥候補検出部46が、異常度画像において異常度が所定値を超える部分を欠陥部又は欠陥候補部として検出する。
【選択図】図1
Description
図1は、本発明の一実施形態である表面欠陥検査装置の構成を示す模式図である。図1に示すように、本発明の一実施形態である表面欠陥検査装置1は、照明装置2と、撮像装置3と、画像処理装置4と、表示装置5と、を備えている。
次に、図2〜図6を参照して、本発明の一実施形態である表面欠陥検査処理の流れについて詳細に説明する。
次に、図3を参照して、上記前処理(ステップS2)について説明する。
次に、図4〜図6を参照して、上記欠陥検出処理(ステップS3)について説明する。
次に、図9を参照して、上記欠陥判定処理(ステップS4)について説明する。
2 照明装置
3 撮像装置
4 画像処理装置
5 表示装置
41 画像入力部
42 画像補正部
43 テクスチャ特徴画像生成部
44 テクスチャ特徴抽出部
45 異常度算出部
46 欠陥候補検出部
47 欠陥特徴算出部
48 欠陥判定部
S 鋼帯
Claims (7)
- 検査対象を撮影して元画像を取得する画像入力ステップと、
前記元画像に対して複数の空間フィルタによるフィルタ処理を施すことにより複数のテクスチャ特徴画像を生成するテクスチャ特徴画像生成ステップと、
前記元画像上の各位置について前記複数のテクスチャ特徴画像の対応する位置の値を各々抽出して前記元画像上の各位置における特徴ベクトルを生成するテクスチャ特徴抽出ステップと、
前記特徴ベクトルの各々について前記特徴ベクトルがなす多次元分布における異常度を算出し、前記元画像上の各位置についての異常度を示した異常度画像を生成する異常度算出ステップと、
前記異常度画像において前記異常度が所定値を超える部分を欠陥部又は欠陥候補部として検出する検出ステップと、
を含むことを特徴とする表面欠陥検査方法。 - 前記テクスチャ特徴画像生成ステップは、前記空間フィルタによるフィルタ処理を、前記元画像を縮小した画像又は前記テクスチャ特徴画像を縮小した画像に対しても施すことにより、別のテクスチャ特徴画像を生成する処理を含むことを特徴とする請求項1に記載の表面欠陥検査方法。
- 前記元画像又は前記テクスチャ特徴画像の縮小方向が検出対象である線状欠陥と平行な方向である方向を含むことを特徴とする請求項2に記載の表面欠陥検査方法。
- 前記複数の空間フィルタがウェーブレット変換により実現されることを特徴とする請求項1〜3のうち、いずれか1項に記載の表面欠陥検査方法。
- 前記複数の空間フィルタがガボールフィルタを含むことを特徴とする請求項1〜4のうち、いずれか1項に記載の表面欠陥検査方法。
- 前記特徴ベクトルがなす多次元分布における異常度としてマハラノビス距離を用いることを特徴とする請求項1〜5のうち、いずれか1項に記載の表面欠陥検査方法。
- 検査対象を撮影する撮像手段と、
前記撮像手段が撮像した前記検査対象の元画像を取得する画像入力手段と、
前記元画像に対して複数の空間フィルタによるフィルタ処理を施すことによって複数のテクスチャ特徴画像を生成するテクスチャ特徴画像生成手段と、
前記元画像上の各位置について前記複数の特徴画像の対応する位置の値を各々抽出して前記元画像上の各位置における特徴ベクトルを生成するテクスチャ特徴抽出手段と、
前記特徴ベクトルの各々について前記特徴ベクトルがなす多次元分布における異常度を算出して、前記元画像上の各位置についての異常度を示した異常度画像を生成する異常度算出手段と、
前記異常度画像において前記異常度が所定値を超える部分を欠陥部又は欠陥候補部として検出する検出手段と、
備えることを特徴とする表面欠陥検査装置。
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JP2017054426A JP6358351B1 (ja) | 2017-03-21 | 2017-03-21 | 表面欠陥検査方法及び表面欠陥検査装置 |
EP18770965.4A EP3605072A4 (en) | 2017-03-21 | 2018-02-28 | SURFACE DEFECT INSPECTION METHOD AND SURFACE DEFECT INSPECTION DEVICE |
PCT/JP2018/007418 WO2018173660A1 (ja) | 2017-03-21 | 2018-02-28 | 表面欠陥検査方法及び表面欠陥検査装置 |
CN201880018467.5A CN110431404B (zh) | 2017-03-21 | 2018-02-28 | 表面缺陷检查方法及表面缺陷检查装置 |
KR1020197027127A KR102257734B1 (ko) | 2017-03-21 | 2018-02-28 | 표면 결함 검사 방법 및 표면 결함 검사 장치 |
MX2019011283A MX2019011283A (es) | 2017-03-21 | 2018-02-28 | Metodo de inspeccion de defectos superficiales y aparato de inspeccion de defectos superficiales. |
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EP3605072A1 (en) | 2020-02-05 |
KR20190118627A (ko) | 2019-10-18 |
KR102257734B1 (ko) | 2021-05-27 |
US10859507B2 (en) | 2020-12-08 |
JP2018155690A (ja) | 2018-10-04 |
CN110431404A (zh) | 2019-11-08 |
EP3605072A4 (en) | 2020-04-08 |
CN110431404B (zh) | 2022-05-27 |
MX2019011283A (es) | 2019-11-01 |
WO2018173660A1 (ja) | 2018-09-27 |
US20200025690A1 (en) | 2020-01-23 |
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