JP6324523B2 - 誘導式サーモグラフィのためのインダクタおよびその作動方法 - Google Patents
誘導式サーモグラフィのためのインダクタおよびその作動方法 Download PDFInfo
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- JP6324523B2 JP6324523B2 JP2016550564A JP2016550564A JP6324523B2 JP 6324523 B2 JP6324523 B2 JP 6324523B2 JP 2016550564 A JP2016550564 A JP 2016550564A JP 2016550564 A JP2016550564 A JP 2016550564A JP 6324523 B2 JP6324523 B2 JP 6324523B2
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- inductor
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- 238000001931 thermography Methods 0.000 title claims description 11
- 238000000034 method Methods 0.000 title claims description 9
- 230000006698 induction Effects 0.000 title 1
- 239000004020 conductor Substances 0.000 claims description 128
- 230000001939 inductive effect Effects 0.000 claims description 8
- 238000009826 distribution Methods 0.000 claims description 4
- 230000007547 defect Effects 0.000 description 9
- 230000005291 magnetic effect Effects 0.000 description 5
- 238000011161 development Methods 0.000 description 3
- 230000018109 developmental process Effects 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000002500 effect on skin Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000005294 ferromagnetic effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000000265 homogenisation Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009828 non-uniform distribution Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/29—Terminals; Tapping arrangements for signal inductances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F5/00—Coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/2823—Wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F37/00—Fixed inductances not covered by group H01F17/00
- H01F37/005—Fixed inductances not covered by group H01F17/00 without magnetic core
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F38/00—Adaptations of transformers or inductances for specific applications or functions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F38/00—Adaptations of transformers or inductances for specific applications or functions
- H01F38/20—Instruments transformers
- H01F38/22—Instruments transformers for single phase ac
- H01F38/28—Current transformers
- H01F38/30—Constructions
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B6/00—Heating by electric, magnetic or electromagnetic fields
- H05B6/02—Induction heating
- H05B6/36—Coil arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Radiation Pyrometers (AREA)
- Coils Or Transformers For Communication (AREA)
- Coils Of Transformers For General Uses (AREA)
Description
Claims (10)
- 誘導式サーモグラフィのためのインダクタ(1)であって、
前記インダクタ(1)は、少なくとも部分領域において、矩形に巻回された導体(2)として構成されている、インダクタ(1)において、
前記導体(2)は、閉成された導体ループ(11)を含み、
前記導体ループ(11)は、当該導体ループ(11)を構成している導体の他に電気的な構成要素を有せず、
前記閉成された導体ループ(11)は、前記インダクタ(1)の内側に、サーモグラフィによる被検物体の熱分布測定のための観察窓を形成しており、
前記インダクタ(1)は、前記被検物体の一つの面の上方のみを移動可能に構成されている、
ことを特徴とするインダクタ(1)。 - 前記導体ループ(11)は、互いに離間されて配置された2つの部分導体(10,12)を含み、前記2つの部分導体(10,12)は、互いに一定の間隔を有する、
請求項1記載のインダクタ(1)。 - 前記部分導体(10,12)は、前記導体(2)によって形成された前記矩形の1つの辺(8)をほぼ完全に構成している、
請求項2記載のインダクタ(1)。 - 前記1つの辺(8)は、矩形に巻回された導体(2)の長辺(8)として形成されている、
請求項3記載のインダクタ(1)。 - 前記導体ループ(11)の前記各部分導体(10,12)は、楕円セグメント形に巻回されている、
請求項1から4のいずれか1項記載のインダクタ(1)。 - 前記導体ループ(11)は、矩形に巻回されている、
請求項1から5のいずれか1項記載のインダクタ(1)。 - 前記インダクタ(1)は、2つの電気端子(4,6)を有する、
請求項1から6のいずれか1項記載のインダクタ(1)。 - 請求項1から7のいずれか1項記載の、誘導式サーモグラフィのためのインダクタ(1)を作動する方法において、
少なくとも部分領域において矩形に巻回された前記導体(2)に交流電流を流し、
前記交流電流を、前記導体(2)に沿って、前記導体ループ(11)を用いて、平行に流れる2つの部分交流電流に分流させる、
ことを特徴とする方法。 - 前記交流電流の周波数は、100kHz〜500kHzの周波数範囲内にある、
請求項8記載の方法。 - 前記交流電流の電流強度は、少なくとも1000Aである、
請求項8又は9記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102014202128.6 | 2014-02-06 | ||
DE102014202128.6A DE102014202128A1 (de) | 2014-02-06 | 2014-02-06 | Induktor |
PCT/EP2015/051091 WO2015117820A1 (de) | 2014-02-06 | 2015-01-21 | Induktor |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017507487A JP2017507487A (ja) | 2017-03-16 |
JP6324523B2 true JP6324523B2 (ja) | 2018-05-16 |
Family
ID=52464331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016550564A Expired - Fee Related JP6324523B2 (ja) | 2014-02-06 | 2015-01-21 | 誘導式サーモグラフィのためのインダクタおよびその作動方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US10217560B2 (ja) |
EP (1) | EP3095121B1 (ja) |
JP (1) | JP6324523B2 (ja) |
CN (1) | CN105993055B (ja) |
CA (1) | CA2938805C (ja) |
DE (1) | DE102014202128A1 (ja) |
WO (1) | WO2015117820A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014202128A1 (de) | 2014-02-06 | 2015-08-06 | Siemens Aktiengesellschaft | Induktor |
DE102016005822B4 (de) * | 2016-05-11 | 2020-03-05 | INPRO Innovationsgesellschaft für fortgeschrittene Produktionssysteme in der Fahrzeugindustrie mbH | Verfahren zum zerstörungsfreien Überwachen (Detektieren) der Einschweißtiefe mindestens einer Laserschweißnaht bei Fügeverbindungen eines Blechbauteils aus verschiedenen metallischen Fügepartnern mit unterschiedlichen Schmelztemperaturen und/oder Wärmeleitfähigkeiten |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
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US3449664A (en) * | 1966-05-16 | 1969-06-10 | Bell Inc F W | Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field |
JPS5329183A (en) | 1976-08-31 | 1978-03-18 | High Frequency Heattreat Co Ltd | Flaw detecting method of metal body surface by induction heating method |
JPS57141542A (en) | 1981-12-22 | 1982-09-01 | High Frequency Heattreat Co Ltd | Detection apparatus for flaw of metallic body surface by induction heating method |
JPS5930052A (ja) | 1982-08-13 | 1984-02-17 | Nippon Abionikusu Kk | 内部欠陥検査装置 |
JPS61132848A (ja) | 1984-12-03 | 1986-06-20 | Nippon Kokan Kk <Nkk> | 非接触塗装検査装置 |
JPS61230053A (ja) | 1985-04-04 | 1986-10-14 | Nippon Kokan Kk <Nkk> | 非接触剥離検査装置 |
JPH0413956A (ja) | 1990-05-07 | 1992-01-17 | Daido Steel Co Ltd | 金属部材の表面傷検出方法 |
JPH0471159A (ja) | 1990-07-11 | 1992-03-05 | Toshiba Lighting & Technol Corp | 蛍光ランプ |
JPH0471159U (ja) * | 1990-10-31 | 1992-06-24 | ||
JPH04178552A (ja) | 1990-11-14 | 1992-06-25 | Mitsubishi Electric Corp | 赤外線表面欠陥検知装置 |
JP3353459B2 (ja) | 1993-05-17 | 2002-12-03 | 大同特殊鋼株式会社 | 探傷方法及びその装置 |
GB9622344D0 (en) | 1996-10-28 | 1997-01-08 | Norweb Plc | Inductor |
DE10233980A1 (de) | 2002-07-25 | 2004-02-12 | Philips Intellectual Property & Standards Gmbh | Planarinduktivität |
US6677561B1 (en) | 2002-10-21 | 2004-01-13 | Outokumpu Oyj | Coil for induction heating of a strip or another elongate metal workpiece |
US6859125B2 (en) | 2003-02-14 | 2005-02-22 | Inductoheat, Inc. | Induction heat treatment of complex-shaped workpieces |
US7283345B2 (en) * | 2003-07-14 | 2007-10-16 | Gang Liu | PCB trace coupling system for providing high voltage isolation |
TW200540681A (en) * | 2004-06-15 | 2005-12-16 | Four Tech Co Ltd A | Winding method for mouse pad with induction coil |
US7485882B2 (en) * | 2006-06-15 | 2009-02-03 | Siemens Energy, Inc. | Hand held magnetic induction thermography system |
JP2009111959A (ja) | 2007-10-10 | 2009-05-21 | Furukawa Electric Co Ltd:The | 平行2線アンテナおよび無線通信機器 |
EP2073002A1 (en) * | 2007-12-20 | 2009-06-24 | Montanuniversität Leoben | Object processing system |
EP2386850A3 (en) * | 2010-05-13 | 2011-12-21 | Siemens Energy, Inc. | Automated inspection system and method for nondestructive inspection of a workpiece using induction thermography |
DE102012008531B4 (de) | 2012-04-07 | 2014-02-13 | INPRO Innovationsgesellschaft für fortgeschrittene Produktionssysteme in der Fahrzeugindustrie | Verfahren zur zerstörungsfreien Prüfung einer Fügeverbindung eines Bauteils mittels Induktions-Thermografie und Anordnung zur Durchführung des Verfahrens |
JP5965741B2 (ja) * | 2012-06-26 | 2016-08-10 | オリンパス株式会社 | 医療用無線給電システム |
DE102012212434A1 (de) | 2012-07-16 | 2014-01-16 | Siemens Aktiengesellschaft | Visualisierung von Hinweisen bei der Induktionsthermografie |
DE102014202128A1 (de) | 2014-02-06 | 2015-08-06 | Siemens Aktiengesellschaft | Induktor |
-
2014
- 2014-02-06 DE DE102014202128.6A patent/DE102014202128A1/de not_active Withdrawn
-
2015
- 2015-01-21 WO PCT/EP2015/051091 patent/WO2015117820A1/de active Application Filing
- 2015-01-21 CN CN201580002831.5A patent/CN105993055B/zh not_active Expired - Fee Related
- 2015-01-21 JP JP2016550564A patent/JP6324523B2/ja not_active Expired - Fee Related
- 2015-01-21 US US15/110,877 patent/US10217560B2/en not_active Expired - Fee Related
- 2015-01-21 EP EP15703475.2A patent/EP3095121B1/de not_active Not-in-force
- 2015-01-21 CA CA2938805A patent/CA2938805C/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2017507487A (ja) | 2017-03-16 |
CA2938805C (en) | 2018-06-26 |
WO2015117820A1 (de) | 2015-08-13 |
EP3095121B1 (de) | 2018-01-17 |
DE102014202128A1 (de) | 2015-08-06 |
CN105993055B (zh) | 2019-03-15 |
EP3095121A1 (de) | 2016-11-23 |
CN105993055A (zh) | 2016-10-05 |
US20160351326A1 (en) | 2016-12-01 |
CA2938805A1 (en) | 2015-08-13 |
US10217560B2 (en) | 2019-02-26 |
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