JP6223460B2 - 分析システムのための装置、該装置を有する分析システム及び該装置を使用する方法 - Google Patents

分析システムのための装置、該装置を有する分析システム及び該装置を使用する方法 Download PDF

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Publication number
JP6223460B2
JP6223460B2 JP2015537405A JP2015537405A JP6223460B2 JP 6223460 B2 JP6223460 B2 JP 6223460B2 JP 2015537405 A JP2015537405 A JP 2015537405A JP 2015537405 A JP2015537405 A JP 2015537405A JP 6223460 B2 JP6223460 B2 JP 6223460B2
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JP
Japan
Prior art keywords
birefringent
radiation
polarization
refractive index
detector
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Expired - Fee Related
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JP2015537405A
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Japanese (ja)
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JP2015532432A5 (enExample
JP2015532432A (ja
Inventor
エミール ヨハネス カレル フェルステーヘン
エミール ヨハネス カレル フェルステーヘン
アドリアヌス ヨハネス ジェラルダス マンク
アドリアヌス ヨハネス ジェラルダス マンク
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Koninklijke Philips NV
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Koninklijke Philips NV
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0224—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using polarising or depolarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6445—Measuring fluorescence polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3083—Birefringent or phase retarding elements
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0638—Refractive parts
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/04—Prisms
    • G02B5/06—Fluid-filled or evacuated prisms

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Optics & Photonics (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2015537405A 2012-10-18 2013-10-17 分析システムのための装置、該装置を有する分析システム及び該装置を使用する方法 Expired - Fee Related JP6223460B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261715538P 2012-10-18 2012-10-18
US61/715,538 2012-10-18
PCT/IB2013/059419 WO2014060983A1 (en) 2012-10-18 2013-10-17 Arrangement for an analysis system, analysis system having the arrangement and method for use of the arrangement

Publications (3)

Publication Number Publication Date
JP2015532432A JP2015532432A (ja) 2015-11-09
JP2015532432A5 JP2015532432A5 (enExample) 2017-09-21
JP6223460B2 true JP6223460B2 (ja) 2017-11-01

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JP2015537405A Expired - Fee Related JP6223460B2 (ja) 2012-10-18 2013-10-17 分析システムのための装置、該装置を有する分析システム及び該装置を使用する方法

Country Status (5)

Country Link
US (1) US9752984B2 (enExample)
EP (1) EP2909607A1 (enExample)
JP (1) JP6223460B2 (enExample)
CN (1) CN104737000B (enExample)
WO (1) WO2014060983A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101949571B1 (ko) 2014-03-04 2019-02-18 노바다크 테크놀러지즈 유엘씨 광대역 이미징을 위한 릴레이 렌즈 시스템
JP6479035B2 (ja) 2014-03-04 2019-03-06 ノバダック テクノロジーズ ユーエルシー 空間およびスペクトルフィルタリング開口およびそれを含む光学イメージングシステム
EP3040709B1 (en) * 2014-12-31 2020-07-08 Nuctech Company Limited Liquid object identification apparatus and method
GB201511318D0 (en) * 2015-06-29 2015-08-12 Secr Defence Improved spatially-offset raman spectroscopy
EP3345024B1 (en) * 2015-08-31 2023-05-31 Stryker European Operations Limited Imaging system comprising a polarization filter and method of filtering polarized light in an imaging system
DE102017208615A1 (de) * 2017-05-22 2018-11-22 Carl Zeiss Microscopy Gmbh Verfahren und Adapter zur Adaption eines Mikroskopobjektivs an ein Digitalmikroskop
DE102017115661A1 (de) * 2017-07-12 2019-01-17 Endress+Hauser Conducta Gmbh+Co. Kg Optischer Sensor
DE102018118842A1 (de) * 2017-08-02 2019-02-07 Dmg Mori Co., Ltd. Relativpositions-detektionsmittel und verschiebungs-detektionsvorrichtung
JP7233186B2 (ja) * 2018-09-18 2023-03-06 Dmg森精機株式会社 相対位置検出手段、及び変位検出装置
EP4332557B1 (en) 2022-08-31 2024-06-26 Unity Semiconductor A system for optical inspection of a substrate using same or different wavelengths
DE102023110269B3 (de) * 2023-04-21 2023-12-28 Sioptica Gmbh Schaltbarer Lichtfilter, Beleuchtungseinrichtung und Bildschirm
EP4671709A1 (en) * 2024-06-25 2025-12-31 Serstech AB RAMAN SPECTROSCOPY DEVICE AND METHOD FOR PERFORMING RAMAN SPECTROSCOPY ON A SAMPLE

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR75792E (fr) * 1959-06-01 1961-08-11 Onera (Off Nat Aerospatiale) Spectromètre
JPH0991738A (ja) * 1995-09-26 1997-04-04 Matsushita Electric Ind Co Ltd マルチビーム生成方法及びマルチビーム光ヘッド
US5930044A (en) * 1997-01-09 1999-07-27 U.S. Philips Corporation Deflecting element having a switchable liquid crystalline material
US6134010A (en) * 1997-11-07 2000-10-17 Lucid, Inc. Imaging system using polarization effects to enhance image quality
GR1004180B (el) * 2000-03-28 2003-03-11 ����������� ����� ��������� (����) Μεθοδος και συστημα χαρακτηρισμου και χαρτογραφησης αλλοιωσεων των ιστων
CA2344021C (en) * 2000-04-20 2010-01-26 Jds Uniphase Inc. Polarization beam splitter or combiner
JP2002277843A (ja) * 2001-03-15 2002-09-25 Mitsubishi Electric Corp 可変光フィルタ
JP2003107407A (ja) * 2001-09-28 2003-04-09 Nec Tokin Corp 偏光分離合成装置
AU2003285653A1 (en) 2002-12-30 2004-07-22 Koninklijke Philips Electronics N.V. Dual layer birefringent optical component
US20060114764A1 (en) 2002-12-30 2006-06-01 Verstegen Emile J K Birefringent optical component
AU2003286366A1 (en) 2002-12-30 2004-07-22 Koninklijke Philips Electronics N.V. Liquid crystal component
DE602004003474T2 (de) 2003-02-05 2007-09-13 Ocuity Ltd., Upper Heyford Schaltbare display-vorrichtung
WO2004081549A1 (en) * 2003-03-11 2004-09-23 Koninklijke Philips Electronics N.V. Spectroscopic analysis apparatus and method with excitation system and focus monitoring system
US7079203B1 (en) 2003-06-23 2006-07-18 Research Foundation Of The University Of Central Florida, Inc. Electrically tunable polarization-independent micro lens using polymer network twisted nematic liquid crystal
US7738095B2 (en) 2003-07-18 2010-06-15 Chemimage Corporation Method and apparatus for compact spectrometer for detecting hazardous agents
US7099599B2 (en) 2003-08-15 2006-08-29 Static Control Components, Inc. System and method for port testing and configuration
US7535649B2 (en) 2004-03-09 2009-05-19 Tang Yin S Motionless lens systems and methods
EP1730571A2 (en) * 2004-03-24 2006-12-13 Koninklijke Philips Electronics N.V. Birefringent optical system
WO2006003582A1 (en) 2004-06-29 2006-01-12 Koninklijke Philips Electronics N.V. Polarisation-independent liquid crystal beam deflector
US20060124443A1 (en) 2004-11-03 2006-06-15 David Tuschel Control and monitoring of non-resonant radiation-induced nucleation, crystallization, and polymorph formation
GB0426993D0 (en) * 2004-12-09 2005-01-12 Council Cent Lab Res Councils Apparatus for depth-selective raman spectroscopy
EP1831749A1 (en) * 2004-12-22 2007-09-12 Koninklijke Philips Electronics N.V. Apparatus and method for enhanced optical transmission through a small aperture, using radially polarized radiation
US7499608B1 (en) 2004-12-23 2009-03-03 Coadna Photonics, Inc. Apparatus and method for optical switching with liquid crystals and birefringent wedges
DE102006017327A1 (de) * 2006-04-11 2007-10-18 Leica Microsystems Cms Gmbh Polarisations-Interferenzmikroskop
JP2009540350A (ja) * 2006-06-06 2009-11-19 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 小さな粒子状物質を分離又はトラップする可変焦点レンズ
WO2008126049A1 (en) 2007-04-17 2008-10-23 Koninklijke Philips Electronics N.V. Beam-shaping device
US7873397B2 (en) * 2007-06-19 2011-01-18 Richard Higgins Spectroscopic optical system
EP2012173A3 (en) * 2007-07-03 2009-12-09 JDS Uniphase Corporation Non-etched flat polarization-selective diffractive optical elements
EP2215457B1 (en) * 2007-11-23 2018-07-11 Koninklijke Philips N.V. Illumination optical system comprising a beam shaper and method of illuminating a sample using said optical system
FR2962816B1 (fr) * 2010-07-19 2012-08-24 Horiba Jobin Yvon Sas Convertisseur de polarisation a symetrie cylindrique bidirectionnel et procede de conversion de polarisation cartesien-cylindrique

Also Published As

Publication number Publication date
US9752984B2 (en) 2017-09-05
EP2909607A1 (en) 2015-08-26
JP2015532432A (ja) 2015-11-09
CN104737000A (zh) 2015-06-24
US20150260652A1 (en) 2015-09-17
WO2014060983A1 (en) 2014-04-24
CN104737000B (zh) 2018-05-18

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