CN104737000B - 用于分析系统的装置、具有该装置的分析系统和用于使用该装置的方法 - Google Patents
用于分析系统的装置、具有该装置的分析系统和用于使用该装置的方法 Download PDFInfo
- Publication number
- CN104737000B CN104737000B CN201380054464.4A CN201380054464A CN104737000B CN 104737000 B CN104737000 B CN 104737000B CN 201380054464 A CN201380054464 A CN 201380054464A CN 104737000 B CN104737000 B CN 104737000B
- Authority
- CN
- China
- Prior art keywords
- birefringent
- polarization
- radiation
- refractive index
- excitation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0224—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using polarising or depolarising elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6445—Measuring fluorescence polarisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0092—Polarisation microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3083—Birefringent or phase retarding elements
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0638—Refractive parts
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/04—Prisms
- G02B5/06—Fluid-filled or evacuated prisms
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Optics & Photonics (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261715538P | 2012-10-18 | 2012-10-18 | |
| US61/715538 | 2012-10-18 | ||
| PCT/IB2013/059419 WO2014060983A1 (en) | 2012-10-18 | 2013-10-17 | Arrangement for an analysis system, analysis system having the arrangement and method for use of the arrangement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104737000A CN104737000A (zh) | 2015-06-24 |
| CN104737000B true CN104737000B (zh) | 2018-05-18 |
Family
ID=49949991
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380054464.4A Expired - Fee Related CN104737000B (zh) | 2012-10-18 | 2013-10-17 | 用于分析系统的装置、具有该装置的分析系统和用于使用该装置的方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9752984B2 (enExample) |
| EP (1) | EP2909607A1 (enExample) |
| JP (1) | JP6223460B2 (enExample) |
| CN (1) | CN104737000B (enExample) |
| WO (1) | WO2014060983A1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106461828B (zh) | 2014-03-04 | 2022-09-20 | 史赛克欧洲运营有限公司 | 空间和光谱滤波孔径以及包括其的光学成像系统 |
| KR101949571B1 (ko) | 2014-03-04 | 2019-02-18 | 노바다크 테크놀러지즈 유엘씨 | 광대역 이미징을 위한 릴레이 렌즈 시스템 |
| EP3040709B1 (en) * | 2014-12-31 | 2020-07-08 | Nuctech Company Limited | Liquid object identification apparatus and method |
| GB201511318D0 (en) * | 2015-06-29 | 2015-08-12 | Secr Defence | Improved spatially-offset raman spectroscopy |
| EP3345024B1 (en) * | 2015-08-31 | 2023-05-31 | Stryker European Operations Limited | Imaging system comprising a polarization filter and method of filtering polarized light in an imaging system |
| DE102017208615A1 (de) * | 2017-05-22 | 2018-11-22 | Carl Zeiss Microscopy Gmbh | Verfahren und Adapter zur Adaption eines Mikroskopobjektivs an ein Digitalmikroskop |
| DE102017115661A1 (de) * | 2017-07-12 | 2019-01-17 | Endress+Hauser Conducta Gmbh+Co. Kg | Optischer Sensor |
| DE102018118842A1 (de) * | 2017-08-02 | 2019-02-07 | Dmg Mori Co., Ltd. | Relativpositions-detektionsmittel und verschiebungs-detektionsvorrichtung |
| JP7233186B2 (ja) * | 2018-09-18 | 2023-03-06 | Dmg森精機株式会社 | 相対位置検出手段、及び変位検出装置 |
| EP4332557B1 (en) * | 2022-08-31 | 2024-06-26 | Unity Semiconductor | A system for optical inspection of a substrate using same or different wavelengths |
| DE102023110269B3 (de) * | 2023-04-21 | 2023-12-28 | Sioptica Gmbh | Schaltbarer Lichtfilter, Beleuchtungseinrichtung und Bildschirm |
| EP4671709A1 (en) * | 2024-06-25 | 2025-12-31 | Serstech AB | RAMAN SPECTROSCOPY DEVICE AND METHOD FOR PERFORMING RAMAN SPECTROSCOPY ON A SAMPLE |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6134010A (en) * | 1997-11-07 | 2000-10-17 | Lucid, Inc. | Imaging system using polarization effects to enhance image quality |
| CN101084049A (zh) * | 2004-11-03 | 2007-12-05 | 化学影像公司 | 非共振辐射引起的成核、结晶和多晶型物形成的控制和监测 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR75792E (fr) * | 1959-06-01 | 1961-08-11 | Onera (Off Nat Aerospatiale) | Spectromètre |
| JPH0991738A (ja) * | 1995-09-26 | 1997-04-04 | Matsushita Electric Ind Co Ltd | マルチビーム生成方法及びマルチビーム光ヘッド |
| US5930044A (en) * | 1997-01-09 | 1999-07-27 | U.S. Philips Corporation | Deflecting element having a switchable liquid crystalline material |
| GR1004180B (el) * | 2000-03-28 | 2003-03-11 | ����������� ����� ��������� (����) | Μεθοδος και συστημα χαρακτηρισμου και χαρτογραφησης αλλοιωσεων των ιστων |
| CA2344021C (en) * | 2000-04-20 | 2010-01-26 | Jds Uniphase Inc. | Polarization beam splitter or combiner |
| JP2002277843A (ja) * | 2001-03-15 | 2002-09-25 | Mitsubishi Electric Corp | 可変光フィルタ |
| JP2003107407A (ja) * | 2001-09-28 | 2003-04-09 | Nec Tokin Corp | 偏光分離合成装置 |
| AU2003285653A1 (en) | 2002-12-30 | 2004-07-22 | Koninklijke Philips Electronics N.V. | Dual layer birefringent optical component |
| JP2006512708A (ja) * | 2002-12-30 | 2006-04-13 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 複屈折光コンポーネント |
| US20060086448A1 (en) | 2002-12-30 | 2006-04-27 | Koninikjkle Phillips Electronics N.V. | Liquid crystal component |
| EP1590699B1 (en) | 2003-02-05 | 2006-11-29 | Ocuity Limited | Switchable display apparatus |
| JP2006520900A (ja) * | 2003-03-11 | 2006-09-14 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 励起システム及び焦点モニタリングシステムを備える分光分析装置及び方法 |
| US7079203B1 (en) | 2003-06-23 | 2006-07-18 | Research Foundation Of The University Of Central Florida, Inc. | Electrically tunable polarization-independent micro lens using polymer network twisted nematic liquid crystal |
| US7738095B2 (en) | 2003-07-18 | 2010-06-15 | Chemimage Corporation | Method and apparatus for compact spectrometer for detecting hazardous agents |
| US7099599B2 (en) | 2003-08-15 | 2006-08-29 | Static Control Components, Inc. | System and method for port testing and configuration |
| US7535649B2 (en) | 2004-03-09 | 2009-05-19 | Tang Yin S | Motionless lens systems and methods |
| KR20070003965A (ko) * | 2004-03-24 | 2007-01-05 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 복굴절 광학계 |
| WO2006003582A1 (en) | 2004-06-29 | 2006-01-12 | Koninklijke Philips Electronics N.V. | Polarisation-independent liquid crystal beam deflector |
| GB0426993D0 (en) * | 2004-12-09 | 2005-01-12 | Council Cent Lab Res Councils | Apparatus for depth-selective raman spectroscopy |
| US20090251771A1 (en) * | 2004-12-22 | 2009-10-08 | Koninklijke Philips Electronics, N.V. | Apparatus and method for enhanced optical transmission through a small aperture, using radially polarized radiation |
| US7499608B1 (en) | 2004-12-23 | 2009-03-03 | Coadna Photonics, Inc. | Apparatus and method for optical switching with liquid crystals and birefringent wedges |
| DE102006017327A1 (de) * | 2006-04-11 | 2007-10-18 | Leica Microsystems Cms Gmbh | Polarisations-Interferenzmikroskop |
| BRPI0712336A2 (pt) * | 2006-06-06 | 2012-01-31 | Koninkl Philips Electronics Nv | Membro de manipulação de feixe para uso de um sistema de pinça óptica, sistema de pinça óptica, e, método de manipular um feixe de laser de um sistema de pinça óptica |
| US20100149444A1 (en) | 2007-04-17 | 2010-06-17 | Koninklijke Philips Electronics N.V. | Beam-shaping device |
| US7873397B2 (en) * | 2007-06-19 | 2011-01-18 | Richard Higgins | Spectroscopic optical system |
| EP2012173A3 (en) * | 2007-07-03 | 2009-12-09 | JDS Uniphase Corporation | Non-etched flat polarization-selective diffractive optical elements |
| WO2009066261A2 (en) * | 2007-11-23 | 2009-05-28 | Koninklijke Philips Electronics N.V. | Beam shaper, optical system and methods using the same |
| FR2962816B1 (fr) * | 2010-07-19 | 2012-08-24 | Horiba Jobin Yvon Sas | Convertisseur de polarisation a symetrie cylindrique bidirectionnel et procede de conversion de polarisation cartesien-cylindrique |
-
2013
- 2013-10-17 CN CN201380054464.4A patent/CN104737000B/zh not_active Expired - Fee Related
- 2013-10-17 EP EP13819074.9A patent/EP2909607A1/en not_active Withdrawn
- 2013-10-17 US US14/434,814 patent/US9752984B2/en not_active Expired - Fee Related
- 2013-10-17 WO PCT/IB2013/059419 patent/WO2014060983A1/en not_active Ceased
- 2013-10-17 JP JP2015537405A patent/JP6223460B2/ja not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6134010A (en) * | 1997-11-07 | 2000-10-17 | Lucid, Inc. | Imaging system using polarization effects to enhance image quality |
| CN101084049A (zh) * | 2004-11-03 | 2007-12-05 | 化学影像公司 | 非共振辐射引起的成核、结晶和多晶型物形成的控制和监测 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6223460B2 (ja) | 2017-11-01 |
| CN104737000A (zh) | 2015-06-24 |
| WO2014060983A1 (en) | 2014-04-24 |
| JP2015532432A (ja) | 2015-11-09 |
| EP2909607A1 (en) | 2015-08-26 |
| US20150260652A1 (en) | 2015-09-17 |
| US9752984B2 (en) | 2017-09-05 |
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Legal Events
| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180518 Termination date: 20191017 |