JP6220863B2 - リセット条件トレース能力を伴うプロセッサデバイス - Google Patents

リセット条件トレース能力を伴うプロセッサデバイス Download PDF

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Publication number
JP6220863B2
JP6220863B2 JP2015511620A JP2015511620A JP6220863B2 JP 6220863 B2 JP6220863 B2 JP 6220863B2 JP 2015511620 A JP2015511620 A JP 2015511620A JP 2015511620 A JP2015511620 A JP 2015511620A JP 6220863 B2 JP6220863 B2 JP 6220863B2
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Prior art keywords
trace
reset
processor device
module
information
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JP2015511620A
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Japanese (ja)
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JP2015516637A5 (enExample
JP2015516637A (ja
Inventor
ジャスティン ミルクス,
ジャスティン ミルクス,
トーマス エドワード パーム,
トーマス エドワード パーム,
スンダール バラスブラマニアン,
スンダール バラスブラマニアン,
クシャラ ジャバガル,
クシャラ ジャバガル,
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Microchip Technology Inc
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Microchip Technology Inc
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Publication of JP2015516637A5 publication Critical patent/JP2015516637A5/ja
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Prevention of errors by analysis, debugging or testing of software
    • G06F11/362Debugging of software
    • G06F11/3636Debugging of software by tracing the execution of the program
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Prevention of errors by analysis, debugging or testing of software
    • G06F11/362Debugging of software
    • G06F11/3648Debugging of software using additional hardware
    • G06F11/3656Debugging of software using additional hardware using a specific debug interface

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
  • Microcomputers (AREA)
JP2015511620A 2012-05-07 2013-05-07 リセット条件トレース能力を伴うプロセッサデバイス Active JP6220863B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261643725P 2012-05-07 2012-05-07
US61/643,725 2012-05-07
PCT/US2013/039934 WO2013169766A1 (en) 2012-05-07 2013-05-07 Processor device with reset condition trace capabilities

Publications (3)

Publication Number Publication Date
JP2015516637A JP2015516637A (ja) 2015-06-11
JP2015516637A5 JP2015516637A5 (enExample) 2016-06-30
JP6220863B2 true JP6220863B2 (ja) 2017-10-25

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ID=48570432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015511620A Active JP6220863B2 (ja) 2012-05-07 2013-05-07 リセット条件トレース能力を伴うプロセッサデバイス

Country Status (6)

Country Link
US (1) US9298570B2 (enExample)
EP (1) EP2847682B1 (enExample)
JP (1) JP6220863B2 (enExample)
KR (1) KR20150008441A (enExample)
CN (1) CN104380266B (enExample)
WO (1) WO2013169766A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150019775A1 (en) * 2013-03-14 2015-01-15 Microchip Technology Incorporated Single Wire Programming and Debugging Interface
US20160103722A1 (en) * 2014-10-10 2016-04-14 Qualcomm Incorporated Hardware lockup detection mechanism for user devices
US9690727B2 (en) * 2014-10-31 2017-06-27 Atmel Corporation System internal latency measurements in realtime applications
US10534688B2 (en) * 2016-09-30 2020-01-14 Intel Corporation Trace hub logic with automatic event triggering
US10754759B1 (en) * 2018-02-05 2020-08-25 Xilinx, Inc. Breakpointing circuitry that evaluates breakpoint conditions while running clock to target circuit
US20190370016A1 (en) * 2018-05-31 2019-12-05 Hamilton Sundstrand Corporation Auto detection of jtag debuggers/emulators
CN109117362B (zh) * 2018-06-26 2020-08-25 华东师范大学 一种基于中间语言的plc程序验证系统
EP3661056B1 (en) * 2018-11-27 2022-05-25 STMicroelectronics Application GmbH Processing system, related integrated circuit, device and method
CN110032482A (zh) * 2019-04-11 2019-07-19 盛科网络(苏州)有限公司 片上调试装置和方法
DE112020006396B4 (de) 2020-02-27 2024-12-05 Microchip Technology Incorporated Synchronisierung von sequenznummern in einem netzwerk
US11442805B1 (en) * 2021-03-03 2022-09-13 Siliconch Systems Pvt Ltd System and method for debugging microcontroller using low-bandwidth real-time trace
US12393505B2 (en) * 2023-01-17 2025-08-19 Stmicroelectronics International N.V. Reset circuitry providing independent reset signal for trace and debug logic

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0736735A (ja) * 1993-07-22 1995-02-07 Agency Of Ind Science & Technol デバッグ装置
CN1316368C (zh) * 1994-12-28 2007-05-16 株式会社东芝 微处理器
US5825706A (en) * 1997-10-27 1998-10-20 Motorola, Inc. Circuit and method for retaining data in DRAM in a portable electronic device
US6792527B1 (en) * 2000-12-22 2004-09-14 Xilinx, Inc. Method to provide hierarchical reset capabilities for a configurable system on a chip
US7051197B2 (en) * 2002-11-22 2006-05-23 Texas Instruments Incorporated Tracing through reset
US7237151B2 (en) * 2002-12-17 2007-06-26 Texas Instruments Incorporated Apparatus and method for trace stream identification of a processor reset
JP2006011991A (ja) * 2004-06-29 2006-01-12 Meidensha Corp コンピュータ制御装置およびこのソフトウェア実行記録方式
CN100401267C (zh) * 2006-09-01 2008-07-09 上海大学 微处理器的片上动态跟踪方法
JP2008129669A (ja) * 2006-11-17 2008-06-05 Meidensha Corp ハードウェア異常記録装置及びハードウェア異常記録方法
JP2008276324A (ja) * 2007-04-25 2008-11-13 Kyocera Mita Corp リセット装置及び当該リセット装置を備えた画像形成装置
US7681078B2 (en) * 2007-05-18 2010-03-16 Freescale Semiconductor, Inc. Debugging a processor through a reset event
JP5533097B2 (ja) * 2010-03-18 2014-06-25 株式会社リコー 情報処理装置、画像形成装置及び情報処理プログラム

Also Published As

Publication number Publication date
CN104380266A (zh) 2015-02-25
EP2847682B1 (en) 2019-07-03
KR20150008441A (ko) 2015-01-22
CN104380266B (zh) 2017-07-18
WO2013169766A1 (en) 2013-11-14
US20130297974A1 (en) 2013-11-07
JP2015516637A (ja) 2015-06-11
EP2847682A1 (en) 2015-03-18
US9298570B2 (en) 2016-03-29

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