JP6203962B2 - 電子回路用ギャップを伴う新規イメージングセンサを持つスキャンイメージングシステム - Google Patents

電子回路用ギャップを伴う新規イメージングセンサを持つスキャンイメージングシステム Download PDF

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Publication number
JP6203962B2
JP6203962B2 JP2016536224A JP2016536224A JP6203962B2 JP 6203962 B2 JP6203962 B2 JP 6203962B2 JP 2016536224 A JP2016536224 A JP 2016536224A JP 2016536224 A JP2016536224 A JP 2016536224A JP 6203962 B2 JP6203962 B2 JP 6203962B2
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pixel
sensor
pixels
imaging system
imaging sensor
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Japanese (ja)
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JP2017500796A (ja
JP2017500796A5 (de
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バス ハルスケン
バス ハルスケン
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/768—Addressed sensors, e.g. MOS or CMOS sensors for time delay and integration [TDI]
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Microscoopes, Condenser (AREA)
JP2016536224A 2013-12-16 2014-12-15 電子回路用ギャップを伴う新規イメージングセンサを持つスキャンイメージングシステム Active JP6203962B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP13197416.4 2013-12-16
EP13197416 2013-12-16
PCT/EP2014/077661 WO2015091300A1 (en) 2013-12-16 2014-12-15 Scanning imaging system with a novel imaging sensor with gaps for electronic circuitry

Related Child Applications (1)

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JP2017165617A Division JP6541275B2 (ja) 2013-12-16 2017-08-30 電子回路用ギャップを伴う新規イメージングセンサを持つスキャンイメージングシステム

Publications (3)

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JP2017500796A JP2017500796A (ja) 2017-01-05
JP2017500796A5 JP2017500796A5 (de) 2017-06-22
JP6203962B2 true JP6203962B2 (ja) 2017-09-27

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JP2016536224A Active JP6203962B2 (ja) 2013-12-16 2014-12-15 電子回路用ギャップを伴う新規イメージングセンサを持つスキャンイメージングシステム
JP2017165617A Active JP6541275B2 (ja) 2013-12-16 2017-08-30 電子回路用ギャップを伴う新規イメージングセンサを持つスキャンイメージングシステム

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JP2017165617A Active JP6541275B2 (ja) 2013-12-16 2017-08-30 電子回路用ギャップを伴う新規イメージングセンサを持つスキャンイメージングシステム

Country Status (5)

Country Link
US (1) US10091445B2 (de)
EP (2) EP3085075B1 (de)
JP (2) JP6203962B2 (de)
CN (1) CN105814883B (de)
WO (1) WO2015091300A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3615916A4 (de) * 2017-04-24 2020-12-30 Technologies International Inc. Huron Rastermikroskop zur 3d-bildgebung mittels msia
WO2018195831A1 (zh) * 2017-04-26 2018-11-01 深圳市柔宇科技有限公司 控制方法、控制装置和光学检测设备
US10502941B2 (en) * 2017-09-29 2019-12-10 Leica Biosystmes Imaging, Inc. Two-dimensional and three-dimensional fixed Z scanning
CN108594418B (zh) * 2018-03-29 2021-02-05 暨南大学 一种基于阵列单像素探测器的光场显微成像系统及其方法
IL303963B2 (en) * 2018-05-31 2024-06-01 Raytheon Co Electro-optical/infrared focal plane array Programmable digital time integration with multiple selectable time integration subgroups

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2735632B1 (fr) 1995-06-14 1997-07-11 Commissariat Energie Atomique Dispositif et procede de numerisation pour detecteurs photosensibles et procede de lecture d'une matrice de detecteurs photoniques
US5646427A (en) * 1995-08-23 1997-07-08 Dalsa, Inc. Integrated circuit defect tolerant architecture
JPH09247388A (ja) * 1996-03-11 1997-09-19 Fuji Xerox Co Ltd 画像読取装置
JP4497577B2 (ja) * 1999-04-05 2010-07-07 キヤノン株式会社 マルチビーム光走査装置
JP2001024948A (ja) * 1999-07-08 2001-01-26 Canon Inc 固体撮像装置及びそれを用いた撮像システム
FI111759B (fi) * 2000-03-14 2003-09-15 Planmed Oy Anturijärjestelmä ja menetelmä digitaalisessa röntgenkuvantamisessa
JP4721380B2 (ja) 2000-04-14 2011-07-13 キヤノン株式会社 固体撮像装置および撮像システム
US6711283B1 (en) * 2000-05-03 2004-03-23 Aperio Technologies, Inc. Fully automatic rapid microscope slide scanner
DE10127284A1 (de) * 2001-06-05 2002-12-12 Zeiss Carl Jena Gmbh Autofokussiereinrichtung für ein optisches Gerät
GB2383487B (en) 2001-12-18 2006-09-27 Fairfield Imaging Ltd Method and apparatus for acquiring digital microscope images
US6831688B2 (en) * 2002-04-08 2004-12-14 Recon/Optical, Inc. Multispectral or hyperspectral imaging system and method for tactical reconnaissance
US7130115B2 (en) 2002-09-23 2006-10-31 Dhetrix, Inc. Multi-mode scanning imaging system
JP2010135464A (ja) 2008-12-03 2010-06-17 Konica Minolta Business Technologies Inc 固体撮像素子及び撮像装置
JP2010212288A (ja) * 2009-03-06 2010-09-24 Renesas Electronics Corp 撮像装置
BR112012015931A2 (pt) 2009-12-30 2021-03-02 Koninklijke Philips Eletronics N.V. método para formar imagem microscopicamente de uma amostra com um escaner, microscópio de escaneamento para formação de imagem de uma amostra, uso de um sensor de disposição bidimensional e disposição para formação de imagem de um corte trasnversal oblíquio de uma amostra
FR2959902B1 (fr) * 2010-05-04 2013-08-23 E2V Semiconductors Capteur d'image lineaire a defilement et sommation analogique et numerique et procede correspondant
EP2715321A4 (de) * 2011-05-25 2014-10-29 Huron Technologies Internat Inc 3d-krankheits-gleitscanner
WO2013040686A1 (en) * 2011-09-21 2013-03-28 Huron Technologies International Inc. Slide scanner with a tilted image plane

Also Published As

Publication number Publication date
EP3264745A1 (de) 2018-01-03
CN105814883A (zh) 2016-07-27
US10091445B2 (en) 2018-10-02
EP3085075A1 (de) 2016-10-26
JP2017500796A (ja) 2017-01-05
EP3264745B1 (de) 2019-07-17
CN105814883B (zh) 2019-06-18
JP2017216745A (ja) 2017-12-07
EP3085075B1 (de) 2017-08-30
WO2015091300A1 (en) 2015-06-25
JP6541275B2 (ja) 2019-07-10
US20160373678A1 (en) 2016-12-22

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