JP6194776B2 - 分光測定装置及び分光測定方法 - Google Patents

分光測定装置及び分光測定方法 Download PDF

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JP6194776B2
JP6194776B2 JP2013247384A JP2013247384A JP6194776B2 JP 6194776 B2 JP6194776 B2 JP 6194776B2 JP 2013247384 A JP2013247384 A JP 2013247384A JP 2013247384 A JP2013247384 A JP 2013247384A JP 6194776 B2 JP6194776 B2 JP 6194776B2
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measurement
light
timing
amount
light source
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JP2015105857A5 (enExample
JP2015105857A (ja
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漆谷　多二男
多二男 漆谷
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Seiko Epson Corp
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Seiko Epson Corp
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JP2013247384A 2013-11-29 2013-11-29 分光測定装置及び分光測定方法 Active JP6194776B2 (ja)

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JP2013247384A JP6194776B2 (ja) 2013-11-29 2013-11-29 分光測定装置及び分光測定方法

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JP2013247384A JP6194776B2 (ja) 2013-11-29 2013-11-29 分光測定装置及び分光測定方法

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JP2015105857A JP2015105857A (ja) 2015-06-08
JP2015105857A5 JP2015105857A5 (enExample) 2016-12-22
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Families Citing this family (1)

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Publication number Priority date Publication date Assignee Title
JP6601007B2 (ja) * 2015-06-18 2019-11-06 セイコーエプソン株式会社 分光測定装置、画像形成装置、及び分光測定方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1019678A (ja) * 1996-06-28 1998-01-23 Shimadzu Corp 分光光度計
JPH10185686A (ja) * 1996-12-26 1998-07-14 Shimadzu Corp 分光光度計
JPH11101692A (ja) * 1997-09-29 1999-04-13 Shimadzu Corp 分光測色装置
JP3453112B2 (ja) * 2000-08-01 2003-10-06 大塚電子株式会社 光学自動測定方法
JP2004170325A (ja) * 2002-11-22 2004-06-17 Shimadzu Corp 分光計測装置
DE102004048102A1 (de) * 2004-04-30 2006-04-20 Carl Zeiss Jena Gmbh Spektrometrischer Messkopf und Verfahren zu dessen Rekalibrierung
JP2006078409A (ja) * 2004-09-13 2006-03-23 Olympus Corp 分光光度計及び分光方法
JP5109482B2 (ja) * 2007-05-31 2012-12-26 コニカミノルタオプティクス株式会社 反射特性測定装置及び反射特性測定装置の校正方法
JP2013096883A (ja) * 2011-11-02 2013-05-20 Seiko Epson Corp 分光測定装置

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