JP6186166B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP6186166B2
JP6186166B2 JP2013096136A JP2013096136A JP6186166B2 JP 6186166 B2 JP6186166 B2 JP 6186166B2 JP 2013096136 A JP2013096136 A JP 2013096136A JP 2013096136 A JP2013096136 A JP 2013096136A JP 6186166 B2 JP6186166 B2 JP 6186166B2
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JP
Japan
Prior art keywords
insulating layer
layer
oxide semiconductor
transistor
film
Prior art date
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Expired - Fee Related
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JP2013096136A
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English (en)
Japanese (ja)
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JP2013251536A5 (enExample
JP2013251536A (ja
Inventor
慎也 笹川
慎也 笹川
一哉 花岡
一哉 花岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2013096136A priority Critical patent/JP6186166B2/ja
Publication of JP2013251536A publication Critical patent/JP2013251536A/ja
Publication of JP2013251536A5 publication Critical patent/JP2013251536A5/ja
Application granted granted Critical
Publication of JP6186166B2 publication Critical patent/JP6186166B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Electrodes Of Semiconductors (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Thin Film Transistor (AREA)
  • Liquid Crystal (AREA)
JP2013096136A 2012-05-02 2013-05-01 半導体装置 Expired - Fee Related JP6186166B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013096136A JP6186166B2 (ja) 2012-05-02 2013-05-01 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012105034 2012-05-02
JP2012105034 2012-05-02
JP2013096136A JP6186166B2 (ja) 2012-05-02 2013-05-01 半導体装置

Publications (3)

Publication Number Publication Date
JP2013251536A JP2013251536A (ja) 2013-12-12
JP2013251536A5 JP2013251536A5 (enExample) 2016-04-14
JP6186166B2 true JP6186166B2 (ja) 2017-08-23

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ID=49849895

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013096136A Expired - Fee Related JP6186166B2 (ja) 2012-05-02 2013-05-01 半導体装置

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JP (1) JP6186166B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6402017B2 (ja) * 2013-12-26 2018-10-10 株式会社半導体エネルギー研究所 半導体装置
TWI637484B (zh) 2013-12-26 2018-10-01 日商半導體能源研究所股份有限公司 半導體裝置
JP6523695B2 (ja) * 2014-02-05 2019-06-05 株式会社半導体エネルギー研究所 半導体装置
US10204898B2 (en) * 2014-08-08 2019-02-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
WO2016038823A1 (ja) * 2014-09-10 2016-03-17 株式会社Joled 薄膜トランジスタ及び薄膜トランジスタの製造方法
TWI718125B (zh) 2015-03-03 2021-02-11 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
JP7022592B2 (ja) * 2018-01-11 2022-02-18 株式会社ジャパンディスプレイ 表示装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005116977A (ja) * 2003-10-10 2005-04-28 Sharp Corp 薄膜トランジスタおよびその製造方法
JP3919198B2 (ja) * 2004-05-28 2007-05-23 株式会社半導体エネルギー研究所 電気光学装置を備えたテレビ及びコンピュータ
US7378286B2 (en) * 2004-08-20 2008-05-27 Sharp Laboratories Of America, Inc. Semiconductive metal oxide thin film ferroelectric memory transistor
JP4971593B2 (ja) * 2005-01-11 2012-07-11 ラピスセミコンダクタ株式会社 半導体装置の製造方法
JP2006253307A (ja) * 2005-03-09 2006-09-21 Sharp Corp 半導体素子及びその製造方法並びに液晶表示装置
JP5503895B2 (ja) * 2008-04-25 2014-05-28 株式会社半導体エネルギー研究所 半導体装置
JP4623179B2 (ja) * 2008-09-18 2011-02-02 ソニー株式会社 薄膜トランジスタおよびその製造方法
WO2011096277A1 (en) * 2010-02-05 2011-08-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of driving semiconductor device
US8519387B2 (en) * 2010-07-26 2013-08-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing

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JP2013251536A (ja) 2013-12-12

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