JP6124107B2 - 検出対象物の測定方法 - Google Patents

検出対象物の測定方法 Download PDF

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JP6124107B2
JP6124107B2 JP2012187102A JP2012187102A JP6124107B2 JP 6124107 B2 JP6124107 B2 JP 6124107B2 JP 2012187102 A JP2012187102 A JP 2012187102A JP 2012187102 A JP2012187102 A JP 2012187102A JP 6124107 B2 JP6124107 B2 JP 6124107B2
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JP2014044135A (ja
JP2014044135A5 (https=
Inventor
仁 後藤
仁 後藤
美幸 丸橋
美幸 丸橋
綾子 長尾
綾子 長尾
平岡　忠志
忠志 平岡
寺田　賢治
賢治 寺田
宏祐 服部
宏祐 服部
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University of Tokushima NUC
NTT AT Creative Corp
Tokushima Prefectural Government
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University of Tokushima NUC
NTT AT Creative Corp
Tokushima Prefectural Government
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JP2012187102A 2012-08-28 2012-08-28 検出対象物の測定方法 Active JP6124107B2 (ja)

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JP2012187102A JP6124107B2 (ja) 2012-08-28 2012-08-28 検出対象物の測定方法

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JP2012187102A JP6124107B2 (ja) 2012-08-28 2012-08-28 検出対象物の測定方法

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JP2014044135A JP2014044135A (ja) 2014-03-13
JP2014044135A5 JP2014044135A5 (https=) 2015-09-17
JP6124107B2 true JP6124107B2 (ja) 2017-05-10

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111080146A (zh) * 2019-12-20 2020-04-28 武汉羽芒智能科技有限公司 一种智能材料性能分析仪器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
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KR101582461B1 (ko) * 2014-10-22 2016-01-05 주식회사 제덱스 클린룸의 표면 입자 검출용 시험 필름
IT201900002491A1 (it) 2019-02-20 2020-08-20 Kraft Foods Group Brands Llc Sistema di analisi di gas
KR102835745B1 (ko) * 2022-04-08 2025-07-18 주식회사 씨브이아이 광학필름 검사 방법

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JPS6258735U (https=) * 1985-10-02 1987-04-11
JPH0830675B2 (ja) * 1987-01-26 1996-03-27 清水建設株式会社 超清浄度の評価方法および該評価方法に使用される測定装置
JPH08190633A (ja) * 1995-01-06 1996-07-23 Hitachi Metals Ltd 欠陥判別方法
KR100257904B1 (ko) * 1997-12-29 2000-06-01 윤종용 클린룸의 환경평가 시스템
JP2003294621A (ja) * 2002-04-03 2003-10-15 Canon Inc 微細粒量の解析手法
JP3607258B2 (ja) * 2002-04-10 2005-01-05 新日本空調株式会社 ダクト内汚染の診断方法
JP3945770B2 (ja) * 2003-03-31 2007-07-18 財団法人北九州産業学術推進機構 浮遊微粒子分析方法及びそれに用いられる浮遊微粒子捕集装置
JP2005062018A (ja) * 2003-08-14 2005-03-10 Nitto Denko Corp 異物検査用部材およびこれを用いた異物検査方法
JP2005065624A (ja) * 2003-08-26 2005-03-17 Nitto Denko Corp 微生物量の測定方法およびキット
JP2007304065A (ja) * 2006-05-15 2007-11-22 Omron Corp 異物検出装置、異物検出方法、異物検出プログラム、および該プログラムが記録された記録媒体
JP2008020241A (ja) * 2006-07-11 2008-01-31 Ryoko Denki Kk 微粒子計測方式
CN101903463B (zh) * 2007-12-27 2013-03-20 三井化学株式会社 丙烯类聚合物组合物
JP2012073237A (ja) * 2010-08-31 2012-04-12 Hitachi Computer Peripherals Co Ltd 透明シート上粒子情報読取装置及び透明シート上粒子情報読取方法
JP5648399B2 (ja) * 2010-09-29 2015-01-07 凸版印刷株式会社 塵埃モニター用キット、およびそれを用いた評価方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111080146A (zh) * 2019-12-20 2020-04-28 武汉羽芒智能科技有限公司 一种智能材料性能分析仪器

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