JP6112872B2 - 撮像システム、画像処理方法、および撮像装置 - Google Patents
撮像システム、画像処理方法、および撮像装置 Download PDFInfo
- Publication number
- JP6112872B2 JP6112872B2 JP2013007453A JP2013007453A JP6112872B2 JP 6112872 B2 JP6112872 B2 JP 6112872B2 JP 2013007453 A JP2013007453 A JP 2013007453A JP 2013007453 A JP2013007453 A JP 2013007453A JP 6112872 B2 JP6112872 B2 JP 6112872B2
- Authority
- JP
- Japan
- Prior art keywords
- imaging
- optical system
- specimen
- image
- illumination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Microscoopes, Condenser (AREA)
- Studio Devices (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013007453A JP6112872B2 (ja) | 2013-01-18 | 2013-01-18 | 撮像システム、画像処理方法、および撮像装置 |
| US14/441,598 US9904046B2 (en) | 2013-01-18 | 2013-12-24 | Image pickup apparatus, image pickup system, and image processing method |
| PCT/JP2013/085308 WO2014112324A1 (en) | 2013-01-18 | 2013-12-24 | Image pickup apparatus, image pickup system, and image processing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013007453A JP6112872B2 (ja) | 2013-01-18 | 2013-01-18 | 撮像システム、画像処理方法、および撮像装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014137558A JP2014137558A (ja) | 2014-07-28 |
| JP2014137558A5 JP2014137558A5 (enExample) | 2016-02-25 |
| JP6112872B2 true JP6112872B2 (ja) | 2017-04-12 |
Family
ID=51209426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013007453A Expired - Fee Related JP6112872B2 (ja) | 2013-01-18 | 2013-01-18 | 撮像システム、画像処理方法、および撮像装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9904046B2 (enExample) |
| JP (1) | JP6112872B2 (enExample) |
| WO (1) | WO2014112324A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015052663A (ja) * | 2013-09-06 | 2015-03-19 | キヤノン株式会社 | 画像処理方法、画像処理装置、撮像装置およびプログラム |
| FR3013128B1 (fr) * | 2013-11-13 | 2016-01-01 | Univ Aix Marseille | Dispositif et methode de mise au point tridimensionnelle pour microscope |
| JP2015187705A (ja) * | 2014-03-13 | 2015-10-29 | キヤノン株式会社 | 画像取得装置およびその制御方法 |
| US9818021B2 (en) * | 2014-10-21 | 2017-11-14 | Isra Surface Vision Gmbh | Method for determining a local refractive power and device therefor |
| JP6478579B2 (ja) * | 2014-11-20 | 2019-03-06 | キヤノン株式会社 | 撮像ユニット、撮像装置、及び画像処理システム |
| US9615022B2 (en) * | 2014-12-11 | 2017-04-04 | Conduent Business Services, Llc | High-resolution imaging devices using low-resolution sensors and compressive sensing exploiting joint sparsity |
| JP6376974B2 (ja) * | 2014-12-26 | 2018-08-22 | キヤノン株式会社 | 撮像装置及び撮像システム |
| JP6618786B2 (ja) * | 2015-11-17 | 2019-12-11 | キヤノンメディカルシステムズ株式会社 | 磁気共鳴イメージング装置及び画像処理装置 |
| US10539783B1 (en) * | 2016-10-17 | 2020-01-21 | National Technology & Engineering Solutions Of Sandia, Llc | Compressive sensing optical design and simulation tool |
| EP4022280B1 (fr) * | 2019-08-30 | 2025-06-25 | Centre national de la recherche scientifique | Méthode et dispositif de caractérisation optique de particules |
| WO2021064807A1 (ja) * | 2019-09-30 | 2021-04-08 | 株式会社ニコン | 顕微鏡装置、データ生成方法、およびプログラム |
| DE102022202954B4 (de) * | 2022-03-25 | 2024-01-18 | Siemens Healthcare Gmbh | Shim-Vorrichtung, Verfahren zur Verwendung der Shim-Vorrichtung und MR-Vorrichtung |
| DE102022126509A1 (de) * | 2022-10-12 | 2024-04-18 | Carl Zeiss Microscopy Gmbh | Verfahren zur Bestimmung der Phase und/oder Brechzahl eines Bereiches eines Objektes und Mikroskop zur Bestimmung der Phase und/oder Brechzahl eines Bereiches eines Objektes |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4200354A (en) * | 1974-09-05 | 1980-04-29 | Robert Hoffman | Microscopy systems with rectangular illumination particularly adapted for viewing transparent objects |
| JP2834741B2 (ja) * | 1988-07-26 | 1998-12-14 | オリンパス光学工業株式会社 | 顕微鏡 |
| DE4236803C2 (de) * | 1992-10-30 | 1996-03-21 | Leica Mikroskopie & Syst | Mikroskop für mikroskopisch zu untersuchende Amplituden- und/ oder Phasenobjekte |
| US5751475A (en) * | 1993-12-17 | 1998-05-12 | Olympus Optical Co., Ltd. | Phase contrast microscope |
| KR950033689A (ko) * | 1994-03-02 | 1995-12-26 | 오노 시게오 | 노광장치 및 이를 이용한 회로패턴 형성방법 |
| US5808791A (en) * | 1994-07-01 | 1998-09-15 | Olympus Optical Co., Ltd. | Microscope apparatus |
| JP4348574B2 (ja) * | 1998-04-30 | 2009-10-21 | 株式会社ニコン | 暗視野照明装置および暗視野照明方法 |
| JP4020714B2 (ja) * | 2001-08-09 | 2007-12-12 | オリンパス株式会社 | 顕微鏡 |
| US7084383B2 (en) * | 2002-06-03 | 2006-08-01 | Olympus Corporation | Image processing apparatus |
| JP4222877B2 (ja) * | 2003-05-28 | 2009-02-12 | オリンパス株式会社 | 顕微鏡観察方法及びそれに用いる顕微鏡 |
| JP4820750B2 (ja) * | 2003-06-26 | 2011-11-24 | ダンマークス テクニスク ユニバーシテット | 複数の位相コントラストフィルタによる所望波面の生成 |
| WO2006003867A2 (ja) * | 2004-06-30 | 2006-01-12 | Nikon Corporation | 顕微鏡観察方法、顕微鏡装置、微分干渉顕微鏡装置、位相差顕微鏡装置、干渉顕微鏡装置、画像処理方法、及び画像処理装置 |
| US7532772B2 (en) | 2004-07-20 | 2009-05-12 | Duke University | Coding for compressive imaging |
| US7379170B2 (en) * | 2005-05-02 | 2008-05-27 | Invarium, Inc. | Apparatus and method for characterizing an image system in lithography projection tool |
| WO2008004679A1 (fr) * | 2006-07-04 | 2008-01-10 | Nikon Corporation | Dispositif à MICROSCOPE |
| US20100074486A1 (en) | 2006-11-22 | 2010-03-25 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V., A Corporation Of Germany | Reconstruction and visualization of neuronal cell structures with bright-field mosaic microscopy |
| JP4402145B2 (ja) * | 2007-10-03 | 2010-01-20 | キヤノン株式会社 | 算出方法、生成方法、プログラム、露光方法及び原版作成方法 |
| WO2009153919A1 (ja) * | 2008-06-17 | 2009-12-23 | 株式会社ニコン | 顕微鏡装置および顕微鏡装置制御プログラム |
| JP5086926B2 (ja) * | 2008-07-15 | 2012-11-28 | キヤノン株式会社 | 算出方法、プログラム及び露光方法 |
| JP5351976B2 (ja) * | 2008-12-09 | 2013-11-27 | ザイゴ コーポレーション | 二重グレーチング横方向シアリング波面センサ |
| JP5733670B2 (ja) * | 2010-04-05 | 2015-06-10 | 国立大学法人大阪大学 | 観察装置及び観察方法 |
| DE102010029281A1 (de) | 2010-05-25 | 2011-12-01 | Siemens Aktiengesellschaft | Verfahren und Bildrekonstruktionseinrichtung zur Rekonstruktion von Bilddaten |
| JP2012008260A (ja) * | 2010-06-23 | 2012-01-12 | Hamamatsu Photonics Kk | 画像生成装置 |
| DE102010026205A1 (de) * | 2010-07-06 | 2012-01-12 | Carl Zeiss Microlmaging Gmbh | Mikroskop, insbesondere Fluoreszenzmikroskop, dichroitischer Strahlteiler und dessen Verwendung |
| TWI427347B (zh) * | 2010-07-28 | 2014-02-21 | Univ Nat Chiao Tung | 光學成像系統 |
| JP5814684B2 (ja) | 2010-09-03 | 2015-11-17 | オリンパス株式会社 | 位相物体の可視化方法及び可視化装置 |
| JP5412394B2 (ja) * | 2010-09-30 | 2014-02-12 | オリンパス株式会社 | 標本観察装置 |
| JP5721042B2 (ja) * | 2010-10-20 | 2015-05-20 | 株式会社ニコン | 顕微鏡システム |
| JP5757458B2 (ja) * | 2011-04-12 | 2015-07-29 | 株式会社ニコン | 顕微鏡システム、サーバー及びプログラム |
| US9055248B2 (en) * | 2011-05-02 | 2015-06-09 | Sony Corporation | Infrared imaging system and method of operating |
| JP5804441B2 (ja) * | 2011-05-18 | 2015-11-04 | 株式会社ニコン | 顕微鏡システム |
| JP2013029806A (ja) * | 2011-06-22 | 2013-02-07 | Canon Inc | 撮像装置 |
| US20130002715A1 (en) * | 2011-06-28 | 2013-01-03 | Tidman James M | Image Sequence Reconstruction based on Overlapping Measurement Subsets |
| JP5882072B2 (ja) * | 2012-02-06 | 2016-03-09 | 株式会社日立ハイテクノロジーズ | 欠陥観察方法及びその装置 |
| US9518916B1 (en) * | 2013-10-18 | 2016-12-13 | Kla-Tencor Corporation | Compressive sensing for metrology |
-
2013
- 2013-01-18 JP JP2013007453A patent/JP6112872B2/ja not_active Expired - Fee Related
- 2013-12-24 US US14/441,598 patent/US9904046B2/en not_active Expired - Fee Related
- 2013-12-24 WO PCT/JP2013/085308 patent/WO2014112324A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2014112324A1 (en) | 2014-07-24 |
| US20150309300A1 (en) | 2015-10-29 |
| US9904046B2 (en) | 2018-02-27 |
| JP2014137558A (ja) | 2014-07-28 |
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