JP6044385B2 - タンデム型質量分析装置 - Google Patents

タンデム型質量分析装置 Download PDF

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Publication number
JP6044385B2
JP6044385B2 JP2013035707A JP2013035707A JP6044385B2 JP 6044385 B2 JP6044385 B2 JP 6044385B2 JP 2013035707 A JP2013035707 A JP 2013035707A JP 2013035707 A JP2013035707 A JP 2013035707A JP 6044385 B2 JP6044385 B2 JP 6044385B2
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ions
ion
mass
cleavage
unit
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JP2014165053A (ja
JP2014165053A5 (cg-RX-API-DMAC7.html
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大輔 奥村
大輔 奥村
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2013035707A priority Critical patent/JP6044385B2/ja
Priority to US14/188,247 priority patent/US8866074B2/en
Priority to CN201410067755.3A priority patent/CN104007163B/zh
Publication of JP2014165053A publication Critical patent/JP2014165053A/ja
Publication of JP2014165053A5 publication Critical patent/JP2014165053A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2013035707A 2013-02-26 2013-02-26 タンデム型質量分析装置 Expired - Fee Related JP6044385B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013035707A JP6044385B2 (ja) 2013-02-26 2013-02-26 タンデム型質量分析装置
US14/188,247 US8866074B2 (en) 2013-02-26 2014-02-24 Tandem mass spectrometer and mass spectrometric method
CN201410067755.3A CN104007163B (zh) 2013-02-26 2014-02-26 串联质谱仪和质谱法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013035707A JP6044385B2 (ja) 2013-02-26 2013-02-26 タンデム型質量分析装置

Publications (3)

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JP2014165053A JP2014165053A (ja) 2014-09-08
JP2014165053A5 JP2014165053A5 (cg-RX-API-DMAC7.html) 2015-07-09
JP6044385B2 true JP6044385B2 (ja) 2016-12-14

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JP2013035707A Expired - Fee Related JP6044385B2 (ja) 2013-02-26 2013-02-26 タンデム型質量分析装置

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US (1) US8866074B2 (cg-RX-API-DMAC7.html)
JP (1) JP6044385B2 (cg-RX-API-DMAC7.html)
CN (1) CN104007163B (cg-RX-API-DMAC7.html)

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CN108878253B (zh) 2017-05-15 2020-06-23 株式会社岛津制作所 质谱数据采集方法
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CN113631920B (zh) 2019-05-31 2024-04-26 Dh科技发展私人贸易有限公司 用于前体推理的扫描带数据和概率框架的实时编码的方法
KR102872760B1 (ko) 2019-09-25 2025-10-16 더 트러스티즈 오브 인디애나 유니버시티 펄스 모드 전하 검출 질량 분석을 위한 장치 및 방법
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CN113948365B (zh) * 2020-07-15 2025-02-07 宁波大学 一种复合式质谱仪
CN113406182B (zh) * 2021-06-30 2024-10-11 昆山禾信质谱技术有限公司 串联质谱设备和质谱检测系统
CN116344323A (zh) * 2021-12-17 2023-06-27 昆山禾信质谱技术有限公司 串级质谱系统及质谱设备

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Also Published As

Publication number Publication date
JP2014165053A (ja) 2014-09-08
US20140239170A1 (en) 2014-08-28
CN104007163B (zh) 2016-09-28
US8866074B2 (en) 2014-10-21
CN104007163A (zh) 2014-08-27

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