JP5993259B2 - 質量分析システム - Google Patents

質量分析システム Download PDF

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Publication number
JP5993259B2
JP5993259B2 JP2012202786A JP2012202786A JP5993259B2 JP 5993259 B2 JP5993259 B2 JP 5993259B2 JP 2012202786 A JP2012202786 A JP 2012202786A JP 2012202786 A JP2012202786 A JP 2012202786A JP 5993259 B2 JP5993259 B2 JP 5993259B2
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JP
Japan
Prior art keywords
mass spectrum
correction
reliability
mass
spectrum
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JP2012202786A
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English (en)
Japanese (ja)
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JP2014059964A5 (enExample
JP2014059964A (ja
Inventor
洋平 川口
洋平 川口
益之 杉山
益之 杉山
和茂 西村
和茂 西村
明人 金子
明人 金子
峻 熊野
峻 熊野
真人 戸上
真人 戸上
橋本　雄一郎
雄一郎 橋本
益義 山田
益義 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2012202786A priority Critical patent/JP5993259B2/ja
Priority to PCT/JP2013/068837 priority patent/WO2014041886A1/ja
Publication of JP2014059964A publication Critical patent/JP2014059964A/ja
Publication of JP2014059964A5 publication Critical patent/JP2014059964A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4265—Controlling the number of trapped ions; preventing space charge effects

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2012202786A 2012-09-14 2012-09-14 質量分析システム Active JP5993259B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012202786A JP5993259B2 (ja) 2012-09-14 2012-09-14 質量分析システム
PCT/JP2013/068837 WO2014041886A1 (ja) 2012-09-14 2013-07-10 質量分析システム及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012202786A JP5993259B2 (ja) 2012-09-14 2012-09-14 質量分析システム

Publications (3)

Publication Number Publication Date
JP2014059964A JP2014059964A (ja) 2014-04-03
JP2014059964A5 JP2014059964A5 (enExample) 2015-03-19
JP5993259B2 true JP5993259B2 (ja) 2016-09-14

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ID=50278017

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012202786A Active JP5993259B2 (ja) 2012-09-14 2012-09-14 質量分析システム

Country Status (2)

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JP (1) JP5993259B2 (enExample)
WO (1) WO2014041886A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11798795B2 (en) 2018-02-05 2023-10-24 Shimadzu Corporation Mass spectrometer and mass calibration method in mass spectrometer
JP6783263B2 (ja) 2018-03-19 2020-11-11 日本電子株式会社 質量分析装置
JP7380501B2 (ja) * 2020-09-30 2023-11-15 株式会社島津製作所 分子構造解析システム及び分子構造解析方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0381660A (ja) * 1989-08-24 1991-04-08 Shimadzu Corp 質量分析計を用いた選択イオン検出方法
JPH08212969A (ja) * 1995-02-08 1996-08-20 Hitachi Ltd 質量分析計データ処理装置
JPH1183803A (ja) * 1997-09-01 1999-03-26 Hitachi Ltd マスマーカーの補正方法
US6884996B2 (en) * 2003-06-04 2005-04-26 Thermo Finnigan Llc Space charge adjustment of activation frequency
JP2005251594A (ja) * 2004-03-05 2005-09-15 Hitachi High-Technologies Corp イオントラップ／飛行時間型質量分析計
JP4636943B2 (ja) * 2005-06-06 2011-02-23 株式会社日立ハイテクノロジーズ 質量分析装置
US20080302957A1 (en) * 2007-06-02 2008-12-11 Yongdong Wang Identifying ions from mass spectral data
JP4985153B2 (ja) * 2007-07-03 2012-07-25 株式会社島津製作所 クロマトグラフ質量分析装置

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Publication number Publication date
WO2014041886A1 (ja) 2014-03-20
JP2014059964A (ja) 2014-04-03

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