JP5955033B2 - イオン化方法、質量分析方法、抽出方法及び精製方法 - Google Patents

イオン化方法、質量分析方法、抽出方法及び精製方法 Download PDF

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Publication number
JP5955033B2
JP5955033B2 JP2012045922A JP2012045922A JP5955033B2 JP 5955033 B2 JP5955033 B2 JP 5955033B2 JP 2012045922 A JP2012045922 A JP 2012045922A JP 2012045922 A JP2012045922 A JP 2012045922A JP 5955033 B2 JP5955033 B2 JP 5955033B2
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substrate
liquid
probe
ionization method
voltage
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Japanese (ja)
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JP2013181841A (ja
JP2013181841A5 (cg-RX-API-DMAC7.html
Inventor
大塚　洋一
洋一 大塚
隆一 荒川
隆一 荒川
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2012045922A priority Critical patent/JP5955033B2/ja
Priority to PCT/JP2013/001237 priority patent/WO2013128933A1/ja
Priority to EP13754786.5A priority patent/EP2822023A4/en
Priority to CN201380022088.0A priority patent/CN104254902A/zh
Priority to US13/972,063 priority patent/US9190257B2/en
Publication of JP2013181841A publication Critical patent/JP2013181841A/ja
Publication of JP2013181841A5 publication Critical patent/JP2013181841A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0454—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
JP2012045922A 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法 Active JP5955033B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2012045922A JP5955033B2 (ja) 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法
PCT/JP2013/001237 WO2013128933A1 (ja) 2012-03-01 2013-02-28 イオン化方法、質量分析方法、抽出方法及び精製方法
EP13754786.5A EP2822023A4 (en) 2012-03-01 2013-02-28 IONIZATION PROCESS, MASS SPECTROMETRY PROCESS, EXTRACTION METHOD AND CLEANING METHOD
CN201380022088.0A CN104254902A (zh) 2012-03-01 2013-02-28 离子化方法、质谱分析方法、提取方法和提纯方法
US13/972,063 US9190257B2 (en) 2012-03-01 2013-08-21 Ionization method, mass spectrometry method, extraction method, and purification method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012045922A JP5955033B2 (ja) 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法

Publications (3)

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JP2013181841A JP2013181841A (ja) 2013-09-12
JP2013181841A5 JP2013181841A5 (cg-RX-API-DMAC7.html) 2015-04-09
JP5955033B2 true JP5955033B2 (ja) 2016-07-20

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US (1) US9190257B2 (cg-RX-API-DMAC7.html)
EP (1) EP2822023A4 (cg-RX-API-DMAC7.html)
JP (1) JP5955033B2 (cg-RX-API-DMAC7.html)
CN (1) CN104254902A (cg-RX-API-DMAC7.html)
WO (1) WO2013128933A1 (cg-RX-API-DMAC7.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5955032B2 (ja) 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
JP6339883B2 (ja) 2013-08-02 2018-06-06 キヤノン株式会社 イオン化装置、それを有する質量分析装置及び画像作成システム
US9230787B2 (en) 2013-08-02 2016-01-05 Canon Kabushiki Kaisha Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system
JP6423878B2 (ja) * 2013-08-07 2018-11-14 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 液体サンプルのための増大された噴霧形成
US9390901B2 (en) * 2014-10-31 2016-07-12 Ut-Battelle, Llc System and method for liquid extraction electrospray-assisted sample transfer to solution for chemical analysis
GB201522594D0 (en) * 2015-12-22 2016-02-03 Micromass Ltd Secondary ultrasonic nebulisation
CN108663437B (zh) * 2018-06-19 2020-11-27 苏州芷宁信息科技有限公司 一种快速筛查标的物的方法

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DE69229914T2 (de) * 1991-05-21 2000-04-20 Analytica Of Brandford, Inc. Verfahren und Apparat zur Verbesserung der Sprühionisation von gelösten Stoffen
US5945678A (en) 1996-05-21 1999-08-31 Hamamatsu Photonics K.K. Ionizing analysis apparatus
JPH10112279A (ja) 1996-10-07 1998-04-28 Hamamatsu Photonics Kk イオン化分析装置
JPH09306417A (ja) * 1996-05-21 1997-11-28 Hamamatsu Photonics Kk イオン化分析装置
JP5057318B2 (ja) * 1999-12-30 2012-10-24 アドビオン インコーポレイテッド 多重電気噴霧装置、システム、および方法
US6566653B1 (en) * 2002-01-23 2003-05-20 International Business Machines Corporation Investigation device and method
JP4167593B2 (ja) * 2002-01-31 2008-10-15 株式会社日立ハイテクノロジーズ エレクトロスプレイイオン化質量分析装置及びその方法
US6803566B2 (en) * 2002-04-16 2004-10-12 Ut-Battelle, Llc Sampling probe for microarray read out using electrospray mass spectrometry
JP3870870B2 (ja) * 2002-07-29 2007-01-24 株式会社日立製作所 溶液の質量分析に関する方法と装置
JP4862167B2 (ja) * 2006-04-28 2012-01-25 国立大学法人山梨大学 エレクトロスプレーによるイオン化方法および装置
CN101464427B (zh) * 2007-12-21 2012-07-25 清华大学 敞开式喷雾场解吸离子化方法及离子化装置
US20100224013A1 (en) * 2009-03-05 2010-09-09 Van Berkel Gary J Method and system for formation and withdrawal of a sample from a surface to be analyzed
WO2011060369A1 (en) 2009-11-13 2011-05-19 Goodlett David R Ions generated by surface acoustic wave device detected by mass spectrometry
US8097845B2 (en) * 2010-03-11 2012-01-17 Battelle Memorial Institute Focused analyte spray emission apparatus and process for mass spectrometric analysis
JP5955032B2 (ja) * 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
US9269557B2 (en) * 2012-09-07 2016-02-23 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
US9058966B2 (en) * 2012-09-07 2015-06-16 Canon Kabushiki Kaisha Ionization device, mass spectrometer including ionization device, image display system including mass spectrometer, and analysis method
US20140072476A1 (en) * 2012-09-07 2014-03-13 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system
US20140070089A1 (en) * 2012-09-07 2014-03-13 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
US8710436B2 (en) * 2012-09-07 2014-04-29 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
JP6339883B2 (ja) * 2013-08-02 2018-06-06 キヤノン株式会社 イオン化装置、それを有する質量分析装置及び画像作成システム
JP2015032463A (ja) * 2013-08-02 2015-02-16 キヤノン株式会社 質量分析装置、質量分析方法および画像化システム

Also Published As

Publication number Publication date
JP2013181841A (ja) 2013-09-12
EP2822023A1 (en) 2015-01-07
US20130334030A1 (en) 2013-12-19
CN104254902A (zh) 2014-12-31
WO2013128933A1 (ja) 2013-09-06
US9190257B2 (en) 2015-11-17
EP2822023A4 (en) 2015-10-28

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