JP5948916B2 - 分光計測方法、および分光計測器 - Google Patents

分光計測方法、および分光計測器 Download PDF

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JP5948916B2
JP5948916B2 JP2012020756A JP2012020756A JP5948916B2 JP 5948916 B2 JP5948916 B2 JP 5948916B2 JP 2012020756 A JP2012020756 A JP 2012020756A JP 2012020756 A JP2012020756 A JP 2012020756A JP 5948916 B2 JP5948916 B2 JP 5948916B2
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spectrum
measurement
matrix
light
measurement spectrum
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JP2013160555A5 (enExample
JP2013160555A (ja
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荒井 佳文
佳文 荒井
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Seiko Epson Corp
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Seiko Epson Corp
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JP2012020756A 2012-02-02 2012-02-02 分光計測方法、および分光計測器 Active JP5948916B2 (ja)

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JP2013065927A Division JP5842849B2 (ja) 2013-03-27 2013-03-27 光スペクトル変換方法、および光スペクトル変換装置

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JP2013160555A5 JP2013160555A5 (enExample) 2015-03-12
JP5948916B2 true JP5948916B2 (ja) 2016-07-06

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Publication number Priority date Publication date Assignee Title
JP6683201B2 (ja) * 2015-05-14 2020-04-15 コニカミノルタ株式会社 分光測色装置、および変換ルール設定方法
US10408681B2 (en) 2015-05-14 2019-09-10 Konica Minolta, Inc. Spectrocolorimetric device and spectral reflectance calculating method
DE102018133152A1 (de) * 2018-12-20 2020-06-25 Endress+Hauser Conducta Gmbh+Co. Kg Verfahren zur Kalibrierung eines Spektrometers
JP7207124B2 (ja) * 2019-04-16 2023-01-18 セイコーエプソン株式会社 校正装置、校正方法、分光カメラ、及び表示装置

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JP2948855B2 (ja) * 1990-03-16 1999-09-13 オリンパス光学工業株式会社 色識別装置
JPH1194735A (ja) * 1997-09-22 1999-04-09 Horiba Ltd 分光光度測定と多変量解析法とを用いた試料特性の定量分析装置およびその定量分析装置を用いた分析方法。
JP2000241346A (ja) * 1999-02-22 2000-09-08 Chino Corp 光学的測定装置
JP2004336657A (ja) * 2003-05-12 2004-11-25 Minolta Co Ltd 分光画像撮影システムおよび分光画像撮影システムの調整方法
JP5440110B2 (ja) * 2009-03-30 2014-03-12 株式会社リコー 分光特性取得装置、分光特性取得方法、画像評価装置、及び画像形成装置

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