JP5935492B2 - 光学デバイス及び検出装置 - Google Patents

光学デバイス及び検出装置 Download PDF

Info

Publication number
JP5935492B2
JP5935492B2 JP2012104462A JP2012104462A JP5935492B2 JP 5935492 B2 JP5935492 B2 JP 5935492B2 JP 2012104462 A JP2012104462 A JP 2012104462A JP 2012104462 A JP2012104462 A JP 2012104462A JP 5935492 B2 JP5935492 B2 JP 5935492B2
Authority
JP
Japan
Prior art keywords
organic molecular
film
light
optical device
metal particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2012104462A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013231686A (ja
JP2013231686A5 (enExample
Inventor
裕介 坂上
裕介 坂上
山田 耕平
耕平 山田
明子 佐藤
明子 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2012104462A priority Critical patent/JP5935492B2/ja
Priority to CN201380022692.3A priority patent/CN104272090A/zh
Priority to PCT/JP2013/002722 priority patent/WO2013164904A1/ja
Priority to US14/398,078 priority patent/US20150131092A1/en
Publication of JP2013231686A publication Critical patent/JP2013231686A/ja
Publication of JP2013231686A5 publication Critical patent/JP2013231686A5/ja
Application granted granted Critical
Publication of JP5935492B2 publication Critical patent/JP5935492B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • G01N21/658Raman scattering enhancement Raman, e.g. surface plasmons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2012104462A 2012-05-01 2012-05-01 光学デバイス及び検出装置 Expired - Fee Related JP5935492B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012104462A JP5935492B2 (ja) 2012-05-01 2012-05-01 光学デバイス及び検出装置
CN201380022692.3A CN104272090A (zh) 2012-05-01 2013-04-23 光学装置以及检测装置
PCT/JP2013/002722 WO2013164904A1 (ja) 2012-05-01 2013-04-23 光学デバイス及び検出装置
US14/398,078 US20150131092A1 (en) 2012-05-01 2013-04-23 Optical device and detection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012104462A JP5935492B2 (ja) 2012-05-01 2012-05-01 光学デバイス及び検出装置

Publications (3)

Publication Number Publication Date
JP2013231686A JP2013231686A (ja) 2013-11-14
JP2013231686A5 JP2013231686A5 (enExample) 2015-05-21
JP5935492B2 true JP5935492B2 (ja) 2016-06-15

Family

ID=49514311

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012104462A Expired - Fee Related JP5935492B2 (ja) 2012-05-01 2012-05-01 光学デバイス及び検出装置

Country Status (4)

Country Link
US (1) US20150131092A1 (enExample)
JP (1) JP5935492B2 (enExample)
CN (1) CN104272090A (enExample)
WO (1) WO2013164904A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6201369B2 (ja) * 2013-03-28 2017-09-27 セイコーエプソン株式会社 検出装置及び電子機器
EP3187908A4 (en) * 2014-08-29 2018-05-09 National Institute for Materials Science Electromagnetic wave absorbing/radiating material, method for manufacturing same, and infrared source
JP6613736B2 (ja) * 2015-09-07 2019-12-04 セイコーエプソン株式会社 物質検出方法および物質検出装置
US10663395B2 (en) * 2015-11-18 2020-05-26 Radiometer Medical Aps Porous mirror for optical detection of an analyte in a fluid
TW201725385A (zh) * 2016-01-05 2017-07-16 財團法人工業技術研究院 具有薄層層析之拉曼檢測晶片及分離檢測分析物之方法
KR20190110595A (ko) * 2017-01-30 2019-09-30 알토 유니버시티 파운데이션 에스알 플라즈몬 장치
LU101354B1 (en) * 2019-08-19 2021-02-24 Luxembourg Inst Science & Tech List Quartz crystal microbalance with plasmonic sensing capacity
CN111830614A (zh) * 2020-05-13 2020-10-27 华南师范大学 利用激光偏振态实现纳米光栅刻印的解决方案
KR102501486B1 (ko) * 2020-12-10 2023-02-17 한국화학연구원 나노 입자 또는 나노 구조체에서 발생된 분광 신호 분석 시스템 및 분석 방법
CN113268866A (zh) * 2021-05-13 2021-08-17 国网山东省电力公司电力科学研究院 计算电场作用下c5f10o绝缘气体在铜表面吸附的方法
US11959859B2 (en) 2021-06-02 2024-04-16 Edwin Thomas Carlen Multi-gas detection system and method
CN115032168A (zh) * 2022-06-17 2022-09-09 京东方科技集团股份有限公司 流体的检测方法、系统、计算设备和存储介质

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8497131B2 (en) * 1999-10-06 2013-07-30 Becton, Dickinson And Company Surface enhanced spectroscopy-active composite nanoparticles comprising Raman-active reporter molecules
JP5167486B2 (ja) * 2005-06-09 2013-03-21 国立大学法人東京農工大学 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法
JP5175584B2 (ja) * 2008-03-13 2013-04-03 地方独立行政法人 東京都立産業技術研究センター 局所表面プラズモン共鳴イメージング装置
US8906111B2 (en) * 2008-07-02 2014-12-09 The University Of Tokyo Artificial bone material having controlled calcium ion elution
WO2010091293A1 (en) * 2009-02-06 2010-08-12 The Regents Of The University Of California Plasmonic system for detecting binding of biological molecules
US8415611B2 (en) * 2009-11-19 2013-04-09 Seiko Epson Corporation Sensor chip, sensor cartridge, and analysis apparatus
JP5589656B2 (ja) * 2009-12-11 2014-09-17 セイコーエプソン株式会社 センサーチップ、センサーカートリッジ及び分析装置
EP2372348A1 (en) * 2010-03-22 2011-10-05 Imec Methods and systems for surface enhanced optical detection
JP5939016B2 (ja) * 2012-04-27 2016-06-22 セイコーエプソン株式会社 光学デバイス及び検出装置
JP2014119263A (ja) * 2012-12-13 2014-06-30 Seiko Epson Corp 光学デバイス、検出装置、電子機器及び光学デバイスの製造方法

Also Published As

Publication number Publication date
WO2013164904A1 (ja) 2013-11-07
JP2013231686A (ja) 2013-11-14
US20150131092A1 (en) 2015-05-14
CN104272090A (zh) 2015-01-07

Similar Documents

Publication Publication Date Title
JP5935492B2 (ja) 光学デバイス及び検出装置
JP5939016B2 (ja) 光学デバイス及び検出装置
US8877519B2 (en) Chemical sensor element, sensing apparatus, and sensing method
CN102072878B (zh) 传感器芯片、传感器盒及分析装置
JP5609241B2 (ja) 分光方法及び分析装置
CN102401793B (zh) 光器件单元及检测装置
US8823941B2 (en) Detection device
CN102401794B (zh) 光器件单元及检测装置
JP2014119263A (ja) 光学デバイス、検出装置、電子機器及び光学デバイスの製造方法
US10996172B2 (en) Surface-functionalized nanostructures for molecular sensing applications
JP2015212626A (ja) 電場増強素子、ラマン分光法、ラマン分光装置、および電子機器
JP2015052463A (ja) ラマン分光装置、ラマン分光法、および電子機器
JP2013096939A (ja) 光デバイス及び検出装置
Canpean et al. Multifunctional plasmonic sensors on low-cost subwavelength metallic nanoholes arrays
CN103018211A (zh) 传感器芯片、传感器盒及分析装置
US20160223466A1 (en) Electric-field enhancement element, analysis device, and electronic apparatus
JP6418379B2 (ja) 電場増強素子、ラマン分光装置、および電子機器
JP2016003946A (ja) 電場増強素子、分析装置、及び電子機器
JP2013246115A (ja) 光学デバイス及び検出装置
JP2015141068A (ja) ラマン分光装置、及び電子機器
JP2013231685A (ja) 検出装置
JP2017211395A (ja) ラマン分光装置、ラマン分光法、および電子機器
JP6586867B2 (ja) 電場増強素子およびラマン分光装置
JP2016004018A (ja) ラマン分光装置および電子機器
JP2015096813A (ja) ラマン分光装置、及び電子機器

Legal Events

Date Code Title Description
RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20150107

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150403

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20150403

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160412

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160425

R150 Certificate of patent or registration of utility model

Ref document number: 5935492

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

LAPS Cancellation because of no payment of annual fees