JP5864721B2 - オブジェクトの電位を非接触で求めるための装置およびクランプメータ - Google Patents

オブジェクトの電位を非接触で求めるための装置およびクランプメータ Download PDF

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Publication number
JP5864721B2
JP5864721B2 JP2014504178A JP2014504178A JP5864721B2 JP 5864721 B2 JP5864721 B2 JP 5864721B2 JP 2014504178 A JP2014504178 A JP 2014504178A JP 2014504178 A JP2014504178 A JP 2014504178A JP 5864721 B2 JP5864721 B2 JP 5864721B2
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Japan
Prior art keywords
potential
electrode
unbekannt
electric field
ref
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JP2014504178A
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Japanese (ja)
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JP2014514558A (ja
Inventor
シマー ユルゲン
シマー ユルゲン
マクート イェンス
マクート イェンス
シャイプナー ディアク
シャイプナー ディアク
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Siemens AG
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Siemens AG
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2611—Measuring inductance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2014504178A 2011-04-14 2011-04-14 オブジェクトの電位を非接触で求めるための装置およびクランプメータ Expired - Fee Related JP5864721B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2011/055950 WO2012139650A1 (de) 2011-04-14 2011-04-14 Vorrichtung zur berührungslosen bestimmung eines elektrischen potentials eines objekts, stromzange sowie verfahren

Publications (2)

Publication Number Publication Date
JP2014514558A JP2014514558A (ja) 2014-06-19
JP5864721B2 true JP5864721B2 (ja) 2016-02-17

Family

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JP2014504178A Expired - Fee Related JP5864721B2 (ja) 2011-04-14 2011-04-14 オブジェクトの電位を非接触で求めるための装置およびクランプメータ

Country Status (5)

Country Link
US (1) US9664720B2 (de)
EP (1) EP2697659B1 (de)
JP (1) JP5864721B2 (de)
CN (1) CN103582821B (de)
WO (1) WO2012139650A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016212947B4 (de) 2016-07-15 2021-09-23 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung, System und Verfahren zur Aktivitätsdetektion
EP3428659A1 (de) * 2017-07-12 2019-01-16 LEM Intellectual Property SA Kontaktloser spannungswandler
US10802072B2 (en) * 2018-05-11 2020-10-13 Fluke Corporation Non-contact DC voltage measurement device with oscillating sensor
US20220050129A1 (en) * 2018-12-13 2022-02-17 G.L. McGavin Pty Ltd Non-contact detector
KR102073789B1 (ko) * 2019-07-05 2020-02-05 김태화 반도체 제조 장비용 펌프 백 스트림 방지 구조
CN113358913B (zh) * 2021-06-11 2022-03-08 南方电网数字电网研究院有限公司 电压检测装置和方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5436980A (en) * 1977-08-29 1979-03-19 Altec Corp Meterrdriving circuit
US4267511A (en) * 1977-11-09 1981-05-12 Canon Kabushiki Kaisha Surface potentiometer
GB2012058B (en) * 1977-12-21 1982-06-09 Canon Kk Surface potentiometer
US4611207A (en) 1983-10-31 1986-09-09 Niagara Mohawk Power Corporation Apparatus for monitoring voltage on a high voltage overhead transmission line
US4614908A (en) * 1984-04-13 1986-09-30 Xerox Corporation Microdeflector probe for electrostatic voltmeters
US4804922A (en) * 1985-11-01 1989-02-14 Energy Support Corporation Voltage sensor
US5151659A (en) * 1989-04-28 1992-09-29 Kabushiki Kaisha Toshiba Surface potential measuring system
DE4123309C2 (de) * 1991-07-13 2003-06-26 Haug Gmbh & Co Kg Feldstärkemeßgerät
US5473244A (en) * 1992-09-17 1995-12-05 Libove; Joel M. Apparatus for measuring voltages and currents using non-contacting sensors
JPH06242166A (ja) * 1993-02-19 1994-09-02 Tdk Corp 表面電位センサ
SE507933C2 (sv) * 1996-07-15 1998-07-27 Asea Brown Boveri Förfarande, anordning och sensor för att kapacitivt detektera fält och spänning samt användning därav
US6531880B1 (en) * 2000-07-03 2003-03-11 American Electric Power Company, Inc. Non-invasive cable tester
JP3761470B2 (ja) * 2001-04-04 2006-03-29 北斗電子工業株式会社 非接触電圧計測方法及び装置並びに検出プローブ
GB0129390D0 (en) * 2001-12-07 2002-01-30 Clark Terrence D Electrodynamic sensors and applications thereof
US7397233B2 (en) 2004-01-07 2008-07-08 Suparules Limited Voltage measuring device
US7098644B1 (en) * 2004-03-22 2006-08-29 Analog Devices, Inc. Non-contact high-voltage electrometer architecture with low-voltage feedback
JP4726741B2 (ja) * 2005-12-20 2011-07-20 日置電機株式会社 可変容量回路、電圧測定装置および電力測定装置
GB0614261D0 (en) * 2006-07-18 2006-08-30 Univ Sussex The Electric Potential Sensor
JP4995663B2 (ja) 2007-08-06 2012-08-08 日置電機株式会社 クランプ式センサ
FR2924814B1 (fr) * 2007-12-05 2010-02-12 Omegawatt Systeme de mesure sans contact de la puissance et de l'energie electrique
US8536879B2 (en) * 2008-06-02 2013-09-17 The Regents Of The University Of Michigan Rotating electric-field sensor
US8493053B2 (en) * 2009-12-18 2013-07-23 GRID20/20, Inc. System and device for measuring voltage in a conductor

Also Published As

Publication number Publication date
CN103582821B (zh) 2015-11-25
US9664720B2 (en) 2017-05-30
US20140145730A1 (en) 2014-05-29
EP2697659B1 (de) 2015-03-18
JP2014514558A (ja) 2014-06-19
CN103582821A (zh) 2014-02-12
EP2697659A1 (de) 2014-02-19
WO2012139650A1 (de) 2012-10-18

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