JP5855255B2 - 基板表面を処理する装置及び方法 - Google Patents
基板表面を処理する装置及び方法 Download PDFInfo
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- JP5855255B2 JP5855255B2 JP2014531113A JP2014531113A JP5855255B2 JP 5855255 B2 JP5855255 B2 JP 5855255B2 JP 2014531113 A JP2014531113 A JP 2014531113A JP 2014531113 A JP2014531113 A JP 2014531113A JP 5855255 B2 JP5855255 B2 JP 5855255B2
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- fluid
- substrate
- substrate processing
- processing surface
- immersion
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- 239000000758 substrate Substances 0.000 title claims description 78
- 238000000034 method Methods 0.000 title claims description 22
- 239000012530 fluid Substances 0.000 claims description 99
- 238000010438 heat treatment Methods 0.000 claims description 45
- 238000007654 immersion Methods 0.000 claims description 23
- 230000002093 peripheral effect Effects 0.000 claims description 22
- 238000007598 dipping method Methods 0.000 claims description 4
- 238000009991 scouring Methods 0.000 claims description 3
- 230000004308 accommodation Effects 0.000 claims 1
- 238000007599 discharging Methods 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 21
- 239000007788 liquid Substances 0.000 description 16
- 239000000126 substance Substances 0.000 description 10
- 238000004140 cleaning Methods 0.000 description 6
- 239000007789 gas Substances 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 230000001846 repelling effect Effects 0.000 description 3
- 239000012459 cleaning agent Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000011538 cleaning material Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 238000007704 wet chemistry method Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
1w 周壁
1r リング段部
2 下部
2w 周壁
2r リング段部
2l 軸受リング
2u 下面
3 軸受
3k 軸受
4 中空体
5 収容手段
5r 周縁部
5o 上縁
5a リング部
5b 槽底
5e 浸漬開口
5w 槽壁
6 排出部
8 流体
9 基板
9o 基板処理面
9a 保持面
9s 押流し面
11 押流し手段
11k 押流し用流体路
12 ステータ
12f 案内部
13 回転手段
13f 案内部
13s 端面
14 駆動手段
15 加熱室
16 加熱手段
17 加熱プレート
18 加熱体
19 浸漬手段
19e 浸漬側
19r 回転体
19s ウェブ
19f 押流し用流体管路
20 開口
21 流体捕集容器
21a 凹設領域
21b 底
22 位置固定手段
23 軸受蓋
23o 上面
D 回転軸線
W 槽壁角度
Claims (13)
- 流体(8)への基板処理面(9o)の浸漬により、流体(8)で基板(9)の基板処理面(9o)を処理する装置であって、
浸漬開口(5e)を有する、流体(8)を収容する収容手段(5)と、
前記浸漬開口(5e)を通して前記収容手段(5)に基板(9)の基板処理面(9o)を浸漬させる浸漬手段(19)と、
加熱プレート(17)を有する回転可能な加熱体(18)として構成された、流体(8)の温度を制御する加熱手段(16)と、
前記収容手段(5)から流体(8)の少なくとも大部分を排出するために前記収容手段(5)を回転させる回転手段(13)と、を備え、
前記浸漬手段(19)は、前記基板処理面(9o)とは反対側の保持面(9a)で前記基板(9)を位置固定する位置固定手段(22)を備えることを特徴とする、基板処理面を処理する装置。 - 前記収容手段(5)は、半径方向で折り曲げられた槽壁(5w)を有する、回転対称的な槽として構成されている、請求項1記載の装置。
- 前記槽は、リング状の流体捕集容器(21)に向けて流体(8)を導出するための、槽の形とは逆向きに湾曲された、回転手段(13)を覆う周縁部(5r)を備える、請求項2記載の装置。
- ステータ(12)により形成される前記流体捕集容器(21)は、底(21b)に、少なくとも1つの凹設領域(21a)に、前記流体捕集容器(21)の最深部に、制御可能な弁をそれぞれ有する少なくとも1つの排出部(6)を備える、請求項3記載の装置。
- 前記収容手段(5)は、前記周縁部(5r)の領域で、回転対称的な中空体として構成された前記回転手段(13)上に位置固定可能である、請求項3又は4記載の装置。
- ステータ内側で回転可能な前記回転手段(13)を保持するための、回転対称的な中空体として構成されたステータ(12)が設けられている、請求項4又は5記載の装置。
- 当該装置は、リング状の、前記ステータ(12)の内周に配置された案内部(12f)に沿った前記回転手段(13)の回転が、前記案内部(12f)と、前記回転手段(13)の、前記案内部(12f)に対応する案内部(13f)との間で玉軸受(3)により行われるように、構成されている、請求項6記載の装置。
- 前記浸漬手段(19)は、前記基板処理面(9o)の外側及び前記保持面(9a)の外側に残る押流し面(9s)を押流し用流体で流す押流し手段(11)を備える、請求項1から7までのいずれか1項記載の装置。
- 流体(8)で基板(9)の少なくとも1つの基板処理面(9o)を処理する方法であって、
浸漬手段(19)により前記基板処理面(9o)とは反対側の保持面(9a)で前記基板(9)を位置固定し保持するステップと、
流体(8)を収容する収容手段(5)に収容された流体(8)に前記基板処理面を浸漬するステップと、
加熱プレート(17)を有する回転可能な加熱体(18)として構成された加熱手段(16)により、流体(8)の温度を制御するステップと、
前記収容手段(5)から流体を排出して空状態にするために前記収容手段(5)を回転させるステップと、
を有することを特徴とする、基板処理面を処理する方法。 - 回転手段(13)をステータ(12)内で回転可能に保持し、
リング状の、前記ステータ(12)の内周に配置された案内部(12f)に沿った前記回転手段(13)の回転を、前記案内部(12f)と、前記回転手段(13)の、前記案内部(12f)に対応する案内部(13f)との間で玉軸受(3)により行う、請求項9記載の方法。 - 流体(8)の温度を、流体(8)の温度を制御する加熱手段(16)により、少なくとも前記基板処理面(9o)の浸漬中に制御する、請求項9又は10記載の方法。
- 少なくとも前記基板処理面(9o)の浸漬中に、前記基板処理面(9o)の外側及び前記基板処理面(9o)とは反対側の保持面(9a)の外側に残る押流し面(9s)の押流しを行う、請求項9から11までのいずれか1項記載の方法。
- 前記基板処理面(9o)を、前記基板(9)を保持する位置固定手段(22)により、少なくとも浸漬中に回転させる、請求項9から12までのいずれか1項記載の方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2011/066529 WO2013041144A1 (de) | 2011-09-22 | 2011-09-22 | Vorrichtung und verfahren zur behandlung von substratoberflächen |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014530497A JP2014530497A (ja) | 2014-11-17 |
JP5855255B2 true JP5855255B2 (ja) | 2016-02-09 |
Family
ID=44719909
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014531113A Active JP5855255B2 (ja) | 2011-09-22 | 2011-09-22 | 基板表面を処理する装置及び方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US9960058B2 (ja) |
EP (1) | EP2758991B1 (ja) |
JP (1) | JP5855255B2 (ja) |
KR (1) | KR101574034B1 (ja) |
CN (1) | CN103828032B (ja) |
SG (1) | SG2014009922A (ja) |
TW (1) | TWI574335B (ja) |
WO (1) | WO2013041144A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6418555B2 (ja) * | 2015-06-18 | 2018-11-07 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
KR102334138B1 (ko) * | 2019-10-10 | 2021-12-01 | 한미반도체 주식회사 | 반도체 자재 절단 장치 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03272140A (ja) * | 1990-03-22 | 1991-12-03 | Fujitsu Ltd | 半導体基板の薬品処理装置 |
US5946366A (en) | 1995-06-28 | 1999-08-31 | Siemens Aktiengesellschaft | Nuclear reactor with a collection chamber for core melt |
US5769945A (en) | 1996-06-21 | 1998-06-23 | Micron Technology, Inc. | Spin coating bowl exhaust system |
KR100277522B1 (ko) * | 1996-10-08 | 2001-01-15 | 이시다 아키라 | 기판처리장치 |
JPH10209023A (ja) * | 1997-01-28 | 1998-08-07 | Matsushita Electric Ind Co Ltd | 基板処理方法とその装置 |
US7416611B2 (en) * | 1997-05-09 | 2008-08-26 | Semitool, Inc. | Process and apparatus for treating a workpiece with gases |
JP2001077069A (ja) * | 1999-06-30 | 2001-03-23 | Sony Corp | 基板処理方法及び基板処理装置 |
JP2003222631A (ja) * | 2002-01-30 | 2003-08-08 | Aloka Co Ltd | 洗浄装置 |
US7040330B2 (en) * | 2003-02-20 | 2006-05-09 | Lam Research Corporation | Method and apparatus for megasonic cleaning of patterned substrates |
US7247209B2 (en) * | 2003-06-12 | 2007-07-24 | National Semiconductor Corporation | Dual outlet nozzle for the combined edge bead removal and backside wash of spin coated wafers |
JP2005191511A (ja) * | 2003-12-02 | 2005-07-14 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板処理方法 |
JP2006073753A (ja) * | 2004-09-01 | 2006-03-16 | Renesas Technology Corp | 基板洗浄装置 |
EP1811552A1 (en) * | 2004-11-10 | 2007-07-25 | Mimasu Semiconductor Industry Co., Ltd. | Single-wafer processor |
WO2007128659A1 (en) * | 2006-05-05 | 2007-11-15 | Sez Ag | Device and method for wet treating plate-like substrates |
-
2011
- 2011-09-22 KR KR1020147007102A patent/KR101574034B1/ko active IP Right Grant
- 2011-09-22 WO PCT/EP2011/066529 patent/WO2013041144A1/de active Application Filing
- 2011-09-22 CN CN201180073648.6A patent/CN103828032B/zh active Active
- 2011-09-22 US US14/346,109 patent/US9960058B2/en active Active
- 2011-09-22 EP EP11761574.0A patent/EP2758991B1/de active Active
- 2011-09-22 JP JP2014531113A patent/JP5855255B2/ja active Active
- 2011-09-22 SG SG2014009922A patent/SG2014009922A/en unknown
-
2012
- 2012-07-27 TW TW101127342A patent/TWI574335B/zh active
Also Published As
Publication number | Publication date |
---|---|
EP2758991A1 (de) | 2014-07-30 |
JP2014530497A (ja) | 2014-11-17 |
US20140332036A1 (en) | 2014-11-13 |
KR20140063706A (ko) | 2014-05-27 |
CN103828032A (zh) | 2014-05-28 |
TWI574335B (zh) | 2017-03-11 |
EP2758991B1 (de) | 2014-11-12 |
SG2014009922A (en) | 2014-05-29 |
TW201316432A (zh) | 2013-04-16 |
WO2013041144A1 (de) | 2013-03-28 |
KR101574034B1 (ko) | 2015-12-02 |
CN103828032B (zh) | 2016-08-17 |
US9960058B2 (en) | 2018-05-01 |
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