JP5690501B2 - 検体分析装置 - Google Patents
検体分析装置 Download PDFInfo
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- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
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- G01N2035/00772—Type of codes mechanical or optical code other than bar code
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- G—PHYSICS
- G01—MEASURING; TESTING
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- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00742—Type of codes
- G01N2035/00782—Type of codes reprogrammmable code
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00792—Type of components bearing the codes, other than sample carriers
- G01N2035/00811—Type of components bearing the codes, other than sample carriers consumable or exchangeable components other than sample carriers, e.g. detectors, flow cells
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0401—Sample carriers, cuvettes or reaction vessels
- G01N2035/0412—Block or rack elements with a single row of samples
- G01N2035/0415—Block or rack elements with a single row of samples moving in two dimensions in a horizontal plane
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0439—Rotary sample carriers, i.e. carousels
- G01N2035/0443—Rotary sample carriers, i.e. carousels for reagents
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0439—Rotary sample carriers, i.e. carousels
- G01N2035/0444—Rotary sample carriers, i.e. carousels for cuvettes or reaction vessels
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/0098—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor involving analyte bound to insoluble magnetic carrier, e.g. using magnetic separation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
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Description
まず、図1〜図19を参照して、本発明の第1実施形態による免疫分析装置1の構成について説明する。
次に、図23〜図29を参照して、第2実施形態について説明する。この第2実施形態による免疫分析装置301では、測定機構部302の試薬設置部316に1つのアンテナ部330を設けるとともに、アンテナ部330の一方側の表面にのみ金属板331を取り付けた例について説明する。
16a 筐体
16b 蓋部
16d 内側回転駆動部
16e 外側回転駆動部
16f ファン
16g ペルチェ素子
18 R1/R3設置部
19 R2設置部
20 内側アンテナ部
20a、21b、330a アンテナ基板
20b、21c、330b 基板取付部
20c、21d 蓋部材
21 外側アンテナ部
22、23、331 金属板
22a、23c、331a 切り欠き部
22b、23d、331b 外端部
25 R3試薬容器
26 R2試薬容器
27、28 ICタグ
324 R1試薬容器
330 アンテナ部
Claims (7)
- 試薬容器内の試薬を用いて検体の分析を行う検体分析装置であって、
試薬に関する試薬情報が記録された電子タグが付された複数の試薬容器を保持する試薬容器保持部と、
前記電子タグに電波を発信するためのアンテナ部と、
前記電子タグと前記アンテナ部との間に設けられ、前記アンテナ部から発信される電波の範囲を制限する制限部材とを備え、
前記制限部材は、前記アンテナ部から発信された前記電波を通過させるための間隙を有するとともに、前記電子タグと前記アンテナ部との間を遮るように設けられた金属部材を含み、
前記間隙は、前記金属部材の端部まで延びるように形成された切り欠きからなり、前記金属部材は、前記複数の試薬容器のうち、前記アンテナ部と正対する単一の前記試薬容器の前記電子タグと前記アンテナ部との間で前記間隙を介して電波を通過させるとともに、前記アンテナ部と正対しない他の試薬容器の前記電子タグと前記アンテナ部との間で電波を遮るように構成されており、
前記試薬容器保持部および前記アンテナ部の少なくとも一方を移動させる駆動部をさらに備え、
前記制限部材は、前記アンテナ部に対して位置が固定されている、検体分析装置。 - 前記間隙の鉛直方向の長さは、前記間隙の水平方向の長さよりも大きい、請求項1に記載の検体分析装置。
- 前記アンテナ部は、電波の発信を行うためのアンテナ基板と、前記アンテナ基板を保持するアンテナ保持部とを含み、
前記制限部材は、前記アンテナ保持部に取り付けられている、請求項1または2に記載の検体分析装置。 - 前記試薬容器保持部と前記アンテナ部とを収納する収納部と、
前記試薬を冷却するための冷却部とをさらに備え、
前記アンテナ保持部は、電波を透過可能な状態で、前記アンテナ基板を覆うように配置されている、請求項3に記載の検体分析装置。 - 前記複数の試薬容器は、第1電子タグが付された複数の第1試薬容器と第2電子タグが付された複数の第2試薬容器とを含み、
前記試薬容器保持部は、前記複数の第1試薬容器を保持する第1試薬容器保持部と前記複数の第2試薬容器を保持する第2試薬容器保持部とを含み、
前記アンテナ部は、前記第1電子タグに電波を発信するための第1アンテナ部と、前記第2電子タグに電波を発信するための第2アンテナ部とを含み、
前記制限部材は、前記第1電子タグと前記第1アンテナ部との間に設けられた第1制限部材と、前記第2電子タグと前記第2アンテナ部との間に設けられた第2制限部材とを含む、請求項1〜4のいずれか1項に記載の検体分析装置。 - 前記複数の試薬容器は、第1電子タグが付された第1試薬容器と第2電子タグが付された第2試薬容器とを含み、
前記試薬容器保持部は、前記第1試薬容器を保持する第1試薬容器保持部と前記第2試薬容器を保持する第2試薬容器保持部とを含み、
前記アンテナ部は、前記第1試薬容器保持部と前記第2試薬容器保持部との間に配置され、
前記制限部材は、前記第1電子タグと前記アンテナ部との間および前記第2電子タグと前記アンテナ部との間の少なくともいずれか一方に設けられている、請求項1〜4のいずれか1項に記載の検体分析装置。 - 前記第1試薬容器保持部は、平面的に見て、略円環状に形成され、複数の前記第1試薬容器を保持し、
前記第2試薬容器保持部は、平面的に見て、前記第1試薬容器保持部の内周側に略円環状に形成され、複数の前記第2試薬容器を保持し、
前記制限部材は、前記第2試薬容器保持部の第2試薬容器に付された第2電子タグと前記アンテナ部との間に設けられている、請求項6に記載の検体分析装置。
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JP2010074202A JP5690501B2 (ja) | 2010-03-29 | 2010-03-29 | 検体分析装置 |
CN201110066039XA CN102221613B (zh) | 2010-03-18 | 2011-03-18 | 样本分析仪 |
EP11158795.2A EP2367010A3 (en) | 2010-03-18 | 2011-03-18 | Sample analyzer |
US13/051,410 US8926901B2 (en) | 2010-03-29 | 2011-03-18 | Sample analyzer |
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JP2010074202A JP5690501B2 (ja) | 2010-03-29 | 2010-03-29 | 検体分析装置 |
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JP2011208962A JP2011208962A (ja) | 2011-10-20 |
JP5690501B2 true JP5690501B2 (ja) | 2015-03-25 |
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ES2905353T3 (es) | 2013-03-15 | 2022-04-08 | Abbott Lab | Gestor de reactivos automatizado de un sistema analizador de diagnóstico |
US9632103B2 (en) | 2013-03-15 | 2017-04-25 | Abbott Laboraties | Linear track diagnostic analyzer |
WO2014144870A2 (en) | 2013-03-15 | 2014-09-18 | Abbott Laboratories | Light-blocking system for a diagnostic analyzer |
WO2016130962A1 (en) | 2015-02-13 | 2016-08-18 | Abbott Laboratories | Automated storage modules for diagnostic analyzer liquids and related systems and methods |
GB2539192A (en) * | 2015-06-05 | 2016-12-14 | Stratec Biomedical Ag | Device, system and method for cooling a reagent compartment |
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FR2803482B1 (fr) * | 2000-01-05 | 2002-02-15 | Diffusion Vente Internationale | Lecteur pour cle electronique |
JP4035706B2 (ja) * | 2002-05-13 | 2008-01-23 | 三菱マテリアル株式会社 | Rfidタグの測定装置及び測定方法並びに該装置を用いたrfid用タグの製造方法 |
JP3890277B2 (ja) * | 2002-09-04 | 2007-03-07 | 株式会社エスアールエル | 検体指示情報作成システム |
JP4128491B2 (ja) * | 2003-06-16 | 2008-07-30 | 株式会社エスアールエル | 検体ラック及び検体位置認識システム |
JP4130905B2 (ja) * | 2003-06-23 | 2008-08-13 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
JP4502621B2 (ja) * | 2003-10-21 | 2010-07-14 | シスメックスRa株式会社 | 容器 |
JP4736658B2 (ja) * | 2005-09-14 | 2011-07-27 | 株式会社豊田中央研究所 | 漏れ波アンテナ |
JP4975407B2 (ja) * | 2006-10-10 | 2012-07-11 | シスメックス株式会社 | 分析装置 |
WO2008069175A1 (ja) * | 2006-12-04 | 2008-06-12 | Mitsubishi Cable Industries, Ltd. | Icタグ読取装置 |
JP2008140216A (ja) * | 2006-12-04 | 2008-06-19 | Mitsubishi Cable Ind Ltd | Icタグ読取装置 |
JP2008203007A (ja) * | 2007-02-19 | 2008-09-04 | Hitachi High-Technologies Corp | 自動分析装置 |
JP4692789B2 (ja) * | 2007-04-27 | 2011-06-01 | 日本電気株式会社 | 金属壁付きパッチアンテナ |
JP2009210444A (ja) * | 2008-03-05 | 2009-09-17 | Hitachi High-Technologies Corp | 自動分析装置 |
WO2010058736A1 (ja) * | 2008-11-21 | 2010-05-27 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
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US8926901B2 (en) | 2015-01-06 |
JP2011208962A (ja) | 2011-10-20 |
US20110236259A1 (en) | 2011-09-29 |
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