JP5690193B2 - 光断層像撮影装置 - Google Patents

光断層像撮影装置 Download PDF

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Publication number
JP5690193B2
JP5690193B2 JP2011091720A JP2011091720A JP5690193B2 JP 5690193 B2 JP5690193 B2 JP 5690193B2 JP 2011091720 A JP2011091720 A JP 2011091720A JP 2011091720 A JP2011091720 A JP 2011091720A JP 5690193 B2 JP5690193 B2 JP 5690193B2
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Japan
Prior art keywords
image
acquired
tomographic image
light
monitor
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JP2011091720A
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English (en)
Japanese (ja)
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JP2012223264A5 (enExample
JP2012223264A (ja
Inventor
俊夫 村田
俊夫 村田
幸弘 樋口
幸弘 樋口
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2011091720A priority Critical patent/JP5690193B2/ja
Priority to US13/448,738 priority patent/US9044166B2/en
Publication of JP2012223264A publication Critical patent/JP2012223264A/ja
Publication of JP2012223264A5 publication Critical patent/JP2012223264A5/ja
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Engineering & Computer Science (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Ophthalmology & Optometry (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biophysics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
JP2011091720A 2011-04-18 2011-04-18 光断層像撮影装置 Active JP5690193B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011091720A JP5690193B2 (ja) 2011-04-18 2011-04-18 光断層像撮影装置
US13/448,738 US9044166B2 (en) 2011-04-18 2012-04-17 Optical tomographic image photographing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011091720A JP5690193B2 (ja) 2011-04-18 2011-04-18 光断層像撮影装置

Publications (3)

Publication Number Publication Date
JP2012223264A JP2012223264A (ja) 2012-11-15
JP2012223264A5 JP2012223264A5 (enExample) 2014-06-05
JP5690193B2 true JP5690193B2 (ja) 2015-03-25

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JP2011091720A Active JP5690193B2 (ja) 2011-04-18 2011-04-18 光断層像撮影装置

Country Status (2)

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US (1) US9044166B2 (enExample)
JP (1) JP5690193B2 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6188297B2 (ja) * 2012-01-25 2017-08-30 キヤノン株式会社 画像処理装置、画像処理方法およびプログラム
JP5236089B1 (ja) * 2012-01-26 2013-07-17 キヤノン株式会社 光干渉断層撮像装置、光干渉断層撮像装置の制御方法、およびプログラム
KR101981685B1 (ko) * 2012-10-04 2019-08-28 삼성전자주식회사 디스플레이 장치, 사용자 단말 장치, 외부 장치, 디스플레이 방법, 데이터 수신 방법 및 데이터 전송 방법
JP6108890B2 (ja) 2013-03-15 2017-04-05 キヤノン株式会社 画像処理システム、画像処理方法及びプログラム。
JP6481250B2 (ja) * 2013-10-29 2019-03-13 株式会社ニデック 眼底解析装置及び眼底解析プログラム
EP2913036A1 (en) 2014-02-28 2015-09-02 Nidek co., Ltd. Ophthalmic laser surgery apparatus, and eyeball fixing portion movement unit and eyeball fixing unit used in the same
JP6322042B2 (ja) 2014-04-28 2018-05-09 キヤノン株式会社 眼科撮影装置、その制御方法、およびプログラム
JP2016041221A (ja) * 2014-08-19 2016-03-31 株式会社トプコン 眼科撮影装置およびその制御方法
JP6503665B2 (ja) * 2014-09-12 2019-04-24 株式会社ニデック 光コヒーレンストモグラフィー装置及びプログラム
JP6562857B2 (ja) * 2016-03-18 2019-08-21 株式会社吉田製作所 光干渉断層画像生成装置及びその使用方法
US10492951B2 (en) 2016-08-01 2019-12-03 Novartis Ag Method and apparatus for performing ophthalmic procedures removing undesirable features using laser energy
WO2019092696A1 (en) 2017-11-07 2019-05-16 Notal Vision Ltd. Methods and systems for alignment of ophthalmic imaging devices
CN111511268B (zh) 2017-11-07 2023-12-26 诺达尔视觉有限公司 视网膜成像设备和相关方法
JP7243023B2 (ja) * 2018-03-06 2023-03-22 株式会社ニデック Ｏｃｔ装置
JP7279379B2 (ja) * 2018-08-02 2023-05-23 株式会社ニデック Ｏｃｔ装置及びｏｃｔ画像処理プログラム
US10595722B1 (en) 2018-10-03 2020-03-24 Notal Vision Ltd. Automatic optical path adjustment in home OCT
JP2019084400A (ja) * 2019-03-13 2019-06-06 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
US10653311B1 (en) 2019-06-12 2020-05-19 Notal Vision Ltd. Home OCT with automatic focus adjustment
WO2021044982A1 (ja) * 2019-09-04 2021-03-11 株式会社ニデック Ｏｃｔ装置
CN115551404A (zh) * 2020-03-10 2022-12-30 徕卡显微系统股份有限公司 用于识别图像中的共轭的存在性的系统、方法和计算机程序产品
WO2022023809A1 (en) 2020-07-31 2022-02-03 Alcon Inc. Visualization and treatment of media opacity in eye
CN118265482A (zh) 2021-11-19 2024-06-28 爱尔康公司 具有增强的玻璃体可视化的眼科手术用接触镜
WO2023089486A1 (en) 2021-11-19 2023-05-25 Alcon Inc. Anamorphic depth gauge for ophthalmic systems
CA3234551A1 (en) 2021-11-19 2023-05-25 Utkarsh SHARMA Imaging a target within an eye and calibrating imaging devices
US12465210B2 (en) * 2021-11-19 2025-11-11 Alcon Inc. Optical coherence tomography system with an extended depth range
WO2023089416A1 (en) 2021-11-19 2023-05-25 Alcon Inc. Evaluating and treating eye floaters
CN118159232A (zh) 2021-11-19 2024-06-07 爱尔康公司 生成和评估眼睛内部的二维图像和三维图像

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6980299B1 (en) 2001-10-16 2005-12-27 General Hospital Corporation Systems and methods for imaging a sample
JP4750786B2 (ja) 2004-05-29 2011-08-17 ザ ジェネラル ホスピタル コーポレイション 光コヒーレンストモグラフィ（ｏｃｔ）イメージングにおける屈折層を用いた色分散補償プロセス、システム及びソフトウェア構成
JP4890878B2 (ja) * 2006-02-16 2012-03-07 株式会社トプコン 眼底観察装置
JP4822969B2 (ja) 2006-07-27 2011-11-24 株式会社ニデック 眼科撮影装置
US8125645B2 (en) * 2008-03-31 2012-02-28 Fujifilm Corporation Optical tomographic imaging system, tomographic image acquiring method, and optical tomographic image forming method
JP5301191B2 (ja) * 2008-03-31 2013-09-25 富士フイルム株式会社 光断層画像化装置および断層画像取得方法
JP5331395B2 (ja) * 2008-07-04 2013-10-30 株式会社ニデック 光断層像撮影装置
JP5255524B2 (ja) * 2008-07-04 2013-08-07 株式会社ニデック 光断層像撮影装置、光断層像処理装置。
US8348427B2 (en) * 2009-09-22 2013-01-08 Bioptigen, Inc. Systems for extended depth fourier domain optical coherence tomography (FDOCT) and related methods

Also Published As

Publication number Publication date
US20120281235A1 (en) 2012-11-08
JP2012223264A (ja) 2012-11-15
US9044166B2 (en) 2015-06-02

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