JP5646444B2 - 小型質量分析計システム - Google Patents

小型質量分析計システム Download PDF

Info

Publication number
JP5646444B2
JP5646444B2 JP2011268009A JP2011268009A JP5646444B2 JP 5646444 B2 JP5646444 B2 JP 5646444B2 JP 2011268009 A JP2011268009 A JP 2011268009A JP 2011268009 A JP2011268009 A JP 2011268009A JP 5646444 B2 JP5646444 B2 JP 5646444B2
Authority
JP
Japan
Prior art keywords
ion guide
chamber
ion
mass analyzer
pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2011268009A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012138354A5 (cg-RX-API-DMAC7.html
JP2012138354A (ja
Inventor
ライト スティーブン
ライト スティーブン
ライト クリストファー
ライト クリストファー
Original Assignee
マイクロサイク システムズ パブリック リミテッド カンパニー
マイクロサイク システムズ パブリック リミテッド カンパニー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by マイクロサイク システムズ パブリック リミテッド カンパニー, マイクロサイク システムズ パブリック リミテッド カンパニー filed Critical マイクロサイク システムズ パブリック リミテッド カンパニー
Publication of JP2012138354A publication Critical patent/JP2012138354A/ja
Publication of JP2012138354A5 publication Critical patent/JP2012138354A5/ja
Application granted granted Critical
Publication of JP5646444B2 publication Critical patent/JP5646444B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2011268009A 2010-12-07 2011-12-07 小型質量分析計システム Active JP5646444B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB1020728.0A GB2483314B (en) 2010-12-07 2010-12-07 Miniature mass spectrometer system
GB1020728.0 2010-12-07

Publications (3)

Publication Number Publication Date
JP2012138354A JP2012138354A (ja) 2012-07-19
JP2012138354A5 JP2012138354A5 (cg-RX-API-DMAC7.html) 2014-10-09
JP5646444B2 true JP5646444B2 (ja) 2014-12-24

Family

ID=43531599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011268009A Active JP5646444B2 (ja) 2010-12-07 2011-12-07 小型質量分析計システム

Country Status (4)

Country Link
US (1) US8796616B2 (cg-RX-API-DMAC7.html)
EP (1) EP2463891B1 (cg-RX-API-DMAC7.html)
JP (1) JP5646444B2 (cg-RX-API-DMAC7.html)
GB (1) GB2483314B (cg-RX-API-DMAC7.html)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10229824B2 (en) * 2013-03-11 2019-03-12 1St Detect Corporation Chemical analysis instrument with multi-purpose pump
US8829425B1 (en) 2013-05-24 2014-09-09 Bayspec, Inc. Apparatus and methods for creating a vacuum in a portable mass spectrometer
WO2014191746A1 (en) * 2013-05-31 2014-12-04 Micromass Uk Limited Compact mass spectrometer
DE112014002582B4 (de) 2013-05-31 2024-09-26 Micromass Uk Limited Kompaktes Massenspektrometer
WO2014191748A1 (en) 2013-05-31 2014-12-04 Micromass Uk Limited Compact mass spectrometer
WO2014191747A1 (en) * 2013-05-31 2014-12-04 Micromass Uk Limited Compact mass spectrometer
WO2015040386A1 (en) 2013-09-20 2015-03-26 Micromass Uk Limited Miniature ion source of fixed geometry
US9711341B2 (en) * 2014-06-10 2017-07-18 The University Of North Carolina At Chapel Hill Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods
US9698000B2 (en) * 2014-10-31 2017-07-04 908 Devices Inc. Integrated mass spectrometry systems
DE102014226038A1 (de) * 2014-12-16 2016-06-16 Carl Zeiss Microscopy Gmbh Druckreduzierungseinrichtung, Vorrichtung zur massenspektrometrischen Analyse eines Gases und Reinigungsverfahren
US9368335B1 (en) * 2015-02-02 2016-06-14 Thermo Finnigan Llc Mass spectrometer
US20160260594A1 (en) * 2015-03-02 2016-09-08 Bayspec, Inc. Sample Inlet and Vacuum System for Portable Mass Spectrometer
GB201509412D0 (en) * 2015-06-01 2015-07-15 Micromass Ltd Coupling intermediate pressure regions
WO2017180871A1 (en) * 2016-04-13 2017-10-19 Purdue Research Foundation Systems and methods for isolating a target in an ion trap
CN106024575B (zh) * 2016-07-08 2018-01-16 清华大学 一种基于mems工艺的多层结构矩形离子阱及其制备方法
US10141177B2 (en) * 2017-02-16 2018-11-27 Bruker Daltonics, Inc. Mass spectrometer using gastight radio frequency ion guide
CN112912991B (zh) * 2018-11-29 2025-01-24 株式会社岛津制作所 质量分析装置
GB2589853B (en) 2019-12-06 2023-06-21 Microsaic Systems Plc A system and method for detecting analytes dissolved in liquids by plasma ionisation mass spectrometry
CN113871284B (zh) 2020-06-30 2025-04-25 株式会社岛津制作所 质谱仪
CN113237943B (zh) * 2021-05-12 2023-10-20 中国科学技术大学 一种降低质谱探测h2和h2o背景噪声的超高真空装置
CN117012610A (zh) * 2022-04-28 2023-11-07 株式会社岛津制作所 质谱仪及其真空系统的形成方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03261062A (ja) * 1990-03-09 1991-11-20 Hitachi Ltd プラズマ極微量元素質量分析装置
US5492867A (en) 1993-09-22 1996-02-20 Westinghouse Elect. Corp. Method for manufacturing a miniaturized solid state mass spectrograph
US5466932A (en) * 1993-09-22 1995-11-14 Westinghouse Electric Corp. Micro-miniature piezoelectric diaphragm pump for the low pressure pumping of gases
GB2389452B (en) * 2001-12-06 2006-05-10 Bruker Daltonik Gmbh Ion-guide
WO2003077281A1 (en) * 2002-03-08 2003-09-18 University Of Washington Preparative separation of mixtures by mass spectrometry
US7405397B2 (en) * 2002-03-28 2008-07-29 Mds Sciex Inc. Laser desorption ion source with ion guide coupling for ion mass spectroscopy
DE102004028419B4 (de) * 2004-06-11 2011-06-22 Bruker Daltonik GmbH, 28359 Massenspektrometer und Reaktionszelle für Ionen-Ionen-Reaktionen
DE102004048496B4 (de) * 2004-10-05 2008-04-30 Bruker Daltonik Gmbh Ionenführung mit HF-Blendenstapeln
US7161146B2 (en) * 2005-01-24 2007-01-09 Science & Engineering Services, Inc. Method and apparatus for producing an ion beam from an ion guide
DE102005044307B4 (de) * 2005-09-16 2008-04-17 Bruker Daltonik Gmbh Ionisierung desorbierter Moleküle
GB2435712B (en) * 2006-03-02 2008-05-28 Microsaic Ltd Personalised mass spectrometer
EP1865533B1 (en) * 2006-06-08 2014-09-17 Microsaic Systems PLC Microengineerd vacuum interface for an ionization system
US7759637B2 (en) * 2006-06-30 2010-07-20 Dh Technologies Development Pte. Ltd Method for storing and reacting ions in a mass spectrometer
GB2445016B (en) * 2006-12-19 2012-03-07 Microsaic Systems Plc Microengineered ionisation device
GB2451239B (en) * 2007-07-23 2009-07-08 Microsaic Systems Ltd Microengineered electrode assembly
GB2453531B (en) 2007-10-04 2010-01-06 Microsaic Systems Ltd Pre-concentrator and sample interface
GB2457708B (en) * 2008-02-22 2010-04-14 Microsaic Systems Ltd Mass spectrometer system
DE102008051695B4 (de) * 2008-09-04 2019-06-06 Bruker Daltonik Gmbh Ionenmobilitätsmessung an Potentialbarriere
JP5604165B2 (ja) 2010-04-19 2014-10-08 株式会社日立ハイテクノロジーズ 質量分析装置
US8525106B2 (en) * 2011-05-09 2013-09-03 Bruker Daltonics, Inc. Method and apparatus for transmitting ions in a mass spectrometer maintained in a sub-atmospheric pressure regime
US8698075B2 (en) * 2011-05-24 2014-04-15 Battelle Memorial Institute Orthogonal ion injection apparatus and process

Also Published As

Publication number Publication date
EP2463891A3 (en) 2013-10-16
GB2483314B (en) 2013-03-06
GB2483314A (en) 2012-03-07
US8796616B2 (en) 2014-08-05
EP2463891A2 (en) 2012-06-13
JP2012138354A (ja) 2012-07-19
GB201020728D0 (en) 2011-01-19
EP2463891B1 (en) 2015-02-11
US20120138790A1 (en) 2012-06-07

Similar Documents

Publication Publication Date Title
JP5646444B2 (ja) 小型質量分析計システム
JP6577017B2 (ja) 出口における低気体流での低質量対電荷比イオンの効率的移送のためのイオンファンネル
CN112204701B (zh) 台式飞行时间质谱仪
JP5324457B2 (ja) 静電型イオントラップ
JP5789383B2 (ja) サンプルを化学イオン化する方法および質量分析機器
CA2776202C (en) Method and apparatus for transmitting ions in a mass spectrometer maintained in a sub-atmospheric pressure regime
US5859433A (en) Ion trap mass spectrometer with vacuum-external ion generation
CN103415907B (zh) 用于质谱仪的大气压电离入口
JP2713506B2 (ja) 同位体存在比プラズマ源質量分析計
JP2012009290A (ja) 質量分析装置
WO2014191747A1 (en) Compact mass spectrometer
WO2019229462A1 (en) Bench-top time of flight mass spectrometer
CN1901137B (zh) 大气压离子源接口及其实现方法与应用
US8410435B2 (en) Cyclone separator type mass analyzing system
Wright et al. MEMS-based nanospray-ionization mass spectrometer
Wright et al. Comparison of ion coupling strategies for a microengineered quadrupole mass filter
CA2920013C (en) Intermittent mass spectrometer inlet
US9214325B2 (en) Ion trap with radial opening in ring electrode
JP2010027622A (ja) 質量分析装置
Syms Status and future trends of the miniaturization of mass spectrometry
JP2011009114A (ja) 質量分析装置及び質量分析方法
CN116453933A (zh) 用于离子迁移和质谱分析的亚环境压力下的离子活化和碎片化
ITTO20090513A1 (it) Dispositivo di campionamento per gas e apparato analizzatore di gas che impiega detto dispositivo.
Egorova Investigation of Ion Transmission in Inductively Coupled Plasma Mass Spectrometry for Different Configurations of a Vacuum Interface
WO2005022096A2 (en) Mass spectrometer with light source and/or direct charge measuring

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140825

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140825

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20140825

TRDD Decision of grant or rejection written
A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20141001

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20141007

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20141105

R150 Certificate of patent or registration of utility model

Ref document number: 5646444

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250