JP5639995B2 - 後方散乱波を使用した異常の画像化 - Google Patents

後方散乱波を使用した異常の画像化 Download PDF

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Publication number
JP5639995B2
JP5639995B2 JP2011505055A JP2011505055A JP5639995B2 JP 5639995 B2 JP5639995 B2 JP 5639995B2 JP 2011505055 A JP2011505055 A JP 2011505055A JP 2011505055 A JP2011505055 A JP 2011505055A JP 5639995 B2 JP5639995 B2 JP 5639995B2
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wave
wave data
pulse
backscattered
sensors
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Japanese (ja)
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JP2011516897A5 (enExample
JP2011516897A (ja
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ジョン−ベム イン,
ジョン−ベム イン,
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Boeing Co
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Boeing Co
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/07Analysing solids by measuring propagation velocity or propagation time of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654Imaging
    • G01N29/069Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/26Scanned objects
    • G01N2291/269Various geometry objects
    • G01N2291/2694Wings or other aircraft parts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Endoscopes (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2011505055A 2008-04-15 2009-03-05 後方散乱波を使用した異常の画像化 Expired - Fee Related JP5639995B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/103,118 2008-04-15
US12/103,118 US8015877B2 (en) 2007-05-16 2008-04-15 Imaging an anomaly using backscattered waves
PCT/US2009/036188 WO2009148660A2 (en) 2008-04-15 2009-03-05 Imaging an anomaly using backscattered waves

Publications (3)

Publication Number Publication Date
JP2011516897A JP2011516897A (ja) 2011-05-26
JP2011516897A5 JP2011516897A5 (enExample) 2012-03-22
JP5639995B2 true JP5639995B2 (ja) 2014-12-10

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JP2011505055A Expired - Fee Related JP5639995B2 (ja) 2008-04-15 2009-03-05 後方散乱波を使用した異常の画像化

Country Status (5)

Country Link
US (1) US8015877B2 (enExample)
EP (1) EP2269051B1 (enExample)
JP (1) JP5639995B2 (enExample)
CN (1) CN102007402B (enExample)
WO (1) WO2009148660A2 (enExample)

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US8499632B1 (en) 2010-08-23 2013-08-06 The Boeing Company Characterizing anomalies in a laminate structure
PL2485026T3 (pl) * 2011-02-08 2019-12-31 The Boeing Company System monitorowania stanu technicznego struktury
US8677825B1 (en) * 2011-06-29 2014-03-25 The Boeing Company Identification of lamb wave modes
US10393705B2 (en) 2012-07-31 2019-08-27 General Electric Company Method and system for determination of geometric features in objects
ITMI20150556A1 (it) 2015-04-16 2016-10-16 Univ Bologna Alma Mater Studiorum Dispositivo, sistema e metodo per la diagnostica strutturale in tempo reale con onde elastiche guidate
CN109781849B (zh) * 2019-01-25 2021-02-12 江苏大学 一种基于频域分模态叠加损伤成像方法
US11519816B2 (en) 2019-02-18 2022-12-06 The Boeing Company Composite ply-by-ply damage assessment using correlation factors between finite element models (FEMs) and non-destructive evaluations (NDEs)
CN114330419A (zh) * 2021-12-01 2022-04-12 周大雨 图像处理方法、装置、计算机设备、存储介质及产品

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Also Published As

Publication number Publication date
US20090032329A1 (en) 2009-02-05
EP2269051B1 (en) 2020-06-10
WO2009148660A2 (en) 2009-12-10
CN102007402A (zh) 2011-04-06
WO2009148660A3 (en) 2010-05-06
EP2269051A2 (en) 2011-01-05
CN102007402B (zh) 2015-12-02
JP2011516897A (ja) 2011-05-26
US8015877B2 (en) 2011-09-13

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