JP5588775B2 - Ｘ線画像診断装置 - Google Patents

Ｘ線画像診断装置 Download PDF

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Publication number
JP5588775B2
JP5588775B2 JP2010170351A JP2010170351A JP5588775B2 JP 5588775 B2 JP5588775 B2 JP 5588775B2 JP 2010170351 A JP2010170351 A JP 2010170351A JP 2010170351 A JP2010170351 A JP 2010170351A JP 5588775 B2 JP5588775 B2 JP 5588775B2
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ray
sid
value
visible light
difference
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Japanese (ja)
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JP2012029766A (ja
JP2012029766A5 (enrdf_load_stackoverflow
Inventor
昭仁 谷口
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Hitachi Healthcare Manufacturing Ltd
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Hitachi Medical Corp
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JP2010170351A 2010-07-29 2010-07-29 Ｘ線画像診断装置 Expired - Fee Related JP5588775B2 (ja)

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JP2010170351A JP5588775B2 (ja) 2010-07-29 2010-07-29 Ｘ線画像診断装置

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Application Number Priority Date Filing Date Title
JP2010170351A JP5588775B2 (ja) 2010-07-29 2010-07-29 Ｘ線画像診断装置

Publications (3)

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JP2012029766A JP2012029766A (ja) 2012-02-16
JP2012029766A5 JP2012029766A5 (enrdf_load_stackoverflow) 2013-07-11
JP5588775B2 true JP5588775B2 (ja) 2014-09-10

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JP2010170351A Expired - Fee Related JP5588775B2 (ja) 2010-07-29 2010-07-29 Ｘ線画像診断装置

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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6459200B2 (ja) * 2014-03-31 2019-01-30 株式会社島津製作所 Ｘ線撮影装置
CN103900973B (zh) * 2014-04-24 2017-01-04 黄晓鹏 危险品检测方法
EP3226768A1 (en) * 2014-12-04 2017-10-11 Trophy Method and device to adjust cephalometric extra oral dental imaging devices
US20180085082A1 (en) * 2016-09-23 2018-03-29 Shimadzu Corporation X-ray imaging apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5360778U (enrdf_load_stackoverflow) * 1976-10-27 1978-05-23

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JP2012029766A (ja) 2012-02-16

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