JP5580296B2 - プローブ検出システム - Google Patents

プローブ検出システム Download PDF

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Publication number
JP5580296B2
JP5580296B2 JP2011512227A JP2011512227A JP5580296B2 JP 5580296 B2 JP5580296 B2 JP 5580296B2 JP 2011512227 A JP2011512227 A JP 2011512227A JP 2011512227 A JP2011512227 A JP 2011512227A JP 5580296 B2 JP5580296 B2 JP 5580296B2
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Japan
Prior art keywords
probe
cantilever
tip
sample
deflection
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JP2011512227A
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English (en)
Japanese (ja)
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JP2011522273A5 (enExample
JP2011522273A (ja
Inventor
ハンフリス，アンドリュー
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インフィニテシマ・リミテッド
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Priority claimed from GB0810389A external-priority patent/GB0810389D0/en
Priority claimed from GB0822505A external-priority patent/GB0822505D0/en
Application filed by インフィニテシマ・リミテッド filed Critical インフィニテシマ・リミテッド
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Publication of JP2011522273A5 publication Critical patent/JP2011522273A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2011512227A 2008-06-06 2009-06-08 プローブ検出システム Active JP5580296B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB0810389.7 2008-06-06
GB0810389A GB0810389D0 (en) 2008-06-06 2008-06-06 Interferometric detection system
GB0822505A GB0822505D0 (en) 2008-12-10 2008-12-10 Interferometic detection system
GB0822505.4 2008-12-10
PCT/GB2009/050637 WO2009147450A1 (en) 2008-06-06 2009-06-08 Probe detection system

Publications (3)

Publication Number Publication Date
JP2011522273A JP2011522273A (ja) 2011-07-28
JP2011522273A5 JP2011522273A5 (enExample) 2012-07-05
JP5580296B2 true JP5580296B2 (ja) 2014-08-27

Family

ID=40999765

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011512227A Active JP5580296B2 (ja) 2008-06-06 2009-06-08 プローブ検出システム

Country Status (9)

Country Link
US (2) US20110138506A1 (enExample)
EP (1) EP2297546B1 (enExample)
JP (1) JP5580296B2 (enExample)
KR (1) KR101488059B1 (enExample)
CN (1) CN102084431B (enExample)
CA (1) CA2727118A1 (enExample)
IL (1) IL209773A0 (enExample)
RU (1) RU2512674C2 (enExample)
WO (2) WO2009147450A1 (enExample)

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Also Published As

Publication number Publication date
CN102084431B (zh) 2014-07-02
WO2009147452A1 (en) 2009-12-10
US8528110B2 (en) 2013-09-03
US20110138506A1 (en) 2011-06-09
KR20110041459A (ko) 2011-04-21
WO2009147450A1 (en) 2009-12-10
KR101488059B1 (ko) 2015-01-29
EP2297546B1 (en) 2018-09-19
RU2010154664A (ru) 2012-07-20
US20110167525A1 (en) 2011-07-07
EP2297546A1 (en) 2011-03-23
JP2011522273A (ja) 2011-07-28
CN102084431A (zh) 2011-06-01
CA2727118A1 (en) 2009-12-10
RU2512674C2 (ru) 2014-04-10
IL209773A0 (en) 2011-04-28

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