JP5526036B2 - 三次元の回折限界未満の画像解像技術 - Google Patents
三次元の回折限界未満の画像解像技術 Download PDFInfo
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- JP5526036B2 JP5526036B2 JP2010539499A JP2010539499A JP5526036B2 JP 5526036 B2 JP5526036 B2 JP 5526036B2 JP 2010539499 A JP2010539499 A JP 2010539499A JP 2010539499 A JP2010539499 A JP 2010539499A JP 5526036 B2 JP5526036 B2 JP 5526036B2
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
- G01N2021/6419—Excitation at two or more wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
- G01N2021/6421—Measuring at two or more wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
- G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
- G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
- G01N2021/6441—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks with two or more labels
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pathology (AREA)
- Signal Processing (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US866107P | 2007-12-21 | 2007-12-21 | |
| US61/008,661 | 2007-12-21 | ||
| PCT/US2008/013915 WO2009085218A1 (en) | 2007-12-21 | 2008-12-19 | Sub-diffraction limit image resolution in three dimensions |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014002163A Division JP2014066734A (ja) | 2007-12-21 | 2014-01-09 | 三次元の回折限界未満の画像解像技術 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011508214A JP2011508214A (ja) | 2011-03-10 |
| JP5526036B2 true JP5526036B2 (ja) | 2014-06-18 |
Family
ID=40506438
Family Applications (5)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010539499A Active JP5526036B2 (ja) | 2007-12-21 | 2008-12-19 | 三次元の回折限界未満の画像解像技術 |
| JP2014002163A Withdrawn JP2014066734A (ja) | 2007-12-21 | 2014-01-09 | 三次元の回折限界未満の画像解像技術 |
| JP2014149455A Withdrawn JP2014199260A (ja) | 2007-12-21 | 2014-07-23 | 三次元の回折限界未満の画像解像技術 |
| JP2016223789A Active JP6452663B2 (ja) | 2007-12-21 | 2016-11-17 | 三次元の回折限界未満の画像解像技術 |
| JP2018231326A Pending JP2019070820A (ja) | 2007-12-21 | 2018-12-11 | 三次元の回折限界未満の画像解像技術 |
Family Applications After (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014002163A Withdrawn JP2014066734A (ja) | 2007-12-21 | 2014-01-09 | 三次元の回折限界未満の画像解像技術 |
| JP2014149455A Withdrawn JP2014199260A (ja) | 2007-12-21 | 2014-07-23 | 三次元の回折限界未満の画像解像技術 |
| JP2016223789A Active JP6452663B2 (ja) | 2007-12-21 | 2016-11-17 | 三次元の回折限界未満の画像解像技術 |
| JP2018231326A Pending JP2019070820A (ja) | 2007-12-21 | 2018-12-11 | 三次元の回折限界未満の画像解像技術 |
Country Status (5)
| Country | Link |
|---|---|
| US (6) | US8564792B2 (enExample) |
| EP (2) | EP2232244A1 (enExample) |
| JP (5) | JP5526036B2 (enExample) |
| CN (2) | CN105403545B (enExample) |
| WO (1) | WO2009085218A1 (enExample) |
Families Citing this family (94)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7838302B2 (en) | 2006-08-07 | 2010-11-23 | President And Fellows Of Harvard College | Sub-diffraction limit image resolution and other imaging techniques |
| DE102007045897A1 (de) * | 2007-09-26 | 2009-04-09 | Carl Zeiss Microimaging Gmbh | Verfahren zur mikroskopischen dreidimensionalen Abbildung einer Probe |
| WO2009085218A1 (en) * | 2007-12-21 | 2009-07-09 | President And Fellows Of Harvard College | Sub-diffraction limit image resolution in three dimensions |
| US8693742B2 (en) | 2008-12-17 | 2014-04-08 | The Regents Of The University Of Colorado | Three-dimensional single-molecule fluorescence imaging beyond the diffraction limit using a double-helix point spread function |
| EP2449379B1 (en) | 2009-07-02 | 2017-05-17 | Sloan-Kettering Institute for Cancer Research | Fluorescent silica-based nanoparticles |
| US12161734B2 (en) | 2009-07-02 | 2024-12-10 | Sloan-Kettering Institute For Cancer Research | Multimodal silica-based nanoparticles |
| CN102574405B (zh) * | 2009-10-16 | 2014-11-05 | 巴斯夫欧洲公司 | 具有窄带的标记物 |
| DE102009060793A1 (de) * | 2009-12-22 | 2011-07-28 | Carl Zeiss Microlmaging GmbH, 07745 | Hochauflösendes Mikroskop und Verfahren zur zwei- oder dreidimensionalen Positionsbestimmung von Objekten |
| EP2372347A1 (en) * | 2010-03-26 | 2011-10-05 | Institut Pasteur | Method to increase the number of detectable photons during the imaging of a biological marker |
| US8620065B2 (en) * | 2010-04-09 | 2013-12-31 | The Regents Of The University Of Colorado | Methods and systems for three dimensional optical imaging, sensing, particle localization and manipulation |
| WO2011152523A1 (ja) * | 2010-06-03 | 2011-12-08 | 株式会社ニコン | 顕微鏡装置 |
| DE102010036709A1 (de) | 2010-07-28 | 2012-02-02 | Leica Microsystems Cms Gmbh | Einrichtung und Verfahren zur mikroskopischen Bildaufnahme einer Probenstruktur |
| WO2012039636A2 (en) * | 2010-09-24 | 2012-03-29 | Christian Soeller | "3d localisation microscopy and 4d localisation microscopy and tracking methods and systems" |
| US10024796B2 (en) | 2010-10-29 | 2018-07-17 | President And Fellows Of Harvard College | Nucleic acid nanostructure barcode probes |
| DE102010044013A1 (de) | 2010-11-16 | 2012-05-16 | Carl Zeiss Microimaging Gmbh | Tiefenauflösungsgesteigerte Mikroskopie |
| FR2978254B1 (fr) | 2011-07-21 | 2014-01-24 | Imagine Optic | Methode et dispositif optique pour la localisation d'une particule en super resolution |
| JP6042887B2 (ja) * | 2011-07-24 | 2016-12-14 | ジーイー・ヘルスケア・バイオサイエンス・コーポレイション | ポリクロイックミラーチェンジャー付き蛍光顕微鏡 |
| EP2737356A1 (en) * | 2011-07-25 | 2014-06-04 | Mad City Labs, Inc. | Active-feedback positional drift correction in a microscope image using a fiduciary element held on a nanopositioning stage |
| DE102011053232B4 (de) | 2011-09-02 | 2020-08-06 | Leica Microsystems Cms Gmbh | Mikroskopische Einrichtung und mikroskopisches Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten |
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| DE102011055294B4 (de) * | 2011-11-11 | 2013-11-07 | Leica Microsystems Cms Gmbh | Mikroskopische Einrichtung und Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten in einer Probe |
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| US9693034B2 (en) | 2011-12-13 | 2017-06-27 | The Board Of Trustees Of The Leland Stanford Junior University | Apparatus and method for localizing objects for distance and/or in three dimensions using a spiral point spread function |
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| CN102520408B (zh) * | 2011-12-30 | 2013-07-03 | 北京华航无线电测量研究所 | 一种圆柱阵面三维成像系统的三维成像方法 |
| CN102565796B (zh) * | 2011-12-30 | 2013-09-18 | 北京华航无线电测量研究所 | 一种圆柱阵面三维成像系统的成像方法 |
| DE102012200344A1 (de) * | 2012-01-11 | 2013-07-11 | Carl Zeiss Microscopy Gmbh | Mikroskopsystem und Verfahren für die 3-D hochauflösende Mikroskopie |
| EP2660639B1 (en) * | 2012-05-02 | 2016-04-13 | Centre National De La Recherche Scientifique | Method and apparatus for single-particle localization using wavelet analysis |
| US10955331B2 (en) | 2012-06-22 | 2021-03-23 | The Regents Of The University Of Colorado, A Body Corporate | Imaging or measurement methods and systems |
| US20140022373A1 (en) * | 2012-07-20 | 2014-01-23 | University Of Utah Research Foundation | Correlative drift correction |
| JP6131568B2 (ja) * | 2012-10-30 | 2017-05-24 | 株式会社ニコン | 顕微鏡装置及び画像形成方法 |
| US9717402B2 (en) * | 2012-11-21 | 2017-08-01 | Align Technology, Inc. | Confocal imaging using astigmatism |
| US9063434B2 (en) | 2013-01-11 | 2015-06-23 | University Of Utah Research Foundation | Sub-diffraction-limited patterning and imaging via multi-step photoswitching |
| JP6349091B2 (ja) * | 2013-01-18 | 2018-06-27 | 国立大学法人 東京大学 | 超解像蛍光イメージング用プローブ |
| WO2014144820A1 (en) | 2013-03-15 | 2014-09-18 | The Regents Of The University Of Colorado | 3-d localization and imaging of dense arrays of particles |
| WO2014145606A1 (en) | 2013-03-15 | 2014-09-18 | Sloan-Kettering Institute For Cancer Research | Multimodal silica-based nanoparticles |
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| US10036735B2 (en) | 2013-08-26 | 2018-07-31 | The Regents Of The University Of Colorado, A Body Corporate | Imaging through scattering media with high signal to noise ratio and resolution |
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| CN104677865B (zh) * | 2013-12-02 | 2018-03-20 | 大连光耀辉科技有限公司 | 一种显微分析装置 |
| JP6284372B2 (ja) * | 2014-01-21 | 2018-02-28 | オリンパス株式会社 | 走査型レーザ顕微鏡および超解像画像生成方法 |
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| KR102313982B1 (ko) | 2014-03-11 | 2021-10-18 | 프레지던트 앤드 펠로우즈 오브 하바드 칼리지 | 프로그램가능한 핵산 프로브를 이용한 고처리량 고도 다중 영상화 |
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| EP3539036A4 (en) | 2016-11-08 | 2020-06-17 | President and Fellows of Harvard College | MATRIX AND DELETE |
| US20190276881A1 (en) | 2016-11-08 | 2019-09-12 | President And Fellows Of Harvard College | Multiplexed imaging using merfish, expansion microscopy, and related technologies |
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