JP5511437B2 - 光断層像撮影装置 - Google Patents

光断層像撮影装置 Download PDF

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Publication number
JP5511437B2
JP5511437B2 JP2010040586A JP2010040586A JP5511437B2 JP 5511437 B2 JP5511437 B2 JP 5511437B2 JP 2010040586 A JP2010040586 A JP 2010040586A JP 2010040586 A JP2010040586 A JP 2010040586A JP 5511437 B2 JP5511437 B2 JP 5511437B2
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Japan
Prior art keywords
light beam
optical
tomographic image
light
image
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Expired - Fee Related
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JP2010040586A
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English (en)
Japanese (ja)
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JP2011172822A (ja
JP2011172822A5 (enExample
Inventor
俊夫 村田
幸弘 樋口
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Nidek Co Ltd
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Nidek Co Ltd
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Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2010040586A priority Critical patent/JP5511437B2/ja
Priority to EP11155669.2A priority patent/EP2371273B1/en
Priority to US13/034,147 priority patent/US8534835B2/en
Publication of JP2011172822A publication Critical patent/JP2011172822A/ja
Publication of JP2011172822A5 publication Critical patent/JP2011172822A5/ja
Application granted granted Critical
Publication of JP5511437B2 publication Critical patent/JP5511437B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
    • G01B9/0203—With imaging systems
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02068—Auto-alignment of optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02089—Displaying the signal, e.g. for user interaction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Surgery (AREA)
  • Ophthalmology & Optometry (AREA)
  • Biomedical Technology (AREA)
  • Optics & Photonics (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Biophysics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Automation & Control Theory (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Human Computer Interaction (AREA)
  • Signal Processing (AREA)
  • Eye Examination Apparatus (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2010040586A 2010-02-25 2010-02-25 光断層像撮影装置 Expired - Fee Related JP5511437B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010040586A JP5511437B2 (ja) 2010-02-25 2010-02-25 光断層像撮影装置
EP11155669.2A EP2371273B1 (en) 2010-02-25 2011-02-23 Method of operating an optical tomographic image photographing apparatus
US13/034,147 US8534835B2 (en) 2010-02-25 2011-02-24 Optical tomographic image photographing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010040586A JP5511437B2 (ja) 2010-02-25 2010-02-25 光断層像撮影装置

Publications (3)

Publication Number Publication Date
JP2011172822A JP2011172822A (ja) 2011-09-08
JP2011172822A5 JP2011172822A5 (enExample) 2013-04-11
JP5511437B2 true JP5511437B2 (ja) 2014-06-04

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Family Applications (1)

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JP2010040586A Expired - Fee Related JP5511437B2 (ja) 2010-02-25 2010-02-25 光断層像撮影装置

Country Status (3)

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US (1) US8534835B2 (enExample)
EP (1) EP2371273B1 (enExample)
JP (1) JP5511437B2 (enExample)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
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JP5570125B2 (ja) * 2009-01-22 2014-08-13 キヤノン株式会社 光断層撮像装置
JP5836564B2 (ja) * 2010-03-12 2015-12-24 キヤノン株式会社 眼科撮像装置、および眼科撮像方法、そのプログラム
JP5289496B2 (ja) 2011-03-31 2013-09-11 キヤノン株式会社 眼科装置
JP5220208B2 (ja) * 2011-03-31 2013-06-26 キヤノン株式会社 制御装置、撮像制御方法、およびプログラム
JP6057567B2 (ja) * 2011-07-14 2017-01-11 キヤノン株式会社 撮像制御装置、眼科撮像装置、撮像制御方法及びプログラム
JP5926533B2 (ja) * 2011-10-27 2016-05-25 キヤノン株式会社 眼科装置
EP2815694B1 (en) * 2011-12-30 2017-12-06 WaveLight GmbH An integrated device for ophthalmology
JP6166509B2 (ja) * 2012-01-16 2017-07-19 キヤノン株式会社 撮像装置及び撮像方法
JP5374598B2 (ja) 2012-01-26 2013-12-25 キヤノン株式会社 光断層撮像装置
US20130229622A1 (en) * 2012-03-02 2013-09-05 Nidek Co., Ltd. Ophthalmologic photographing apparatus and ophthalmologic photographing method
EP2644086B1 (en) * 2012-03-30 2015-11-04 Canon Kabushiki Kaisha Fundus inspection apparatus
JP6040562B2 (ja) * 2012-04-27 2016-12-07 株式会社ニデック 眼底撮影装置用アタッチメント
TWI474802B (zh) * 2012-05-04 2015-03-01 光學眼壓量測裝置及其運作方法
US9016862B2 (en) * 2012-05-10 2015-04-28 Sonomed Ip Holdings, Inc. Multimodality correlation of optical coherence tomography using secondary reference images
US8876292B2 (en) * 2012-07-03 2014-11-04 Nidek Co., Ltd. Fundus imaging apparatus
JP6195334B2 (ja) * 2012-08-30 2017-09-13 キヤノン株式会社 撮像装置、撮像方法およびプログラム
JP6279682B2 (ja) * 2012-10-01 2018-02-14 株式会社トプコン 眼科観察装置
JP6045895B2 (ja) * 2012-10-01 2016-12-14 株式会社トプコン 眼科観察装置
JP6274728B2 (ja) * 2013-01-31 2018-02-07 キヤノン株式会社 光干渉断層撮像装置およびその制御方法
JP6207220B2 (ja) * 2013-04-30 2017-10-04 キヤノン株式会社 光断層撮像装置
JP6218425B2 (ja) * 2013-04-30 2017-10-25 キヤノン株式会社 光断層撮像装置
JP6130723B2 (ja) * 2013-05-01 2017-05-17 キヤノン株式会社 情報処理装置、情報処理装置の制御方法、及びプログラム
JP2015039580A (ja) * 2013-08-23 2015-03-02 キヤノン株式会社 光断層撮像装置
JP2015039581A (ja) * 2013-08-23 2015-03-02 キヤノン株式会社 光断層撮像装置
US9913580B2 (en) 2013-09-19 2018-03-13 Canon Kabushiki Kaisha Apparatus, method, and non-transitory medium for optical stabilization and digital image registration in scanning light ophthalmoscopy
JP6606881B2 (ja) 2015-06-16 2019-11-20 株式会社ニデック Ｏｃｔ信号処理装置、ｏｃｔ信号処理プログラム、およびｏｃｔ装置
JP6498162B2 (ja) * 2016-08-24 2019-04-10 キヤノン株式会社 光断層撮像装置
JP6934747B2 (ja) * 2017-05-19 2021-09-15 株式会社トプコン 眼科装置、及びその制御方法
JP2019047841A (ja) 2017-09-07 2019-03-28 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
JP7027076B2 (ja) 2017-09-07 2022-03-01 キヤノン株式会社 画像処理装置、位置合わせ方法及びプログラム
JP2019047839A (ja) * 2017-09-07 2019-03-28 キヤノン株式会社 画像処理装置、位置合わせ方法及びプログラム
KR102661654B1 (ko) 2017-11-07 2024-04-29 노탈 비전 엘티디. 망막 이미징 디바이스 및 관련 방법들
EP3675709B1 (en) 2017-11-07 2023-07-26 Notal Vision Ltd. Systems for alignment of ophthalmic imaging devices
JP7130989B2 (ja) 2018-03-05 2022-09-06 株式会社ニデック 眼科画像処理装置、および眼科画像処理プログラム
JP7286853B2 (ja) * 2018-08-10 2023-06-05 株式会社トプコン 眼科装置、及びその制御方法
JP7202807B2 (ja) * 2018-08-10 2023-01-12 株式会社トプコン 眼科装置
JP7202808B2 (ja) * 2018-08-10 2023-01-12 株式会社トプコン 眼科装置、及びその制御方法
US10595722B1 (en) 2018-10-03 2020-03-24 Notal Vision Ltd. Automatic optical path adjustment in home OCT
US10653311B1 (en) 2019-06-12 2020-05-19 Notal Vision Ltd. Home OCT with automatic focus adjustment
EP4452045A4 (en) * 2021-12-23 2025-12-17 C Light Tech Inc SYSTEMS, DEVICES AND METHODS FOR IMAGING THE RETINAL OF A PERSON AND ANALYSIS OF RETINAL IMAGES

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4426839B2 (ja) * 2003-12-26 2010-03-03 株式会社ニデック 眼底撮影装置
JP4850495B2 (ja) * 2005-10-12 2012-01-11 株式会社トプコン 眼底観察装置及び眼底観察プログラム
US8223143B2 (en) * 2006-10-27 2012-07-17 Carl Zeiss Meditec, Inc. User interface for efficiently displaying relevant OCT imaging data
JP4996917B2 (ja) 2006-12-26 2012-08-08 株式会社トプコン 光画像計測装置及び光画像計測装置を制御するプログラム
JP2008253492A (ja) * 2007-04-04 2008-10-23 Fujifilm Corp 断層画像処理方法および装置ならびにプログラム
JP5339828B2 (ja) * 2007-10-04 2013-11-13 キヤノン株式会社 光干渉断層撮像装置及び光干渉断層撮像方法
JP5231802B2 (ja) * 2007-12-29 2013-07-10 株式会社ニデック 眼科撮影装置
US7824035B2 (en) * 2008-06-02 2010-11-02 Nidek Co., Ltd. Ophthalmic photographing apparatus
JP5331395B2 (ja) * 2008-07-04 2013-10-30 株式会社ニデック 光断層像撮影装置
JP5255524B2 (ja) * 2008-07-04 2013-08-07 株式会社ニデック 光断層像撮影装置、光断層像処理装置。
JP2010040586A (ja) 2008-07-31 2010-02-18 Panasonic Corp 半導体装置の製造方法およびこれに用いられる半導体ウェハ

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Publication number Publication date
JP2011172822A (ja) 2011-09-08
EP2371273A1 (en) 2011-10-05
US8534835B2 (en) 2013-09-17
US20110205490A1 (en) 2011-08-25
EP2371273B1 (en) 2018-11-14

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