JP5501463B2 - トンネル電界効果デバイス - Google Patents

トンネル電界効果デバイス Download PDF

Info

Publication number
JP5501463B2
JP5501463B2 JP2012526177A JP2012526177A JP5501463B2 JP 5501463 B2 JP5501463 B2 JP 5501463B2 JP 2012526177 A JP2012526177 A JP 2012526177A JP 2012526177 A JP2012526177 A JP 2012526177A JP 5501463 B2 JP5501463 B2 JP 5501463B2
Authority
JP
Japan
Prior art keywords
tfet
semiconductor
tunnel
semiconductor material
core element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2012526177A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013503471A (ja
JP2013503471A5 (enExample
Inventor
ビョーク・ミカエル・ティー
カーグ・シェグフライド・エフ
ノック・ホアキム
リエル・ハイク・イー
リエス・ウォルター・エイチ
ソロモン・ポール・エム
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JP2013503471A publication Critical patent/JP2013503471A/ja
Publication of JP2013503471A5 publication Critical patent/JP2013503471A5/ja
Application granted granted Critical
Publication of JP5501463B2 publication Critical patent/JP5501463B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D12/00Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
    • H10D12/211Gated diodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/117Shapes of semiconductor bodies
    • H10D62/118Nanostructure semiconductor bodies

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Bipolar Transistors (AREA)
  • Thin Film Transistor (AREA)
JP2012526177A 2009-08-31 2010-08-30 トンネル電界効果デバイス Expired - Fee Related JP5501463B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/550,857 US8288803B2 (en) 2009-08-31 2009-08-31 Tunnel field effect devices
US12/550,857 2009-08-31
PCT/IB2010/053884 WO2011024152A1 (en) 2009-08-31 2010-08-30 Tunnel field effect devices

Publications (3)

Publication Number Publication Date
JP2013503471A JP2013503471A (ja) 2013-01-31
JP2013503471A5 JP2013503471A5 (enExample) 2013-10-10
JP5501463B2 true JP5501463B2 (ja) 2014-05-21

Family

ID=43127353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012526177A Expired - Fee Related JP5501463B2 (ja) 2009-08-31 2010-08-30 トンネル電界効果デバイス

Country Status (7)

Country Link
US (1) US8288803B2 (enExample)
JP (1) JP5501463B2 (enExample)
CN (1) CN102484132B (enExample)
DE (1) DE112010003495B4 (enExample)
GB (1) GB2485495B (enExample)
TW (1) TWI463653B (enExample)
WO (1) WO2011024152A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8890120B2 (en) 2012-11-16 2014-11-18 Intel Corporation Tunneling field effect transistors (TFETs) for CMOS approaches to fabricating N-type and P-type TFETs
EP3050111A4 (en) * 2013-09-27 2017-06-07 Intel Corporation Improved cladding layer epitaxy via template engineering for heterogeneous integration on silicon
GB2518679A (en) 2013-09-30 2015-04-01 Ibm Reconfigurable tunnel field-effect transistors
KR102157825B1 (ko) 2014-01-16 2020-09-18 삼성전자주식회사 터널링 전계 효과 트랜지스터
CN104835840B (zh) * 2015-03-24 2017-09-19 北京大学 超陡平均亚阈摆幅纳米线隧穿场效应晶体管及制备方法
US10026830B2 (en) 2015-04-29 2018-07-17 Stmicroelectronics, Inc. Tunneling field effect transistor (TFET) having a semiconductor fin structure
JP6159777B2 (ja) * 2015-10-28 2017-07-05 ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. 半導体装置の製造方法、及び、半導体装置
JP6080989B2 (ja) * 2016-01-06 2017-02-15 ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. 半導体装置の製造方法、及び、半導体装置
JP6375316B2 (ja) * 2016-01-06 2018-08-15 ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. 半導体装置の製造方法、及び、半導体装置
JP6114434B2 (ja) * 2016-04-21 2017-04-12 ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. 半導体装置
CN108369960A (zh) 2016-04-22 2018-08-03 华为技术有限公司 隧穿场效应晶体管及其制造方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6833556B2 (en) * 2002-08-12 2004-12-21 Acorn Technologies, Inc. Insulated gate field effect transistor having passivated schottky barriers to the channel
US7180107B2 (en) * 2004-05-25 2007-02-20 International Business Machines Corporation Method of fabricating a tunneling nanotube field effect transistor
US7465976B2 (en) * 2005-05-13 2008-12-16 Intel Corporation Tunneling field effect transistor using angled implants for forming asymmetric source/drain regions
US20070052012A1 (en) * 2005-08-24 2007-03-08 Micron Technology, Inc. Vertical tunneling nano-wire transistor
US7893476B2 (en) * 2006-09-15 2011-02-22 Imec Tunnel effect transistors based on silicon nanowires
EP1901355B1 (en) * 2006-09-15 2015-11-11 Imec Tunnel effect transistors based on monocrystalline nanowires having a heterostructure
US8120115B2 (en) * 2007-03-12 2012-02-21 Imec Tunnel field-effect transistor with gated tunnel barrier
US20090034355A1 (en) * 2007-07-30 2009-02-05 Qimonda Ag Integrated circuit including memory cells with tunnel fet as selection transistor

Also Published As

Publication number Publication date
US8288803B2 (en) 2012-10-16
TWI463653B (zh) 2014-12-01
JP2013503471A (ja) 2013-01-31
TW201133837A (en) 2011-10-01
GB201200880D0 (en) 2012-02-29
GB2485495B (en) 2013-10-30
US20110049474A1 (en) 2011-03-03
DE112010003495T5 (de) 2012-09-20
CN102484132A (zh) 2012-05-30
CN102484132B (zh) 2014-07-30
WO2011024152A1 (en) 2011-03-03
DE112010003495B4 (de) 2013-12-12
GB2485495A (en) 2012-05-16

Similar Documents

Publication Publication Date Title
JP5501463B2 (ja) トンネル電界効果デバイス
US8772877B2 (en) Tunnel field-effect transistor
US8193524B2 (en) Nanoelectronic device
US20130264544A1 (en) Nanowire field-effect device with multiple gates
Singh et al. Improved DC performances of gate-all-around si-nanotube tunnel FETs using gate-source overlap
Wadhwa et al. Design and investigation of doped triple metal double gate vertical TFET for performance enhancement
CN103199106A (zh) P型石墨烯基晶体管
Panda et al. Drain dielectric pocket engineering: its impact on the electrical performance of a hetero-structure tunnel FET
US8878251B2 (en) Silicon-compatible compound junctionless field effect transistor
CN102694030B (zh) 具有石墨烯纳米带异质结构的隧穿场效应晶体管
Keighobadi et al. Switching performance investigation of a gate-all-around core-source InGaAs/InP TFET
KR102608554B1 (ko) 상보형 스위치 소자
US11758797B2 (en) Method of n-type doping carbon nanotube
US11690277B2 (en) Method of p-type doping carbon nanotube
US12336204B2 (en) Tunneling transistor
Reena Monica Seven strategies to suppress the ambipolar behaviour in CNTFETs: a review
US8629480B2 (en) Hetero-junction tunneling transistor
US11201246B2 (en) Field-effect transistor structure and fabrication method
WO2022052045A1 (zh) 负电容无结纳米线场效应晶体管及其制造方法
US12114560B2 (en) Carbon nanotube composite structure
Su et al. Current characteristics of double-top-gated graphene field effect transistor
JP3245657B2 (ja) ヘテロ接合型電界効果トランジスタ
Kumar et al. Analytical Modeling of Subthreshold Current and Subthreshold Swing of Schottky-Barrier Source/Drain Double Gate-All-Around (DGAA) MOSFETs
CN120343933A (zh) 一种新型的双极型隧穿场效应晶体管
JPH0812912B2 (ja) 電界効果トランジスタ

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20130509

RD12 Notification of acceptance of power of sub attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7432

Effective date: 20130801

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130805

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20130805

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20130801

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20130826

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130917

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20131213

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20140225

RD14 Notification of resignation of power of sub attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7434

Effective date: 20140225

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20140311

R150 Certificate of patent or registration of utility model

Ref document number: 5501463

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees