JP5481299B2 - 導通検査治具の動作制御構造 - Google Patents

導通検査治具の動作制御構造 Download PDF

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Publication number
JP5481299B2
JP5481299B2 JP2010164787A JP2010164787A JP5481299B2 JP 5481299 B2 JP5481299 B2 JP 5481299B2 JP 2010164787 A JP2010164787 A JP 2010164787A JP 2010164787 A JP2010164787 A JP 2010164787A JP 5481299 B2 JP5481299 B2 JP 5481299B2
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JP
Japan
Prior art keywords
cylinder
hole
connector
continuity inspection
control valve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2010164787A
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English (en)
Japanese (ja)
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JP2012026831A5 (enExample
JP2012026831A (ja
Inventor
興三 小掠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yazaki Corp
Original Assignee
Yazaki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yazaki Corp filed Critical Yazaki Corp
Priority to JP2010164787A priority Critical patent/JP5481299B2/ja
Priority to US13/137,009 priority patent/US8502550B2/en
Priority to PT105822A priority patent/PT105822B/pt
Priority to CN201110205711.9A priority patent/CN102346226B/zh
Publication of JP2012026831A publication Critical patent/JP2012026831A/ja
Publication of JP2012026831A5 publication Critical patent/JP2012026831A5/ja
Application granted granted Critical
Publication of JP5481299B2 publication Critical patent/JP5481299B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
JP2010164787A 2010-07-22 2010-07-22 導通検査治具の動作制御構造 Active JP5481299B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010164787A JP5481299B2 (ja) 2010-07-22 2010-07-22 導通検査治具の動作制御構造
US13/137,009 US8502550B2 (en) 2010-07-22 2011-07-15 Operation control structure for a continuity test device
PT105822A PT105822B (pt) 2010-07-22 2011-07-20 Estrutura de controlo de funcionamento para um dispositivo de teste de continuidade
CN201110205711.9A CN102346226B (zh) 2010-07-22 2011-07-22 用于连续性测试装置的操作控制结构

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010164787A JP5481299B2 (ja) 2010-07-22 2010-07-22 導通検査治具の動作制御構造

Publications (3)

Publication Number Publication Date
JP2012026831A JP2012026831A (ja) 2012-02-09
JP2012026831A5 JP2012026831A5 (enExample) 2013-01-10
JP5481299B2 true JP5481299B2 (ja) 2014-04-23

Family

ID=45493106

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010164787A Active JP5481299B2 (ja) 2010-07-22 2010-07-22 導通検査治具の動作制御構造

Country Status (4)

Country Link
US (1) US8502550B2 (enExample)
JP (1) JP5481299B2 (enExample)
CN (1) CN102346226B (enExample)
PT (1) PT105822B (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5566215B2 (ja) * 2010-07-29 2014-08-06 矢崎総業株式会社 導通検査治具の取付構造
US9746762B2 (en) 2013-09-27 2017-08-29 Hoya Corporation Conductive film coated substrate, multilayer reflective film coated substrate, reflective mask blank, reflective mask, and semiconductor device manufacturing method
MX387108B (es) * 2013-11-25 2025-03-11 Halliburton Energy Services Inc Composición de cemento novedosa para una aplicación de pérdida de circulación.
EP3199984A1 (en) * 2016-02-01 2017-08-02 Canon Kabushiki Kaisha Antireflection film, optical member, and method for manufacturing optical member
KR101791018B1 (ko) * 2016-02-24 2017-10-27 양기선 커넥터 고정장치
US10082447B2 (en) * 2016-03-11 2018-09-25 The Boeing Company System and method to test a contact of a connector
CN110297110B (zh) * 2018-03-21 2022-02-15 科磊股份有限公司 探针结构、夹具、容置盒、自动化探针替换系统及方法
CN110702951B (zh) * 2019-09-09 2024-11-22 广西电网有限责任公司电力科学研究院 一种推拉锁紧式高空接线装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2169153B (en) * 1984-12-28 1988-08-03 Sumitomo Wall Systems Ltd Connector terminal examination device
JP2921721B2 (ja) * 1992-04-07 1999-07-19 矢崎総業株式会社 コネクタ端子検査具
JP2797928B2 (ja) 1993-10-15 1998-09-17 住友電装株式会社 コネクタ検査装置
FR2741718B1 (fr) 1995-11-23 1998-01-02 Sm Contact Dispositif de controle pour connecteurs electriques
JP4561461B2 (ja) * 2005-04-28 2010-10-13 住友電装株式会社 ワイヤーハーネスの導通検査器
US8020584B2 (en) 2005-05-03 2011-09-20 Love Phillip W Variable valve for impact dispersal device
KR20080003935A (ko) 2005-05-03 2008-01-08 필립 더블류. 러브 충격 분산 장치
JP4654100B2 (ja) 2005-09-22 2011-03-16 矢崎総業株式会社 コネクタ保持治具と該コネクタ保持治具を備えたワイヤハーネス布線装置

Also Published As

Publication number Publication date
US8502550B2 (en) 2013-08-06
PT105822A (pt) 2012-01-23
US20120019276A1 (en) 2012-01-26
CN102346226B (zh) 2014-01-29
PT105822B (pt) 2012-07-13
JP2012026831A (ja) 2012-02-09
CN102346226A (zh) 2012-02-08

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