JP5475737B2 - 放射線撮影装置及び画像処理方法 - Google Patents

放射線撮影装置及び画像処理方法 Download PDF

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Publication number
JP5475737B2
JP5475737B2 JP2011219888A JP2011219888A JP5475737B2 JP 5475737 B2 JP5475737 B2 JP 5475737B2 JP 2011219888 A JP2011219888 A JP 2011219888A JP 2011219888 A JP2011219888 A JP 2011219888A JP 5475737 B2 JP5475737 B2 JP 5475737B2
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Prior art keywords
image
grating
phase differential
differential image
pixel
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Expired - Fee Related
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JP2011219888A
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Japanese (ja)
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JP2013078464A5 (enExample
JP2013078464A (ja
Inventor
裕康 石井
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Fujifilm Corp
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Fujifilm Corp
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Priority to JP2011219888A priority Critical patent/JP5475737B2/ja
Priority to US13/629,293 priority patent/US9025726B2/en
Priority to EP20120186584 priority patent/EP2578156B1/en
Priority to CN2012103778576A priority patent/CN103027701A/zh
Publication of JP2013078464A publication Critical patent/JP2013078464A/ja
Publication of JP2013078464A5 publication Critical patent/JP2013078464A5/ja
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Medical Informatics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Biomedical Technology (AREA)
  • Optics & Photonics (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Surgery (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Molecular Biology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Heart & Thoracic Surgery (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2011219888A 2011-10-04 2011-10-04 放射線撮影装置及び画像処理方法 Expired - Fee Related JP5475737B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2011219888A JP5475737B2 (ja) 2011-10-04 2011-10-04 放射線撮影装置及び画像処理方法
US13/629,293 US9025726B2 (en) 2011-10-04 2012-09-27 Radiation imaging apparatus and image processing method
EP20120186584 EP2578156B1 (en) 2011-10-04 2012-09-28 Radiation imaging apparatus and image processing method
CN2012103778576A CN103027701A (zh) 2011-10-04 2012-10-08 放射线成像设备和图像处理方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011219888A JP5475737B2 (ja) 2011-10-04 2011-10-04 放射線撮影装置及び画像処理方法

Publications (3)

Publication Number Publication Date
JP2013078464A JP2013078464A (ja) 2013-05-02
JP2013078464A5 JP2013078464A5 (enExample) 2013-10-17
JP5475737B2 true JP5475737B2 (ja) 2014-04-16

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JP2011219888A Expired - Fee Related JP5475737B2 (ja) 2011-10-04 2011-10-04 放射線撮影装置及び画像処理方法

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US (1) US9025726B2 (enExample)
EP (1) EP2578156B1 (enExample)
JP (1) JP5475737B2 (enExample)
CN (1) CN103027701A (enExample)

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* Cited by examiner, † Cited by third party
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JP5378335B2 (ja) * 2010-03-26 2013-12-25 富士フイルム株式会社 放射線撮影システム
JP6228457B2 (ja) * 2010-10-19 2017-11-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 微分位相コントラスト画像形成
EP2633814A4 (en) * 2010-10-27 2014-03-19 Fujifilm Corp RADIOGRAPHIC SYSTEM METHOD FOR GENERATING RADIOGRAMS
US9826949B2 (en) * 2012-03-05 2017-11-28 University Of Rochester Methods and apparatus for differential phase-contrast cone-beam CT and hybrid cone-beam CT
AU2012268876A1 (en) * 2012-12-24 2014-07-10 Canon Kabushiki Kaisha Non-linear solution for 2D phase shifting
JPWO2015015851A1 (ja) * 2013-07-30 2017-03-02 コニカミノルタ株式会社 医用画像システム及び関節軟骨状態のスコア判定方法
DE102013221818A1 (de) * 2013-10-28 2015-04-30 Siemens Aktiengesellschaft Bildgebendes System und Verfahren zur Bildgebung
JP6242185B2 (ja) * 2013-11-22 2017-12-06 株式会社リガク 補正情報生成方法および補正情報生成装置
JP6369206B2 (ja) * 2014-08-06 2018-08-08 コニカミノルタ株式会社 Ｘ線撮影システム及び画像処理装置
JP6451400B2 (ja) * 2015-02-26 2019-01-16 コニカミノルタ株式会社 画像処理システム及び画像処理装置
JP6422123B2 (ja) * 2015-08-27 2018-11-14 国立大学法人東北大学 放射線画像生成装置
JP6613988B2 (ja) * 2016-03-30 2019-12-04 コニカミノルタ株式会社 放射線撮影システム
EP3405112B1 (en) * 2016-06-16 2019-06-12 Koninklijke Philips N.V. Apparatus for x-ray imaging an object
JP6626578B2 (ja) * 2016-07-28 2019-12-25 株式会社島津製作所 Ｘ線位相差撮像装置
WO2018087195A1 (en) * 2016-11-10 2018-05-17 Koninklijke Philips N.V. Grating-based phase contrast imaging
CN106706638B (zh) * 2016-12-14 2023-06-09 北京理工大学 基于暗条纹逻辑判断的相位成像设备及方法
JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
EP3459461A1 (en) * 2017-09-25 2019-03-27 Koninklijke Philips N.V. X-ray imaging reference scan
CA3100495A1 (en) 2018-05-16 2019-11-21 Benevis Informatics, Llc Systems and methods for review of computer-aided detection of pathology in images
CN111246137B (zh) * 2020-03-19 2022-06-28 上海集成电路研发中心有限公司 一种用于探测非可见光的图像传感器及成像装置
KR102730646B1 (ko) * 2021-01-19 2024-11-15 한국전자통신연구원 위상 정보 처리 방법 및 장치
KR20230010289A (ko) * 2021-07-12 2023-01-19 에스케이하이닉스 주식회사 티오에프 카메라의 영상 획득 방법

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JP2000300536A (ja) * 1999-04-22 2000-10-31 Hitachi Medical Corp Ｍｒｉ装置を用いた３次元温度計測方法
JP3589954B2 (ja) 2000-07-04 2004-11-17 シャープ株式会社 電磁波検出器、画像検出器、および電磁波検出器の製造方法
JP2002131027A (ja) * 2000-10-23 2002-05-09 Mitsutoyo Corp 位相シフト干渉測定装置及び方法、並びに記憶媒体
US6777800B2 (en) 2002-09-30 2004-08-17 Fairchild Semiconductor Corporation Semiconductor die package including drain clip
JP4445397B2 (ja) 2002-12-26 2010-04-07 敦 百生 Ｘ線撮像装置および撮像方法
EP1731099A1 (en) 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
JP4995193B2 (ja) * 2006-04-28 2012-08-08 株式会社日立メディコ Ｘ線画像診断装置
JP2009133823A (ja) 2007-10-31 2009-06-18 Fujifilm Corp 放射線画像検出器および放射線位相画像撮影装置
CN102197303A (zh) * 2008-10-29 2011-09-21 佳能株式会社 X射线成像装置和x射线成像方法
JP5277986B2 (ja) * 2009-01-23 2013-08-28 株式会社ニコン 演算装置、演算プログラム、面形状測定装置、及び面形状測定方法
JP5047218B2 (ja) 2009-04-27 2012-10-10 日本特殊陶業株式会社 センサ
JP2011045655A (ja) 2009-08-28 2011-03-10 Konica Minolta Medical & Graphic Inc Ｘ線撮影装置
JP5459659B2 (ja) * 2009-10-09 2014-04-02 キヤノン株式会社 Ｘ線位相コントラスト像の撮像に用いられる位相格子、該位相格子を用いた撮像装置、ｘ線コンピューター断層撮影システム
JP5796976B2 (ja) * 2010-05-27 2015-10-21 キヤノン株式会社 Ｘ線撮像装置

Also Published As

Publication number Publication date
CN103027701A (zh) 2013-04-10
JP2013078464A (ja) 2013-05-02
EP2578156B1 (en) 2014-11-05
EP2578156A1 (en) 2013-04-10
US9025726B2 (en) 2015-05-05
US20130083893A1 (en) 2013-04-04

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