JP5473350B2 - 照明光学系、露光装置及びデバイスの製造方法 - Google Patents
照明光学系、露光装置及びデバイスの製造方法 Download PDFInfo
- Publication number
- JP5473350B2 JP5473350B2 JP2009031964A JP2009031964A JP5473350B2 JP 5473350 B2 JP5473350 B2 JP 5473350B2 JP 2009031964 A JP2009031964 A JP 2009031964A JP 2009031964 A JP2009031964 A JP 2009031964A JP 5473350 B2 JP5473350 B2 JP 5473350B2
- Authority
- JP
- Japan
- Prior art keywords
- adjustment unit
- adjustment
- distribution
- light
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/52—Details
- G03B27/54—Lamp housings; Illuminating means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Optical Elements Other Than Lenses (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009031964A JP5473350B2 (ja) | 2009-02-13 | 2009-02-13 | 照明光学系、露光装置及びデバイスの製造方法 |
| US12/685,309 US8854605B2 (en) | 2009-02-13 | 2010-01-11 | Illumination optical system, exposure apparatus, and device fabrication method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009031964A JP5473350B2 (ja) | 2009-02-13 | 2009-02-13 | 照明光学系、露光装置及びデバイスの製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010192471A JP2010192471A (ja) | 2010-09-02 |
| JP2010192471A5 JP2010192471A5 (enExample) | 2012-03-22 |
| JP5473350B2 true JP5473350B2 (ja) | 2014-04-16 |
Family
ID=42559627
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009031964A Expired - Fee Related JP5473350B2 (ja) | 2009-02-13 | 2009-02-13 | 照明光学系、露光装置及びデバイスの製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8854605B2 (enExample) |
| JP (1) | JP5473350B2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5554753B2 (ja) * | 2011-06-29 | 2014-07-23 | 株式会社日立ハイテクノロジーズ | 露光方法及びその装置 |
| JP2014165460A (ja) * | 2013-02-27 | 2014-09-08 | Toshiba Corp | 半導体製造装置および半導体装置の製造方法 |
| DE102013204466A1 (de) * | 2013-03-14 | 2014-09-18 | Carl Zeiss Smt Gmbh | Messung einer optischen Symmetrieeigenschaft an einer Projektionsbelichtungsanlage |
| US9575412B2 (en) * | 2014-03-31 | 2017-02-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and system for reducing pole imbalance by adjusting exposure intensity |
| US10274979B1 (en) * | 2018-05-22 | 2019-04-30 | Capital One Services, Llc | Preventing image or video capture of input data provided to a transaction device |
| US10438010B1 (en) | 2018-12-19 | 2019-10-08 | Capital One Services, Llc | Obfuscation of input data provided to a transaction device |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0624180B2 (ja) * | 1986-04-02 | 1994-03-30 | 株式会社日立製作所 | 投影露光方法及びその装置 |
| JPH0922869A (ja) * | 1995-07-07 | 1997-01-21 | Nikon Corp | 露光装置 |
| JP3101613B2 (ja) * | 1998-01-30 | 2000-10-23 | キヤノン株式会社 | 照明光学装置及び投影露光装置 |
| JP2000082655A (ja) | 1998-09-04 | 2000-03-21 | Canon Inc | スリット機構、露光装置およびデバイス製造方法 |
| TW546699B (en) * | 2000-02-25 | 2003-08-11 | Nikon Corp | Exposure apparatus and exposure method capable of controlling illumination distribution |
| TW498408B (en) * | 2000-07-05 | 2002-08-11 | Asm Lithography Bv | Lithographic apparatus, device manufacturing method, and device manufactured thereby |
| JP4923370B2 (ja) * | 2001-09-18 | 2012-04-25 | 株式会社ニコン | 照明光学系、露光装置、及びマイクロデバイスの製造方法 |
| JP4366948B2 (ja) * | 2003-02-14 | 2009-11-18 | 株式会社ニコン | 照明光学装置、露光装置および露光方法 |
| JP5159027B2 (ja) | 2004-06-04 | 2013-03-06 | キヤノン株式会社 | 照明光学系及び露光装置 |
| US8605257B2 (en) * | 2004-06-04 | 2013-12-10 | Carl Zeiss Smt Gmbh | Projection system with compensation of intensity variations and compensation element therefor |
| JP2006054328A (ja) * | 2004-08-12 | 2006-02-23 | Nikon Corp | 照明光学装置、露光装置及びマイクロデバイスの製造方法 |
| JP4599936B2 (ja) * | 2004-08-17 | 2010-12-15 | 株式会社ニコン | 照明光学装置、照明光学装置の調整方法、露光装置、および露光方法 |
| EP2126636B1 (en) * | 2007-01-30 | 2012-06-13 | Carl Zeiss SMT GmbH | Illumination system of a microlithographic projection exposure apparatus |
| JP4310349B2 (ja) * | 2007-04-20 | 2009-08-05 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
| JP2008270564A (ja) * | 2007-04-20 | 2008-11-06 | Canon Inc | 露光装置及びデバイス製造方法 |
| KR101960153B1 (ko) * | 2008-12-24 | 2019-03-19 | 가부시키가이샤 니콘 | 조명 광학계, 노광 장치 및 디바이스의 제조 방법 |
-
2009
- 2009-02-13 JP JP2009031964A patent/JP5473350B2/ja not_active Expired - Fee Related
-
2010
- 2010-01-11 US US12/685,309 patent/US8854605B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20100208223A1 (en) | 2010-08-19 |
| JP2010192471A (ja) | 2010-09-02 |
| US8854605B2 (en) | 2014-10-07 |
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