JP5445219B2 - 飛行時間型質量分析装置 - Google Patents

飛行時間型質量分析装置 Download PDF

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JP5445219B2
JP5445219B2 JP2010039883A JP2010039883A JP5445219B2 JP 5445219 B2 JP5445219 B2 JP 5445219B2 JP 2010039883 A JP2010039883 A JP 2010039883A JP 2010039883 A JP2010039883 A JP 2010039883A JP 5445219 B2 JP5445219 B2 JP 5445219B2
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sample
extraction electrode
potential
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JP2011175898A5 (enrdf_load_stackoverflow
JP2011175898A (ja
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慶 小寺
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Shimadzu Corp
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Shimadzu Corp
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JP2010039883A 2010-02-25 2010-02-25 飛行時間型質量分析装置 Active JP5445219B2 (ja)

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JP2010039883A JP5445219B2 (ja) 2010-02-25 2010-02-25 飛行時間型質量分析装置

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JP2010039883A JP5445219B2 (ja) 2010-02-25 2010-02-25 飛行時間型質量分析装置

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JP2011175898A JP2011175898A (ja) 2011-09-08
JP2011175898A5 JP2011175898A5 (enrdf_load_stackoverflow) 2013-01-17
JP5445219B2 true JP5445219B2 (ja) 2014-03-19

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9529120B2 (en) 2011-08-11 2016-12-27 Canon Kabushiki Kaisha Light-shielding coating, light-shielding film, and optical element
JP5993678B2 (ja) * 2012-09-14 2016-09-14 日本電子株式会社 マスイメージング装置及びマスイメージング装置の制御方法
JP5979075B2 (ja) * 2013-05-15 2016-08-24 株式会社島津製作所 飛行時間型質量分析装置
JP6287410B2 (ja) * 2014-03-19 2018-03-07 株式会社島津製作所 飛行時間型質量分析装置
JP2022127858A (ja) * 2021-02-22 2022-09-01 浜松ホトニクス株式会社 質量分析装置及び質量分析方法
CN116660358B (zh) * 2023-08-01 2023-11-24 浙江迪谱诊断技术有限公司 一种高分辨飞行时间质谱检测方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5403509B2 (ja) * 2009-04-17 2014-01-29 国立大学法人大阪大学 イオン源および質量分析装置

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