JP2011175898A5 - - Google Patents
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- JP2011175898A5 JP2011175898A5 JP2010039883A JP2010039883A JP2011175898A5 JP 2011175898 A5 JP2011175898 A5 JP 2011175898A5 JP 2010039883 A JP2010039883 A JP 2010039883A JP 2010039883 A JP2010039883 A JP 2010039883A JP 2011175898 A5 JP2011175898 A5 JP 2011175898A5
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- JP
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- Prior art keywords
- ions
- initial
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- extraction
- mass
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- 238000000605 extraction Methods 0.000 description 9
- 150000002500 ions Chemical class 0.000 description 9
- 230000001133 acceleration Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010039883A JP5445219B2 (ja) | 2010-02-25 | 2010-02-25 | 飛行時間型質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010039883A JP5445219B2 (ja) | 2010-02-25 | 2010-02-25 | 飛行時間型質量分析装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2011175898A JP2011175898A (ja) | 2011-09-08 |
JP2011175898A5 true JP2011175898A5 (enrdf_load_stackoverflow) | 2013-01-17 |
JP5445219B2 JP5445219B2 (ja) | 2014-03-19 |
Family
ID=44688574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010039883A Active JP5445219B2 (ja) | 2010-02-25 | 2010-02-25 | 飛行時間型質量分析装置 |
Country Status (1)
Country | Link |
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JP (1) | JP5445219B2 (enrdf_load_stackoverflow) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013021575A2 (en) | 2011-08-11 | 2013-02-14 | Canon Kabushiki Kaisha | Light-shielding coating, light-shielding film, and optical element |
JP5993678B2 (ja) * | 2012-09-14 | 2016-09-14 | 日本電子株式会社 | マスイメージング装置及びマスイメージング装置の制御方法 |
JP5979075B2 (ja) * | 2013-05-15 | 2016-08-24 | 株式会社島津製作所 | 飛行時間型質量分析装置 |
JP6287410B2 (ja) * | 2014-03-19 | 2018-03-07 | 株式会社島津製作所 | 飛行時間型質量分析装置 |
JP2022127858A (ja) * | 2021-02-22 | 2022-09-01 | 浜松ホトニクス株式会社 | 質量分析装置及び質量分析方法 |
CN116660358B (zh) * | 2023-08-01 | 2023-11-24 | 浙江迪谱诊断技术有限公司 | 一种高分辨飞行时间质谱检测方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5403509B2 (ja) * | 2009-04-17 | 2014-01-29 | 国立大学法人大阪大学 | イオン源および質量分析装置 |
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2010
- 2010-02-25 JP JP2010039883A patent/JP5445219B2/ja active Active
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