JP5429788B2 - 非破壊検査方法及びその装置 - Google Patents

非破壊検査方法及びその装置 Download PDF

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Publication number
JP5429788B2
JP5429788B2 JP2009102422A JP2009102422A JP5429788B2 JP 5429788 B2 JP5429788 B2 JP 5429788B2 JP 2009102422 A JP2009102422 A JP 2009102422A JP 2009102422 A JP2009102422 A JP 2009102422A JP 5429788 B2 JP5429788 B2 JP 5429788B2
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scattered
inspection object
inspection
rays
data
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JP2010249785A5 (enExample
JP2010249785A (ja
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祐嗣 大石
隆 藤井
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Central Research Institute of Electric Power Industry
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Central Research Institute of Electric Power Industry
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  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2009102422A 2009-04-20 2009-04-20 非破壊検査方法及びその装置 Expired - Fee Related JP5429788B2 (ja)

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JP2009102422A JP5429788B2 (ja) 2009-04-20 2009-04-20 非破壊検査方法及びその装置

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JP2010249785A5 JP2010249785A5 (enExample) 2012-05-31
JP5429788B2 true JP5429788B2 (ja) 2014-02-26

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Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5481699B1 (ja) * 2013-04-04 2014-04-23 札幌施設管理株式会社 配管評価方法
JP5640286B2 (ja) * 2013-12-26 2014-12-17 札幌施設管理株式会社 配管評価方法
JP6277520B2 (ja) * 2014-05-12 2018-02-14 一般財団法人電力中央研究所 非破壊検査方法およびその装置
JP6497701B2 (ja) * 2014-05-12 2019-04-10 一般財団法人電力中央研究所 非破壊検査方法およびその装置
JP6278457B2 (ja) * 2014-05-12 2018-02-14 一般財団法人電力中央研究所 非破壊検査方法およびその装置
JP7449821B2 (ja) * 2020-08-26 2024-03-14 株式会社日立製作所 内部状態検査システム及び内部状態検査方法
JP7437337B2 (ja) * 2021-03-02 2024-02-22 株式会社日立製作所 内部状態画像化装置および内部状態画像化方法
KR102368868B1 (ko) * 2021-07-26 2022-03-04 한전케이피에스 주식회사 컴프턴 산란을 이용하는 파이프용 검사 장치

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0619268B2 (ja) * 1987-08-07 1994-03-16 日本鋼管株式会社 金属上塗膜の厚さ測定方法
JP2004245729A (ja) * 2003-02-14 2004-09-02 Non-Destructive Inspection Co Ltd 放射線検査装置及び放射線検査方法

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