JP5331395B2 - 光断層像撮影装置 - Google Patents
光断層像撮影装置 Download PDFInfo
- Publication number
- JP5331395B2 JP5331395B2 JP2008176258A JP2008176258A JP5331395B2 JP 5331395 B2 JP5331395 B2 JP 5331395B2 JP 2008176258 A JP2008176258 A JP 2008176258A JP 2008176258 A JP2008176258 A JP 2008176258A JP 5331395 B2 JP5331395 B2 JP 5331395B2
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- Prior art keywords
- image
- light
- tomographic image
- optical
- fundus
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
- G01B9/0203—With imaging systems
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
- G01B9/02089—Displaying the signal, e.g. for user interaction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Signal Processing (AREA)
- Animal Behavior & Ethology (AREA)
- Optics & Photonics (AREA)
- Medical Informatics (AREA)
- Molecular Biology (AREA)
- Surgery (AREA)
- Biomedical Technology (AREA)
- Ophthalmology & Optometry (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Heart & Thoracic Surgery (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biophysics (AREA)
- Human Computer Interaction (AREA)
- Eye Examination Apparatus (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008176258A JP5331395B2 (ja) | 2008-07-04 | 2008-07-04 | 光断層像撮影装置 |
| EP09164546.5A EP2141446B1 (en) | 2008-07-04 | 2009-07-03 | Optical tomographic image photographing apparatus |
| US12/458,238 US7880895B2 (en) | 2008-07-04 | 2009-07-06 | Optical tomographic image photographing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008176258A JP5331395B2 (ja) | 2008-07-04 | 2008-07-04 | 光断層像撮影装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010012111A JP2010012111A (ja) | 2010-01-21 |
| JP2010012111A5 JP2010012111A5 (enExample) | 2011-08-18 |
| JP5331395B2 true JP5331395B2 (ja) | 2013-10-30 |
Family
ID=41134533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008176258A Active JP5331395B2 (ja) | 2008-07-04 | 2008-07-04 | 光断層像撮影装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7880895B2 (enExample) |
| EP (1) | EP2141446B1 (enExample) |
| JP (1) | JP5331395B2 (enExample) |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5331395B2 (ja) * | 2008-07-04 | 2013-10-30 | 株式会社ニデック | 光断層像撮影装置 |
| JP5355994B2 (ja) * | 2008-11-05 | 2013-11-27 | 株式会社ニデック | 眼科撮影装置 |
| US7980696B1 (en) | 2010-01-21 | 2011-07-19 | Nidek Co., Ltd. | Ophthalmic photographing apparatus |
| JP4916573B2 (ja) * | 2010-01-28 | 2012-04-11 | パナソニック株式会社 | 光干渉計測方法および光干渉計測装置 |
| JP5511437B2 (ja) | 2010-02-25 | 2014-06-04 | 株式会社ニデック | 光断層像撮影装置 |
| JP2011214969A (ja) * | 2010-03-31 | 2011-10-27 | Canon Inc | 撮像装置及び撮像方法 |
| JP5610884B2 (ja) | 2010-07-09 | 2014-10-22 | キヤノン株式会社 | 光断層撮像装置及び光断層撮像方法 |
| JP5762712B2 (ja) | 2010-09-30 | 2015-08-12 | 株式会社ニデック | 眼科観察システム |
| JP5794664B2 (ja) * | 2011-01-20 | 2015-10-14 | キヤノン株式会社 | 断層画像生成装置及び断層画像生成方法 |
| JP5220208B2 (ja) * | 2011-03-31 | 2013-06-26 | キヤノン株式会社 | 制御装置、撮像制御方法、およびプログラム |
| JP5690193B2 (ja) | 2011-04-18 | 2015-03-25 | 株式会社ニデック | 光断層像撮影装置 |
| JP6166509B2 (ja) * | 2012-01-16 | 2017-07-19 | キヤノン株式会社 | 撮像装置及び撮像方法 |
| JP5936368B2 (ja) | 2012-01-20 | 2016-06-22 | キヤノン株式会社 | 光干渉断層撮影装置及びその作動方法 |
| JP2013148509A (ja) | 2012-01-20 | 2013-08-01 | Canon Inc | 画像処理装置及び画像処理方法 |
| JP6146951B2 (ja) | 2012-01-20 | 2017-06-14 | キヤノン株式会社 | 画像処理装置、画像処理方法、撮影装置及び撮影方法 |
| JP5988772B2 (ja) | 2012-01-20 | 2016-09-07 | キヤノン株式会社 | 画像処理装置及び画像処理方法 |
| JP6061554B2 (ja) | 2012-01-20 | 2017-01-18 | キヤノン株式会社 | 画像処理装置及び画像処理方法 |
| JP6039185B2 (ja) | 2012-01-20 | 2016-12-07 | キヤノン株式会社 | 撮影装置 |
| JP6007527B2 (ja) | 2012-03-13 | 2016-10-12 | 株式会社ニデック | 眼底撮影装置 |
| JP6195334B2 (ja) | 2012-08-30 | 2017-09-13 | キヤノン株式会社 | 撮像装置、撮像方法およびプログラム |
| JP6108890B2 (ja) * | 2013-03-15 | 2017-04-05 | キヤノン株式会社 | 画像処理システム、画像処理方法及びプログラム。 |
| JP6322042B2 (ja) * | 2014-04-28 | 2018-05-09 | キヤノン株式会社 | 眼科撮影装置、その制御方法、およびプログラム |
| CA2945862C (en) * | 2014-06-17 | 2018-05-01 | Wavelight Gmbh | Dispersion encoded full range optical coherence tomograph |
| JP6503665B2 (ja) * | 2014-09-12 | 2019-04-24 | 株式会社ニデック | 光コヒーレンストモグラフィー装置及びプログラム |
| EP3127472B1 (en) | 2015-08-07 | 2019-10-09 | Canon Kabushiki Kaisha | Method and program for positioning an mage of an object on a tomogram and an optical coherence tomography apparatus therefor |
| JP6593593B2 (ja) * | 2015-10-16 | 2019-10-23 | 国立大学法人 鹿児島大学 | 画像処理装置、画像処理方法、診断システム及びプログラム |
| JP6562857B2 (ja) * | 2016-03-18 | 2019-08-21 | 株式会社吉田製作所 | 光干渉断層画像生成装置及びその使用方法 |
| JP6934747B2 (ja) * | 2017-05-19 | 2021-09-15 | 株式会社トプコン | 眼科装置、及びその制御方法 |
| JP2019037650A (ja) * | 2017-08-28 | 2019-03-14 | キヤノン株式会社 | 画像取得装置およびその制御方法 |
| JP7447902B2 (ja) | 2019-07-16 | 2024-03-12 | 株式会社ニデック | 眼科撮影装置 |
| JP7659967B2 (ja) * | 2020-01-08 | 2025-04-10 | 株式会社ニデック | Oct装置 |
| US11883100B2 (en) | 2019-09-30 | 2024-01-30 | Nidek Co., Ltd. | Ophthalmologic image processing method and OCT apparatus |
| JP7411913B2 (ja) * | 2020-06-03 | 2024-01-12 | パナソニックIpマネジメント株式会社 | Oct計測装置及びoct計測方法 |
| US11974806B2 (en) * | 2021-02-19 | 2024-05-07 | Topcon Corporation | Ophthalmologic information processing apparatus, ophthalmologic apparatus, ophthalmologic information processing method, and recording medium |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7383076B2 (en) * | 2000-11-27 | 2008-06-03 | The General Hospital Corporation | Fluorescence-mediated molecular tomography |
| US6980299B1 (en) | 2001-10-16 | 2005-12-27 | General Hospital Corporation | Systems and methods for imaging a sample |
| US8018598B2 (en) | 2004-05-29 | 2011-09-13 | The General Hospital Corporation | Process, system and software arrangement for a chromatic dispersion compensation using reflective layers in optical coherence tomography (OCT) imaging |
| JP4578994B2 (ja) | 2005-02-02 | 2010-11-10 | 株式会社ニデック | 眼科撮影装置 |
| GB2429522A (en) * | 2005-08-26 | 2007-02-28 | Univ Kent Canterbury | Optical mapping apparatus |
| JP4837982B2 (ja) | 2005-11-30 | 2011-12-14 | 株式会社ニデック | 眼科装置 |
| WO2007082228A1 (en) * | 2006-01-10 | 2007-07-19 | The General Hospital Corporation | Systems and methods for generating data based on one or more spectrally-encoded endoscopy techniques |
| JP4890878B2 (ja) * | 2006-02-16 | 2012-03-07 | 株式会社トプコン | 眼底観察装置 |
| JP4822969B2 (ja) | 2006-07-27 | 2011-11-24 | 株式会社ニデック | 眼科撮影装置 |
| CA2664210A1 (en) * | 2006-09-26 | 2008-04-03 | Oregon Health And Science University | In vivo structural and flow imaging |
| JP4996917B2 (ja) * | 2006-12-26 | 2012-08-08 | 株式会社トプコン | 光画像計測装置及び光画像計測装置を制御するプログラム |
| US20090237656A1 (en) * | 2008-03-05 | 2009-09-24 | Lin Ma | Tomographic Imaging Using Hyperspectral Absorption Spectroscopy |
| JP5255524B2 (ja) * | 2008-07-04 | 2013-08-07 | 株式会社ニデック | 光断層像撮影装置、光断層像処理装置。 |
| JP5331395B2 (ja) * | 2008-07-04 | 2013-10-30 | 株式会社ニデック | 光断層像撮影装置 |
-
2008
- 2008-07-04 JP JP2008176258A patent/JP5331395B2/ja active Active
-
2009
- 2009-07-03 EP EP09164546.5A patent/EP2141446B1/en active Active
- 2009-07-06 US US12/458,238 patent/US7880895B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010012111A (ja) | 2010-01-21 |
| US7880895B2 (en) | 2011-02-01 |
| US20100014089A1 (en) | 2010-01-21 |
| EP2141446B1 (en) | 2015-09-09 |
| EP2141446A1 (en) | 2010-01-06 |
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