JP5284079B2 - 冷陰極圧力センサ - Google Patents
冷陰極圧力センサ Download PDFInfo
- Publication number
- JP5284079B2 JP5284079B2 JP2008500171A JP2008500171A JP5284079B2 JP 5284079 B2 JP5284079 B2 JP 5284079B2 JP 2008500171 A JP2008500171 A JP 2008500171A JP 2008500171 A JP2008500171 A JP 2008500171A JP 5284079 B2 JP5284079 B2 JP 5284079B2
- Authority
- JP
- Japan
- Prior art keywords
- pressure sensor
- casing
- cold cathode
- cathode
- anode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/34—Vacuum gauges by making use of ionisation effects using electric discharge tubes with cold cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J41/00—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
- H01J41/02—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
- H01J41/06—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas with ionisation by means of cold cathodes
Description
U:金属中の電子の放出仕事、
E:金属の前で作用する電界強度、
W:金属表面に衝突する光子のエネルギー、
me:電子の質量、
hバー:プランクの作用量子。
Claims (8)
- テストガス入口(18)を備えている気密のケーシング(12)を備え、
該ケーシング(12)に、陽極(14)および陰極(16,17)を備え、かつ
冷陰極放電の点弧のための、前記陰極に配向されている放射源としての発光ダイオード(20)を備えている
冷陰極圧力センサ(10)において、
前記ケーシング(12)は少なくとも部分的にガラスから形成されており、
前記発光ダイオード(20)は前記ケーシング(12)の外部に配置されておりかつケーシングガラスを通って前記陰極(16,17)を放射し、かつ
前記発光ダイオード(20)は、500nmより長いが1400nmより短い波長λの放射を放射する
ことを特徴とする冷陰極圧力センサ。 - 前記陰極のうち前記陽極に最も近いエッジ(28)の曲率半径r0および前記陽極(14)と前記陰極(16,17)との間の電圧UAKは、電界強度(E)が前記陰極(16,17)のエッジ(28)の領域において10kV/cmより大きくかつ1GV/cmより小さくなるように選択されている
請求項1記載の冷陰極圧力センサ。 - 前記陰極(16,17)のうち前記陽極に最も近いエッジ(28)の前記曲率半径r0は0.1mmより小さい
請求項2記載の冷陰極圧力センサ。 - 前記陰極(16,17)のうち前記陽極に最も近いエッジ(28)の前記曲率半径r0は0.05mmより小さい
請求項2記載の冷陰極圧力センサ。 - 前記発光ダイオード(20)は600nmより長い波長の放射を放射する
請求項1から4までのいずれか1項記載の冷陰極圧力センサ。 - 前記発光ダイオード(20)の放射電力は1mWより大きい
請求項1から5までのいずれか1項記載の冷陰極圧力センサ。 - 前記陽極(14)はリングとして実現されておりかつ前記陰極(16,17)は該リング陽極(14)の軸方向の2つのプレートとして実現されている
請求項1から6までのいずれか1項記載の冷陰極圧力センサ。 - 前記ケーシングガラスはクオーツガラスである
請求項1から7までのいずれか1項記載の冷陰極圧力センサ(10)。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102005010716.8 | 2005-03-09 | ||
DE102005010716A DE102005010716A1 (de) | 2005-03-09 | 2005-03-09 | Kaltkathoden-Drucksensor |
PCT/EP2006/060397 WO2006094927A2 (de) | 2005-03-09 | 2006-03-02 | Kaltkathoden-drucksensor |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008533657A JP2008533657A (ja) | 2008-08-21 |
JP5284079B2 true JP5284079B2 (ja) | 2013-09-11 |
Family
ID=36741803
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008500171A Active JP5284079B2 (ja) | 2005-03-09 | 2006-03-02 | 冷陰極圧力センサ |
Country Status (6)
Country | Link |
---|---|
US (1) | US7795876B2 (ja) |
EP (1) | EP1856713B1 (ja) |
JP (1) | JP5284079B2 (ja) |
CN (1) | CN101138066B (ja) |
DE (1) | DE102005010716A1 (ja) |
WO (1) | WO2006094927A2 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4568321B2 (ja) * | 2007-11-27 | 2010-10-27 | 有限会社真空実験室 | 冷陰極電離真空計 |
CN102494837B (zh) * | 2011-12-01 | 2013-10-16 | 上海交通大学 | 真空传感器 |
JP2016033509A (ja) * | 2014-07-30 | 2016-03-10 | 国立研究開発法人産業技術総合研究所 | 真空計と汚染診断方法 |
EP3578943B1 (en) * | 2017-03-13 | 2023-09-06 | Canon Anelva Corporation | Cold cathode ionization gauge and cartridge for cold cathode ionization gauge |
CN114424039A (zh) * | 2019-09-20 | 2022-04-29 | 英福康有限公司 | 确定压力的方法和压力传感器 |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1596758A (en) * | 1920-05-12 | 1926-08-17 | Mutscheller Arthur | Method and apparatus for controlling electrical discharges by means of ultra-violet light |
DE845420C (de) * | 1948-09-27 | 1952-07-31 | Talert Talalmanyokat Ertekesit | Einrichtung zum Messen von physikalischen Eigenschaften, die mit dem Ionisationskoeffizienten in Zusammenhang stehen |
GB1204325A (en) | 1966-12-12 | 1970-09-03 | Philips Nv | Improvements in or relating to ionisation apparatus |
US3839655A (en) * | 1973-08-24 | 1974-10-01 | Varian Associates | Bayard-alpert vacuum ionization tube |
US4270091A (en) * | 1978-01-25 | 1981-05-26 | Varian Associates, Inc. | Apparatus and method for measuring pressures and indicating leaks with optical analysis |
US4398152A (en) * | 1980-08-12 | 1983-08-09 | Leveson Richard C | Photoionization detector |
DE3642670A1 (de) * | 1986-12-13 | 1988-06-23 | Leybold Ag | Penning-ionisationsvakuummeter |
US5473162A (en) * | 1987-10-26 | 1995-12-05 | Baylor University | Infrared emission detection of a gas |
US4931688A (en) * | 1988-01-19 | 1990-06-05 | Galileo Electro-Optics Corp. | Multifunction gas triode |
US4967157A (en) * | 1988-08-29 | 1990-10-30 | Mks Instruments, Inc. | Method and circuit for extending the range of a cold cathode discharge vacuum gauge |
US5126676A (en) * | 1989-11-27 | 1992-06-30 | The United States Of America As Represented By The United States Department Of Energy | Gas amplified ionization detector for gas chromatography |
US5422573A (en) * | 1990-04-11 | 1995-06-06 | Granville-Phillips Company | Ionization gauge and method of using and calibrating same |
US5198772A (en) * | 1991-03-12 | 1993-03-30 | Mks Instruments, Inc. | Removable discharge initiating means for cold cathode discharge ionization gauge |
US5157333A (en) * | 1991-03-12 | 1992-10-20 | Mks Instruments, Inc. | Discharge initiating means for cold cathode discharge ionization gauge |
JP3125002B2 (ja) * | 1991-07-12 | 2001-01-15 | 学校法人東海大学 | 電界放射型真空計 |
US5382793A (en) * | 1992-03-06 | 1995-01-17 | Hewlett-Packard Company | Laser desorption ionization mass monitor (LDIM) |
JP3300775B2 (ja) * | 1993-07-30 | 2002-07-08 | 学校法人東海大学 | 定電流動作電界放射型真空計 |
JPH0772031A (ja) * | 1993-09-02 | 1995-03-17 | Ebara Corp | 真空度測定方法及び電離真空計 |
JPH0829283A (ja) * | 1994-07-15 | 1996-02-02 | Canon Inc | 電離真空計 |
JP3323004B2 (ja) * | 1994-09-16 | 2002-09-09 | 株式会社東芝 | 圧力センサ |
FR2736465B1 (fr) * | 1995-07-03 | 1997-08-08 | Commissariat Energie Atomique | Dispositif d'amorcage et/ou de maintien d'une decharge et jauge a vide a cathode froide comportant un tel dispositif |
DE19627620C1 (de) * | 1996-07-09 | 1997-11-13 | Bruker Saxonia Analytik Gmbh | Elektroneneinfangdetektor |
DE19717263A1 (de) * | 1997-04-24 | 1998-10-29 | Leybold Vakuum Gmbh | Penning-Vakuummeter |
DE10031882A1 (de) * | 2000-06-30 | 2002-01-10 | Leybold Vakuum Gmbh | Sensor für Helium oder Wasserstoff |
RU2217739C1 (ru) * | 2002-10-18 | 2003-11-27 | Кудрявцев Анатолий Анатольевич | Способ анализа газов и ионизационный детектор для его осуществления |
JP2005019414A (ja) * | 2004-07-23 | 2005-01-20 | Ushio Inc | 光線力学治療用放電ランプ |
-
2005
- 2005-03-09 DE DE102005010716A patent/DE102005010716A1/de not_active Withdrawn
-
2006
- 2006-03-02 JP JP2008500171A patent/JP5284079B2/ja active Active
- 2006-03-02 WO PCT/EP2006/060397 patent/WO2006094927A2/de not_active Application Discontinuation
- 2006-03-02 US US11/885,719 patent/US7795876B2/en active Active
- 2006-03-02 EP EP20060708602 patent/EP1856713B1/de active Active
- 2006-03-02 CN CN2006800073720A patent/CN101138066B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
US7795876B2 (en) | 2010-09-14 |
US20080142710A1 (en) | 2008-06-19 |
EP1856713A2 (de) | 2007-11-21 |
EP1856713B1 (de) | 2015-05-06 |
CN101138066B (zh) | 2010-06-02 |
DE102005010716A1 (de) | 2006-09-14 |
CN101138066A (zh) | 2008-03-05 |
WO2006094927A2 (de) | 2006-09-14 |
WO2006094927A3 (de) | 2007-05-03 |
JP2008533657A (ja) | 2008-08-21 |
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