JP5258615B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP5258615B2
JP5258615B2 JP2009038622A JP2009038622A JP5258615B2 JP 5258615 B2 JP5258615 B2 JP 5258615B2 JP 2009038622 A JP2009038622 A JP 2009038622A JP 2009038622 A JP2009038622 A JP 2009038622A JP 5258615 B2 JP5258615 B2 JP 5258615B2
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Japan
Prior art keywords
sample
rack
tray
opening
automatic analyzer
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JP2009038622A
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Japanese (ja)
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JP2010197048A (ja
JP2010197048A5 (OSRAM
Inventor
弘生 篠原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Canon Medical Systems Corp
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Toshiba Corp
Toshiba Medical Systems Corp
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Priority to JP2009038622A priority Critical patent/JP5258615B2/ja
Publication of JP2010197048A publication Critical patent/JP2010197048A/ja
Publication of JP2010197048A5 publication Critical patent/JP2010197048A5/ja
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JP2009038622A 2009-02-20 2009-02-20 自動分析装置 Active JP5258615B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009038622A JP5258615B2 (ja) 2009-02-20 2009-02-20 自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009038622A JP5258615B2 (ja) 2009-02-20 2009-02-20 自動分析装置

Publications (3)

Publication Number Publication Date
JP2010197048A JP2010197048A (ja) 2010-09-09
JP2010197048A5 JP2010197048A5 (OSRAM) 2012-03-29
JP5258615B2 true JP5258615B2 (ja) 2013-08-07

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JP2009038622A Active JP5258615B2 (ja) 2009-02-20 2009-02-20 自動分析装置

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JP (1) JP5258615B2 (OSRAM)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6936929B2 (ja) * 2015-08-06 2021-09-22 エレメンタル・サイエンティフィック・インコーポレイテッドＥｌｅｍｅｎｔａｌ Ｓｃｉｅｎｔｉｆｉｃ， Ｉｎｃ． オートサンプラーのサンプルおよびサンプルラックの識別
EP3594691A4 (en) * 2017-03-07 2020-12-30 Hitachi High-Tech Corporation AUTOMATIC ANALYZER
CN108254583A (zh) * 2018-02-01 2018-07-06 中纺协（北京）检验技术服务有限公司 一种纺织品pH值自动测试设备
JP7010768B2 (ja) * 2018-06-06 2022-02-10 株式会社日立ハイテク 自動分析装置および試料の搬送方法
WO2020085271A1 (ja) * 2018-10-23 2020-04-30 積水メディカル株式会社 オートサンプラ、自動分析装置、サンプリング方法、及び、自動検査方法
WO2020085272A1 (ja) * 2018-10-23 2020-04-30 積水メディカル株式会社 オートサンプラ、自動分析装置、サンプリング方法、及び、自動検査方法
JP7485048B2 (ja) * 2020-07-29 2024-05-16 株式会社島津製作所 自動分析装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58102162A (ja) * 1981-12-15 1983-06-17 Olympus Optical Co Ltd 自動分析装置へのラツク供給方法
JPS61287636A (ja) * 1985-06-12 1986-12-18 Canon Inc ウエハ插入・取出装置
JP2819235B2 (ja) * 1994-03-31 1998-10-30 タバイエスペック株式会社 移動式スリット装置
JPH0835970A (ja) * 1994-07-25 1996-02-06 Hitachi Ltd 自動分析装置
JP3625332B2 (ja) * 1996-01-19 2005-03-02 株式会社東芝 自動分析装置
US5833925A (en) * 1996-11-13 1998-11-10 Beckman Instruments, Inc. Automatic chemistry analyzer with improved ion selective electrode assembly
JP3748997B2 (ja) * 1997-09-30 2006-02-22 東芝医用システムエンジニアリング株式会社 自動分析装置
JP2000018832A (ja) * 1998-06-30 2000-01-18 Koyo Thermo System Kk 熱処理装置
US6588625B2 (en) * 2001-04-24 2003-07-08 Abbott Laboratories Sample handling system
US6790413B2 (en) * 2001-05-03 2004-09-14 Beckman Coulter, Inc. Sample presentation unit

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JP2010197048A (ja) 2010-09-09

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