JP5250800B2 - 半導体封止用樹脂組成物およびその製法、ならびにそれを用いた半導体装置 - Google Patents
半導体封止用樹脂組成物およびその製法、ならびにそれを用いた半導体装置 Download PDFInfo
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- JP5250800B2 JP5250800B2 JP2008127437A JP2008127437A JP5250800B2 JP 5250800 B2 JP5250800 B2 JP 5250800B2 JP 2008127437 A JP2008127437 A JP 2008127437A JP 2008127437 A JP2008127437 A JP 2008127437A JP 5250800 B2 JP5250800 B2 JP 5250800B2
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- SBYHFKPVCBCYGV-UHFFFAOYSA-N quinuclidine Chemical compound C1CC2CCN1CC2 SBYHFKPVCBCYGV-UHFFFAOYSA-N 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 150000003384 small molecules Chemical class 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- 231100000701 toxic element Toxicity 0.000 description 1
- 125000005591 trimellitate group Chemical group 0.000 description 1
- VNTPGSZQKARKHG-UHFFFAOYSA-N trimethyl-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound C[Si](C)(C)CCCOCC1CO1 VNTPGSZQKARKHG-UHFFFAOYSA-N 0.000 description 1
- PQDJYEQOELDLCP-UHFFFAOYSA-N trimethylsilane Chemical compound C[SiH](C)C PQDJYEQOELDLCP-UHFFFAOYSA-N 0.000 description 1
- 239000001993 wax Substances 0.000 description 1
Landscapes
- Compositions Of Macromolecular Compounds (AREA)
- Epoxy Resins (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Description
(x)縦2mm×横2mm×高さ1mm。
(A)平均粒子径1〜20μmで、かつ比表面積1〜2m2 /gの水酸化アルミニウム。
(B)上記(A)成分以外の無機質充填剤。
(C)エポキシ樹脂。
(D)フェノールノボラック樹脂と塩基性硬化促進剤とを溶融混合してなる溶融混合物。
(x)縦2mm×横2mm×高さ1mm。
(x)縦2mm×横2mm×高さ1mm。
(x)縦2mm×横2mm×高さ1mm。
すなわち、本発明の半導体封止用樹脂組成物を、上記寸法(x)以下の大きさとなる小型の半導体パッケージの樹脂封止に用いることにより、従来の封止材料を用いてなる小型半導体パッケージでは困難であった、形成されたバリの除去が容易となり、機械強度、成形性、保存安定性および難燃性にも優れた封止樹脂部が形成されることとなる。
o−クレゾールノボラック型エポキシ樹脂(エポキシ当量198、軟化点55℃)
フェノールホルムアルデヒドノボラック樹脂(水酸基当量105、軟化点71℃)
球状溶融シリカ粉末(平均粒子径14μm、最大粒子径64μm)
〔無機質充填剤b〕
破砕溶融シリカ粉末(平均粒子径6μm、最大粒子径32μm)
〔無機質充填剤c〕
球状溶融シリカ粉末(平均粒子径1μm、最大粒子径6μm)
平均粒子径12μm、比表面積1.3m2 /g
〔水酸化アルミニウムb〕
平均粒子径3μm、比表面積1.4m2 /g
〔水酸化アルミニウムc〕
平均粒子径20μm、比表面積0.8m2 /g
〔水酸化マグネシウム〕
平均粒子径1μm、比表面積4.0m2 /g
カーボンブラック(平均粒子径25nm、窒素吸着比表面積120m2 /g、DBP吸着量120cm3 /100g、pH8)
1,8−ジアザビシクロ〔5.4.0〕ウンデセン−7(DBU)(pKa:12.5)
〔硬化促進剤b〕
1,5−ジアザビシクロ〔4.3.0〕ノネン−5(DBN)(pKa:12.7)
〔硬化促進剤c〕
トリフェニルホスフィン(pKa:3)
γ−メルカプトプロピルトリメチルシラン
上記に示した各成分を後記の表1〜表2に示す割合で配合し、80〜120℃に加熱したロール混練機にかけて5分間溶融混練を行なった。つぎに、この溶融物を冷却後、固体状になったものを粉末状に粉砕した。ついで、得られた粉末を円筒状の金型に充填し、円筒の両端から加圧することにより円柱状のタブレット状エポキシ樹脂組成物を作製した。なお、実施例1,4では、予め、フェノール樹脂と硬化促進剤とを同表に示す割合で溶融混合(170℃)し予備混合物を作製し、その後、この予備混合物と他の残りの成分を配合した。また、実施例2,3,5,6,7および比較例1〜2,4〜5では、予め、フェノール樹脂と硬化促進剤とシランカップリング剤とを同表に示す割合で溶融混合(170℃)し予備混合物を作製し、その後、この予備混合物と他の残りの成分を配合した。一方、比較例3は、予め溶融混合を行なわなかった。
2mm×2mm×0.7mmのキャビティーのゲートの対面に、つぎの2mm×2mm×0.7mmのキャビティーに連通する孔(0.15mm高さ)を有する10個連結の列を6つ有する、同時に60個成形可能な金型にて評価を行なった。そして、未充填が、連結したキャビティーの何個目で生起しているか確認し評価した。その結果、5個目まで未充填がないものを○、それ以外を×として表示した。
成形物のバリ部を折って、大きさ2mm×2mm×0.7mmの成形物に割れ,0.1mm以上の凹部が生じていないかを確認し評価した。その結果、割れや凹部がないものを○、それ以外を×として表示した。
室温(25℃)にて10日間保存したタブレット状エポキシ樹脂組成物を用いて、上記条件にて成形物を作製し、成形性を確認し評価した。その結果、連結キャビティーの5個目まで未充填がないものを○、連結キャビティーの4個目まで未充填がないものを△、それ以外を×として表示した。
低圧トランスファー成形機を用いて、成形温度175℃,注入圧力7MPa,硬化時間120秒の条件にて、厚み3.2mmの試験片(大きさ:127mm×12.7mm×3.2mm)を成形した。そして、金型から取り出し、後硬化175℃にて5時間の処理を行なった。これを用いて、UL−94垂直法に準じて燃焼時間の合計と、燃焼時間の最長時間を求め、V−0規格を満足するか否かを評価した。その結果、V−0規格を満足するものを○、満足しないものを×として表示した。
Claims (7)
- 下記の寸法(x)以下の大きさの半導体装置の封止材料として用いられる半導体封止用樹脂組成物であって、下記の(A)〜(D)成分を用いることを特徴とする半導体封止用樹脂組成物。
(x)縦2mm×横2mm×高さ1mm。
(A)平均粒子径1〜20μmで、かつ比表面積1〜2m2 /gの水酸化アルミニウム。
(B)上記(A)成分以外の無機質充填剤。
(C)エポキシ樹脂。
(D)フェノールノボラック樹脂と塩基性硬化促進剤とを溶融混合してなる溶融混合物。 - 上記(D)成分に用いられる塩基性硬化促進剤が、ジアザビシクロアルケン類化合物である請求項1記載の半導体封止用樹脂組成物。
- 上記(A)〜(D)成分に加えて、さらにメルカプト基含有シランカップリング剤を含有する請求項1または2記載の半導体封止用樹脂組成物。
- 上記(D)成分が、フェノールノボラック樹脂および塩基性硬化促進剤とともに、さらに上記メルカプト基含有シランカップリング剤を配合し、これら配合成分を予め溶融混合してなる溶融混合物である請求項3記載の半導体封止用樹脂組成物。
- 下記の寸法(x)以下の大きさの半導体装置の封止材料として用いられる半導体封止用樹脂組成物の製造方法であって、予め、フェノールノボラック樹脂と塩基性硬化促進剤とを溶融混合することにより溶融混合物を作製した後、上記溶融混合物と下記の(A)〜(C)成分を溶融混練することを特徴とする半導体封止用樹脂組成物の製法。
(x)縦2mm×横2mm×高さ1mm。
(A)平均粒子径1〜20μmで、かつ比表面積1〜2m2 /gの水酸化アルミニウム。
(B)上記(A)成分以外の無機質充填剤。
(C)エポキシ樹脂。 - フェノールノボラック樹脂および塩基性硬化促進剤とともに、メルカプト基含有シランカップリング剤を配合して溶融混合することにより溶融混合物を作製する請求項5記載の半導体封止用樹脂組成物の製法。
- 請求項1〜4のいずれか一項に記載の半導体封止用樹脂組成物を用いて、半導体素子を封止してなる、下記の寸法(x)以下の大きさの半導体装置。
(x)縦2mm×横2mm×高さ1mm。
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